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Journal of Electron Spectroscopy and Related Phenomena 122 (2002) 6578 www.elsevier.com/locate/elspec
 

Summary: Journal of Electron Spectroscopy and Related Phenomena 122 (2002) 6578
www.elsevier.com/locate/elspec
Characterization of the effects of soft X-ray irradiation on polymers
1
*T. Coffey, S.G. Urquhart , H. Ade
Department of Physics, North Carolina State University, Raleigh, NC 27695, USA
Received 4 December 2000; accepted 23 July 2001
Abstract
The physical and chemical effects of the soft X-ray irradiation of polymers have been systematically evaluated for photon
energies just above the C 1s binding energy. This exposure causes radiation damage in the form of the loss of mass and
changes to the chemical structure of the polymers. These effects are evident in the Near Edge X-ray Absorption Fine
Structure (NEXAFS) spectra of the exposed polymers, posing a fundamental limit to the sensitivity of NEXAFS
spectroscopy for chemical microanalysis. Quantitative understanding of the chemistry and kinetics of radiation damage in
polymers is necessary for the successful and validated application of NEXAFS microscopy. This paper outlines a method for
quantifying this radiation damage as a function of X-ray dose, and applies these methods to characterize the loss of mass and
loss of carbonyl group functionality from a diverse series of polymers. A series of simple correlations are proposed to
rationalize the observed radiation damage propensities on the basis of the polymer chemical structure. In addition, NEXAFS
spectra of irradiated and virgin polymers are used to provide a first-order identification of the radiation chemistry. 2002
Elsevier Science B.V. All rights reserved.
Keywords: NEXAFS spectroscopy; Polymers; Damage; Quantitative; Analysis; Radiation chemistry

  

Source: Ade, Harald W.- Department of Physics, North Carolina State University

 

Collections: Physics