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Summary: On the Modeling and Analysis of Jitter in ATE Using Matlab
Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio Lombardi
Department of Electrical and Computer Engineering
Northeastern University, Boston, MA, USA
E-mail: kkkim@ece.neu.edu, hjing@ece.neu.edu, ybk@ece.neu.edu,
lombardi@ece.neu.edu
Abstract
This paper presents a new jitter component analysis method for mixed mode VLSI chip
testing in Automatic Test Equipment (ATE). The separate components are analyzed
individually and then combined using Matlab. The Matlab simulation shows how jitter
components combine and how the total jitter depends on the jitter injection sequence. The
relationship among jitter components is presented and the superposition of the jitter
components is verified. This new technique gives test engineers an insight into how the jitter
components interact.
1. Introduction
As the data rates of VLSI systems reach several gigabits per second, timing jitter
have become more significant in ATE (Automatic Test Equipment) systems. Therefore,
a correct model and analysis of the timing errors and jitter will provide more accurate
characterizations of high-speed VLSI systems.
Timing Jitter (henceforth referred to as jitter) is defined as the deviation of a signal
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