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IEEE Insmmentation and Measuremen1 Technology Conference

Summary: IEEE Insmmentation and Measuremen1
Technology Conference
Vail. CO, USA, 20-22 May 2003
Compressionof Partially Specified Test Vectors in an ATE Environment
E Karimi ',Y.B. Kim ', E Lombardi and N. Park
LTX Corporation, 3930 North First Street, San Jose CA 95134, USA
* Dept of ECE,Northeastern University, Boston, MA 02115,USA, {ybk, lombardi}@ece.neu.edu
Dept of CS, Oklahoma State University, Stillwater, OK 74078-1053, USA, npark@a.cs.okstate.edu
A=- The manufacturing tesl oftoday's digilal chips requires new de-
sign eomiderolionsfor outomlie les1 equipmen1 (ATE). Compression has
been used in ATE to reduce storage ond oppticolion limefor high volume
dolo by exploiting tho repeNive ~ t w eoftesr veclors. Thispaper deals with
compression ofporliolly speeijed tesl sets, i r . ~eclorswith don't care (un-
specified, X)enhies. A proper X nssignmenr can be used to enhance the
polenliolfor compression by inlroducing simiinrilies among ~eelors(come-
lorion). This paper provides (1 comprehensive lreatment of the X assign-
mentfor compression withinfrred order and reordered test sols. Forfired
order lhr X assignment is based on (I novel rechnique referred to ns bit-
wise correlation. Using (I mtrir represenlnfianofthe tis1 set, X entries
hemled in the same position in lhe ~eclorsare molyred and Boolean vol.


Source: Ayers, Joseph - Marine Science Center & Department of Biology, Northeastern University


Collections: Engineering