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Feature Article NEXAFS microscopy and resonant scattering

Summary: Feature Article
NEXAFS microscopy and resonant scattering:
Composition and orientation probed in real and reciprocal space
Harald Ade a,*, Adam P. Hitchcock b,**
Department of Physics, North Carolina State University, Raleigh, NC 27695, USA
Brockhouse Institute for Materials Research, Department of Chemistry, McMaster University, Hamilton, ON, Canada L8S 4M1
Received 29 June 2007; received in revised form 7 October 2007; accepted 20 October 2007
Available online 24 October 2007
Near Edge X-ray Absorption Fine Structure (NEXAFS) spectromicroscopy, resonant scattering and resonant reflectivity are specialized,
synchrotron radiation based, soft X-ray characterization tools that provide moiety-specific contrast and either real-space imaging at w30 nm
spatial resolution, or scattering signals which can be inverted to provide chemically sensitive information at an even higher spatial resolution
(<5 nm). These X-ray techniques complement other real and reciprocal space characterization tools such as various microscopies and conven-
tional electron, X-ray and neutron scattering. We provide an overview of these synchrotron based tools, describe their present state-of-the-art and
discuss a number of applications to exemplify their unique aspects.
2007 Elsevier Ltd. All rights reserved.
Keywords: X-ray microscopy; NEXAFS; Resonant scattering; Polymers; Chemical mapping
1. Introduction


Source: Ade, Harald W.- Department of Physics, North Carolina State University
Hitchcock, Adam P. - Department of Chemistry, McMaster University


Collections: Chemistry; Physics