Home

About

Advanced Search

Browse by Discipline

Scientific Societies

E-print Alerts

Add E-prints

E-print Network
FAQHELPSITE MAPCONTACT US


  Advanced Search  

 
MEMS-based contact stress field measurements at a rough elastomeric layer: local test of Amontons' friction law in static
 

Summary: MEMS-based contact stress field measurements at a rough
elastomeric layer: local test of Amontons' friction law in static
and steady sliding regimes
J. Scheibert12,a
, E. Katzav13
, M. Adda-Bedia1
, J. Frelat4
, A. Prevost1
, and G. Debr´egeas1
1
Laboratoire de Physique Statistique, CNRS/ENS/University Paris 6/University Paris 7, Paris, France
2
Physics of Geological Processes, University of Oslo, Oslo, Norway
3
Department of Mathematics, King's College, London, United Kingdom
4
IJLRDA, CNRS/Universit´e Paris 6, Paris, France
Abstract. We present the results of recent friction experiments in which a MEMS-based
sensing device is used to measure both the normal and tangential stress fields at the base of
a rough elastomer film in frictional contact with smooth, rigid, glass indentors. We con-

  

Source: Adda-Bedia, Mokhtar - Laboratoire de Physique Statistique, Département de Physique, École Normale Supérieure

 

Collections: Physics