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Self-navigation of an STM tip toward a micron sized sample Guohong Li, Adina Luican, and Eva Y. Andrei
 

Summary: 1
Self-navigation of an STM tip toward a micron sized sample
Guohong Li, Adina Luican, and Eva Y. Andrei
Department of Physics & Astronomy, Rutgers University, Piscataway,
New Jersey 08854, USA
We demonstrate a simple capacitive based method to quickly and efficiently
locate micron size conductive samples on insulating substrates in a scanning
tunneling microscope (STM). By using edge recognition the method is designed
to locate and identify small features when the STM tip is far above the surface
allowing for crash-free search and navigation. The method can be implemented
in any STM environment even at low temperatures and in strong magnetic field,
with minimal or no hardware modifications.
I.INTRODUCTION
A scanning tunneling microscope1,2
(STM) is a powerful tool to study materials with atomic
resolution. In the STM topography mode a sharp metallic tip scans above a conductive sample
surface while monitoring the tip-sample tunneling current which depends exponentially on the
distance. Typically the measurement is carried out at a tip-sample distance of order 1 nm. The
precise control of tip position (x, y, z) is usually realized by employing a piezo-electric tube
scanner with pico-meter resolution2

  

Source: Andrei, Eva Y. - Department of Physics and Astronomy, Rutgers University

 

Collections: Materials Science; Physics