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An Analytical Model for the Calculation of the Expected Miss Ratio in Faulty Caches
 

Summary: An Analytical Model for the Calculation of the
Expected Miss Ratio in Faulty Caches
Daniel S´anchez Yiannakis Sazeides Juan L. Arag´on Jos´e M. Garc´ia
Dept. of Computer Engineering Department of Computer Science
University of Murcia
University of Cyprus

{dsanchez,jlaragon,jmgarcia}@ditec.um.es
yanos@cs.ucy.ac.cy.se
Abstract--Technology scaling improvement is affecting the
reliability of ICs due to increases in static and dynamic variations
as well as wear-out failures. This is particularly true for caches
that dominate the area of modern processors and are built with
minimum-sized, but prone to failure, SRAM cells.
Our attempt to address this cache reliability challenge is an
analytical model for determining the implications on cache miss-
rate of block-disabling due to random cell failure. The proposed
model is distinct from previous work in that is an exact model
rather than an approximation and yet it is simpler than previous
work. Its simplicity stems from the lack of fault-maps in the

  

Source: Aragón Alcaraz, Juan Luis - Departamento de Ingenieria y Tecnologia de Computadores, Universidad de Murcia

 

Collections: Computer Technologies and Information Sciences