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Time-resolved temperature measurements during pulsed laser irradiation uslng thin film metal thermometers
 

Summary: Time-resolved temperature measurements during pulsed laser irradiation
uslng thin film metal thermometers
D. P. Brunco
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853
J. A. Kittl
Divkion of Applied Sciences, Harvard University, Cambridge, Massachusetts 02138
C. E. Otis
IBM I: J. Watson Research Center, Yorktown Heights, New York IO598
P. M. Goodwin
Mail Stop M888, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
Michael 0. Thompson
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853
M. J. Aziz
Division of Applied Sciences, Harvard University, Cambridge, Massachusetts 02138
(Received 19 March 1993; accepted for publication 13 May 1993)
In this article, we describe a technique using Nisi and Pt thin film metal thermometers to
provide accurate temperature information on a nanosecond time scale during pulsed laser
processing of materials. A surface layer of interest is deposited onto the thermometer layer, and
temperatures are determined from temperature dependent changes in the metal film's resistance.
Details concerning the design and fabrication of the device structure and experimental

  

Source: Aziz, Michael J.- School of Engineering and Applied Sciences, Harvard University

 

Collections: Physics; Materials Science