Summary: IMTC 2004 - Instrumentation and Measurement
Technology Conference
Como, Italy, 18­20 May 2004
Yield Evaluation Methods of SRAM Arrays: a Comparative Study
M. Ottavi

, L. Schiano
¡
, X. Wang
¡
, Y-B. Kim
¡
, F. J. Meyer
¢
, F. Lombardi
¡

Universit`a di Roma "Tor Vergata",
Rome, ITALY
Email: ottavi@ing.uniroma2.it

Source: Ayers, Joseph - Marine Science Center & Department of Biology, Northeastern University

Collections: Engineering