Summary: Journal of Machine Learning Research ?? (2009) ???­??? Submitted 1/09; Revised 6/09; Published ?/??
Learning Acyclic Probabilistic Circuits Using Test Paths
Dana Angluin dana.angluin@yale.edu
James Aspnes james.aspnes@yale.edu
Department of Computer Science
Yale University
Jiang Chen criver@gmail.com
Yahoo! Inc.
701 First Avenue
Sunnyvale, CA 94086
David Eisenstat eisenstatdavid@gmail.com
Lev Reyzin lev.reyzin@yale.edu
Department of Computer Science
Yale University
Editor: Rocco Servedio
Abstract
We define a model of learning probabilistic acyclic circuits using value injection queries, in
which fixed values are assigned to an arbitrary subset of the wires and the value on the
single output wire is observed. We adapt the approach of using test paths from the Circuit
Builder algorithm (Angluin et al., 2009) to show that there is a polynomial time algorithm

Source: Aspnes, James - Department of Computer Science, Yale University

Collections: Computer Technologies and Information Sciences