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Computation for ElectroMigration in Interconnects of MicroElectronics Devices \Lambda

Summary: Computation for Electro璏igration in
Interconnects of Micro璄lectronics Devices \Lambda
To appear in Journal of Computational Physics
Amir Averbuch 1 y Moshe Israeli 2 Igor Ravve 1z
Irad Yavneh 2
1 Department of Computer Science
School of Mathematical Sciences
Tel Aviv University
Tel Aviv 69978, Israel
2 Faculty of Computer Science
Haifa 32000, Israel
\Lambda The research of the first two authors was supported by Israeli Ministry of Science and Technology grant
#9672񩨅6 9672񪏝8.
y Corresponding author: Tel: 972񪏚422020, Fax: 972񪏚409357, E璵ail:amir@math.tau.ac.il
z Receipint of the 19971998 Israeli Academy of Sciences Post Doctoral Fellowship for research at the
Computer Science Department, Tel Aviv University, Israel.

List of Figures
1 Establishing the distance function sign . . . . . . . . . . . . . . . . . . . . . 11


Source: Averbuch, Amir - School of Computer Science, Tel Aviv University


Collections: Computer Technologies and Information Sciences