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Error quantification in calibration of AFM probes due to non-uniform cantilevers
 

Summary: .
Error quantification in calibration of AFM probes due to non-uniform
cantilevers
Hendrik Frentrup1
, Matthew S. Allen2
1
Graduate Student, Universitšt Stuttgart, Germany
Institute of Applied and Experimental Mechanics (IAM), Pfaffenwaldring 9, 70550 Stuttgart
hendrik.frentrup@gmail.com
2
Assistant Professor, University of Wisconsin-Madison
535 ERB, 1500 Engineering Drive, Madison, WI 53706
msallen@engr.wisc.edu
Abstract
For more than two decades, the Atomic Force Microscope (AFM) has provided valuable insights in
nanoscale phenomena, and it is now widely employed by scientists from various disciplines. AFMs use
a cantilever beam with a sharp tip to scan the surface of a sample both to image it and to perform
mechanical testing. The AFM measures the deflection of the probe beam so one must first find the spring
constant of the cantilever in order to estimate the force between the sample and the probe tip. Commonly
applied calibration methods regard the probe as a uniform cantilever, neglecting the tip mass and any non-

  

Source: Allen, Matthew S. - Department of Engineering Physics, University of Wisconsin at Madison

 

Collections: Engineering