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Yield maps for nanoscale metallic multilayers Adrienne V. Lamm *, Peter M. Anderson
 

Summary: Yield maps for nanoscale metallic multilayers
Adrienne V. Lamm *, Peter M. Anderson
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210-1179, USA
Accepted 20 November 2003
Abstract
This manuscript presents maps for the macroscopic, in-plane, bi-axial tension to macroscopically yield a nanoscale multilayered
thin film consisting of alternating phases that can plastically deform. The design parameters are volume fraction, bi-layer thickness,
modulus mismatch, and lattice parameter mismatch.
2003 Published by Elsevier Ltd. on behalf of Acta Materialia Inc.
Keywords: Design maps; Strength; Multilayers; Theory & modeling
1. Introduction
Multilayered thin films are a class of engineered
layered composite materials with individual layer thick-
nesses on the order of one to several hundred nanome-
ters. The driving force to reduce interfacial energy can
cause large internal stress [1], generate deviations from
bulk elastic moduli [2,3], induce phase changes [4],
suppress plasticity [58], generate significant anelasticity
[9,10], and even promote unique rolling textures [11].
Hardness measurements for some A/B metallic systems

  

Source: Anderson, Peter M. - Department of Materials Science and Engineering, Ohio State University

 

Collections: Materials Science