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Summary: Effect of a Transverse Tensile Stress on the Electric-Field-Induced
Domain Reorientation in Soft PZT: In Situ XRD Study
Xiaoping Li,*,
Wan Y. Shih,*,
James S. Vartuli,
David L. Milius,
Ilhan A. Aksay,*,
and Wei-Heng Shih*,
Department of Materials Engineering, Drexel University, Philadelphia, Pennsylvania 19104
Department of Chemical Engineering and Princeton Materials Institute, Princeton University,
Princeton, New Jersey 08544-5263
The effect of a transverse tensile stress on the electric-field-
induced 90°-domain reorientation in tetragonal lead zirconate
titanate (PZT) near the morphotropic phase boundary was
investigated in situ using X-ray diffraction (XRD). The XRD
intensity ratio, I(002)/I(200), which represents the ratio of the
volume of the c-domains to that of the a-domains on the PZT
surface, was examined as a function of the electric field at
various stress levels. It was found that a transverse tensile
stress changes the electric-field dependence of I(002)/I(200),
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