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Structural c aracterization and microwave loss of Ndl~s5CeO~15Cu04-y superconducting thin films on yttria-stabilized zirconia buffered sapphire
 

Summary: Structural c aracterization and microwave loss of Ndl~s5CeO~15Cu04-y
superconducting thin films on yttria-stabilized zirconia buffered sapphire
S. N. Mao, X. X. Xi, Jian Mao, D. H. Wu, Qi Li, S. M. Anlage, and T. Venkatesana)
Center for Superconductivity Research, Department of Physics, University of Maryland, College Park,
Maryland 20742
D. Prasad Beesabathina, and L. Salamanca-Riba
Center for Superconductivity Research, Materials and Nuclear Engineering Department, University
of Maryland, College Park, Maryland 20742
X. D. Wu
STC, Los Alamos National Laboratory Los Alamos, New Mexico 87545
(Received 19 October 1993; accepted for publication 16 November 1993)
We have grown superconducting Nd,., Cer,rsCu04-, (NCCO) thin films on (liO2) sapphire using
a yttria-stabilized zirconia (YSZ) buffer layer, which has been demonstrated to be the best material
for the growth of n-type superconducting NCCO thin films. The films are c-axis oriented, epitaxi-
ally grown with a small mosaic spread of 0.2" and a Rutherford backscattering spectroscopy
channeling yield of -9%. Cross-sectional transmission electron microscopy images reveal a sharp
interface between NCCO and YSZ. The microwave surface resistance of NCCO films on YSZ
buffered sapphire at 9.6 GHz is only 80 /&I at 4.2 K in zero magnetic field, which is comparable
to YtBa,Cu307-, films at similar reduced temperature, as a consequence of the decrease of struc-
tural imperfection in the film. The temperature dependence of the surface resistance and magnetic

  

Source: Anlage, Steven - Center for Superconductivity Research & Department of Physics, University of Maryland at College Park

 

Collections: Materials Science