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EMISSION MEASURE MODELING AND ABUNDANCE DETERMINATION OF AT MIC OBSERVED BY MEANS OF RGS AND EPICMOS ON BOARD XMMNEWTON
 

Summary: 1
EMISSION MEASURE MODELING AND ABUNDANCE DETERMINATION OF AT MIC
OBSERVED BY MEANS OF RGS AND EPIC­MOS ON BOARD XMM­NEWTON
A.J.J. Raassen 1;2 , M. Audard 3 , R. Mewe 1 , M.G¨udel 3 , and J.S. Kaastra 1
1 Space Research Organization Netherlands (SRON), Sorbonnelaan 2, 3584 CA Utrecht, The Netherlands
2 Astronomical Institute ''Anton Pannekoek'', Kruislaan 403, 1098 SJ Amsterdam, The Netherlands
3 Paul Scherrer Institut, W¨urenlingen & Villigen, 5232 Villigen PSI, Switzerland
Abstract
The X­ray spectrum of the late­type M­dwarf binary
AT Mic (dM4.5e+dM4.5e) is observed in the wavelength
range from 1 ­ 40 š A by means of RGS and EPIC­MOS on
board XMM­Newton. To these data we have performed
a 4­temperature fit and a self­consistent DEM­modeling
using the SPEX­code. Here we report the temperature
distribution, Emission Measure (EM) and abundances of
this bright X­ray source. The temperature range stretches
from 1 to 80 MK. The total volume emission measure in
this temperature interval is ¸ 10:5 \Theta 10 51 cm \Gamma3 . The dom­
inant line­forming emission measure is around 8 MK. The
high­resolution spectrum of AT Mic, obtained by RGS, is

  

Source: Audard, Marc - INTEGRAL Science Data Centre & Observatory of Geneva, Université de Genève
Guedel, Manuel - Institut für Astronomie, Universität Wien

 

Collections: Physics