Home

About

Advanced Search

Browse by Discipline

Scientific Societies

E-print Alerts

Add E-prints

E-print Network
FAQHELPSITE MAPCONTACT US


  Advanced Search  

 
Now at Intel Corporation accepted, Journal of Materials Research, August 2004
 

Summary: 1
Now at Intel Corporation
accepted, Journal of Materials Research, August 2004
CORRELATION OF STRESS STATE AND NANOHARDNESS VIA HEAT
TREATMENT OF NICKEL-ALUMINIDE MULTILAYER THIN FILMS
Evan A. Sperling1, Peter M. Anderson2, and Jennifer L. Hay3
1Materials Science & Technology, Los Alamos National Laboratory
2Dept Materials Science and Engineering, The Ohio State University
3MTS Systems Corporation
Abstract
Heat treatment of g-Ni(Al)/g'-Ni3Al multilayer thin films demonstrates that multilayer
hardness correlates with the magnitude of biaxial stress in alternating layers. Films with
a columnar grain morphology and (001) texture were fabricated over a range of volume
fraction and bilayer thickness via DC magnetron sputtering onto NaCl (001) substrates at
623 K. The films were removed from substrates, heat treated at either 673 K or 1073 K
in argon, and then mounted for nanoindentation and x-ray diffraction. The bi-axial stress
state in each phase was furnished from x-ray diffraction measurement of (002) interplanar
spacings. The 673 K treatment increases the magnitude of alternating bi-axial stress state
by 70 to 100% and increases hardness by 25 to 100%, depending on bilayer thickness. In
contrast, the 1073 K heat treatment decreases the stress magnitude by 70% and decreases

  

Source: Anderson, Peter M. - Department of Materials Science and Engineering, Ohio State University

 

Collections: Materials Science