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Allen, Sumali & Penegor, IMAC 2009, 1 / 9 Effect of Tip Mass on Atomic Force Microscope Calibration by Thermal
 

Summary: Allen, Sumali & Penegor, IMAC 2009, 1 / 9
Effect of Tip Mass on Atomic Force Microscope Calibration by Thermal
Method
Matthew S. Allen1
, Hartono Sumali2
& Peter C. Penegor3
1
Assistant Professor, University of Wisconsin-Madison, 535 ERB, 1500 Engineering Drive, Madison, WI 53706,
Corresponding Author: msallen@engr.wisc.edu
2
Principal Member of Technical Staff, Sandia National Laboratories*
, P.O. Box 5800, Albuquerque, NM 87185,
hsumali@sandia.gov
3
Undergraduate Student, University of Wisconsin-Madison
Abstract:
The Atomic Force Microscope (AFM) plays a key role in various disciplines, providing a versatile tool for
nano-scale topography imaging, manipulation and studies of nano-scale material properties. Contrary to what the
name suggests, the Atomic Force Microscope actually measures displacement; calibration is required to
determine the spring constant relating the measured displacement to the force exerted between the sample and

  

Source: Allen, Matthew S. - Department of Engineering Physics, University of Wisconsin at Madison

 

Collections: Engineering