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Summary: 902 IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, VOL. 17, NO. 2, JUNE 2007
Imaging of Microscopic Sources of Resistive
and Reactive Nonlinearities in Superconducting
Microwave Devices
Alexander P. Zhuravel, Steven M. Anlage, Member, IEEE, and Alexey V. Ustinov
Abstract--The technique of low-temperature Laser Scanning
Microscopy (LSM) has been applied to the investigation of local
microwave properties in operating YBa2Cu3O7 LaAlO3
thin-film resonators patterned into a meandering strip trans-
mission line. By using a modified newly developed procedure of
spatially-resolved complex impedance partition, the influence of
inhomogeneous current flow on the formation of nonlinear (NL)
microwave response in such planar devices is analysed in terms of
the independent impact from resistive and inductive components.
The modified procedure developed here is dramatically faster than
our previous method. The LSM capability to probe the spatial
variations of two-tone, third-order intermodulation photore-
sponse on micron length scales is used to find the 2D distribution
of the local sources of microwave NL. The results show that the
dominant sources of microwave NL are strongly localized in the
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