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Dissolution dynamics of thin films measured by optical reflectance Christian Punckt and Ilhan A. Aksaya
 

Summary: Dissolution dynamics of thin films measured by optical reflectance
Christian Punckt and Ilhan A. Aksaya
Department of Chemical Engineering, Princeton University, Princeton, New Jersey 08544, USA
Received 27 August 2009; accepted 2 December 2009; published online 29 December 2009
Measuring the dissolution dynamics of thin films in situ both with spatial and temporal resolution
can be a challenging task. Available methods such as scanning electrochemical microscopy rely on
scanning the specimen and are intrinsically slow. We developed a characterization technique
employing only an optical microscope, a digital charge coupled device camera, and a computer for
image processing. It is capable of detecting dissolution rates of the order of nm/min and has a spatial
and temporal resolution which is limited by the imaging and recording setup. We demonstrate the
capabilities of our method by analyzing the electrochemical dissolution of copper thin films on gold
substrates in a mild hydrochloric acid solution. Due to its simplicity, our technique can be
implemented in any laboratory and can be applied to a variety of systems such as thin film sensors
or passive coatings. 2009 American Institute of Physics. doi:10.1063/1.3276631
I. INTRODUCTION
Noninvasive, sensitive, and versatile experimental tech-
niques for the spatiotemporally resolved measurement of
corrosion rates of thin films are in high demand for the quan-
tification of material degradation in microelectromechanical
devices13

  

Source: Aksay, Ilhan A. - Department of Chemical Engineering, Princeton University

 

Collections: Materials Science