| Sample search results for: a-center defect complex |
| 1 | A Linear Complexity Incremental Defect Mapping Method for Reconfigurable Computing Platforms in the Presence of Prevalent Defects | ||
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Summary: A Linear Complexity Incremental Defect Mapping Method for Reconfigurable Computing Platforms... detection and diagnosis methods target sin- gle defect occurrence. This paper presents a linear complexity... for reconfigurable platforms. This paper proposes a linear complexity incremental ... |
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Source: Liu, Bao - Department of Electrical Engineering, University of Texas at San Antonio |
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Collection: Computer Technologies and Information Sciences |
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| 2 | Paper 31.1 INTERNATIONAL TEST CONFERENCE 1 1-4244-4203-0/08/$20.00 2008 IEEE | ||
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Summary: of increasing complexity: (i) strand-level defects, (ii) tile-level defects, (iii) grid-level defects, and (iv... of the oligonucleotides used in the nanostructure. Defects at this level can propagate to higher levels of complexity... -structure ... |
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Source: Chakrabarty, Krishnendu - Department of Electrical and Computer Engineering, Duke University |
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Collection: Computer Technologies and Information Sciences |
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| 3 | Submitted to the IEEE International Test Conference, 2008 1 Fabrication Defects and Fault Models for DNA Self-Assembled | ||
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Summary: of the oligonucleotides used in the nanostructure. Defects at this level can propagate to higher levels of complexity... -structure defects, which cause the strand to form more complex structures due to interactions in solution. Sequence... as to how these defects might map to faults. At ... |
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Source: Dwyer, Chris - Department of Electrical and Computer Engineering, Duke University |
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Collection: Engineering ; Materials Science |
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| 4 | Defect and Fault Seeding In Dependability Benchmarking Barry Boehm, Daniel Port | ||
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Summary: using current techniques. Also, the version changes may be complex combinations of defect fixes and F-25... Defect and Fault Seeding In Dependability Benchmarking Barry Boehm, Daniel Port University... of Southern California {boehm, dport}@sunset.usc.edu Abstract Defect and fault seeding is often considered |
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Source: Koopman, Philip - Department of Electrical and Computer Engineering, Carnegie Mellon University |
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Collection: Computer Technologies and Information Sciences |
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| 5 | Identification of in-field defect development in digital image sensors Jozsef Dudasa | ||
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Summary: complex defect types, suggesting that this method could be used to conduct a wide-ranging survey of defect... to detect small variations of complex defect behaviors, which rapidly increases the computational costs... by assigning defects to multiple neighboring ... |
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Source: Chapman, Glenn H. - School of Engineering Science, Simon Fraser University |
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Collection: Engineering |
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| 6 | Quantitative Analysis of In-Field Defects in Image Sensor Arrays Jenny Leung, Jozsef Dudas, Glenn H. Chapman Israel Koren, Zahava Koren | ||
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Summary: = otherwise Rr Rrf Upper UpperUniform 0 0 1 )( . (7) Now consider a more complex defect radial distribution... Quantitative Analysis of In-Field Defects in Image Sensor Arrays Jenny Leung, Jozsef Dudas, Glenn H... of pixel density and sensor array size increases the likelihood of developing in-field pixel ... |
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Source: Chapman, Glenn H. - School of Engineering Science, Simon Fraser University |
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Collection: Engineering |
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| 7 | Modeling of the influence of the defect position on the reflected intensity in EUV mask | ||
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Summary: , to address complex topographies we have simulated in this article (defective multi-layer structure... Modeling of the influence of the defect position on the reflected intensity in EUV mask Maxime... of a defect modifying the multi-layer stack [1][2]. This paper presents the results of simulations, performed |
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Source: Ecole Polytechnique, Centre de mathématiques |
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Collection: Mathematics |
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| 8 | Defect Tolerance After the Roadmap Mahim Mishra | ||
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Summary: process will be simplified because complex computational structures or highly accurate, defect... Defect Tolerance After the Roadmap Mahim Mishra£ and Seth C. Goldstein Computer Science Department... nm feature sizes. However, these technologies are likely to have significantly higher defect |
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Source: Goldstein, Seth Copen - School of Computer Science, Carnegie Mellon University |
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Collection: Computer Technologies and Information Sciences |
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| 9 | A topological point defect regulates the evolution of extended defects in irradiated silicon | ||
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Summary: of atomic-scale annihilation of bond defects drives the submicron-scale complex structural evolution... A topological point defect regulates the evolution of extended defects in irradiated silicon... and annihilation of atomic-scale bond defects dominate nucleation and evolution of ... |
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Source: Wilkins, John - Department of Physics, Ohio State University |
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Collection: Materials Science ; Physics |
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| 10 | PLEASE SCROLL DOWN FOR ARTICLE This article was downloaded by: [2007-2008-2009 HanKuk University of Foreign Studies] | ||
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Summary: defects to cope with the complexity and vagueness of the defects. However, it is difficult to obtain... ://www.informaworld.com/smpp/title~content=t713696255 An effective and efficient defect inspection system for TFT-LCD polarised films using adaptive... defect inspection system for ... |
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Source: Chung, Chin-Wan - Department of Computer Science, Korea Advanced Institute of Science and Technology |
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Collection: Computer Technologies and Information Sciences |
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| 11 | Defect solitons in photonic lattices Jianke Yang1,2 | ||
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Summary: Defect solitons in photonic lattices Jianke Yang1,2 and Zhigang Chen3,4 1 Department of Mathematics... December 2005; published 14 February 2006 Nonlinear defect modes defect solitons and their stability in one... -dimensional photonic lattices with focus- ing saturable nonlinearity are investigated. It is shown that ... |
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Source: Chen, Zhigang - Department of Physics and Astronomy, San Francisco State University; Yang, Jianke - Department of Mathematics and Statistics, University of Vermont |
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Collection: Mathematics ; Physics |
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| 12 | How to buy better testing Using competition to get the most security and robustness for your dollar | ||
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Summary: as one of the outputs of the process. This is accomplished via a market for defect reports, in which... testers maximize profits by minimiz- ing the cost of finding defects. The power of competition... is harnessed to ensure that testers are paid a fair price for the defects they discover, thereby aligning |
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Source: Schechter, Stuart Edward - Microsoft Research |
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Collection: Computer Technologies and Information Sciences |
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| 13 | phys. stat. sol. (b) 211, 91 (1999) Subject classification: 78.55.Et; 62.50.+p; 71.20.Nr; S8.12 | ||
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Summary: to similar transitions in- volving [donor±VZn] deep acceptor complexes, so called A-centers. A similar... residual donors, forming A-center complexes with time. The comparisons in Figs. 3 and 4 show the effects... with pressure for both the VZn and A-center defects. ... |
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Source: Weinstein, Benard.A. - Department of Physics, State University of New York at Buffalo |
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Collection: Materials Science |
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| 14 | sapm329 SAM.cls May 18, 2005 17:45 Properties of Defect Modes in One-Dimensional Optically | ||
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Summary: sapm329 SAM.cls May 18, 2005 17:45 Properties of Defect Modes in One-Dimensional Optically Induced... Photonic Lattices By Francesco Fedele, Jianke Yang, and Zhigang Chen In this article, localized defect... , the origin of these defect modes is investigated analytically in the weak-defect limit by ... |
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Source: Chen, Zhigang - Department of Physics and Astronomy, San Francisco State University |
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Collection: Physics |
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| 15 | Properties of Defect Modes in One-Dimensional Optically Induced Photonic Lattices | ||
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Summary: Properties of Defect Modes in One-Dimensional Optically Induced Photonic Lattices By Francesco... Fedele, Jianke Yang, and Zhigang Chen In this article, localized defect modes in one... -dimensional optically induced photonic lattices are studied comprehensively. First, the origin of these defect modes |
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Source: Yang, Jianke - Department of Mathematics and Statistics, University of Vermont |
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Collection: Mathematics |
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| 16 | On-Line Mapping of In-Field Defects in Image Sensor Arrays Jozsef Dudas, Cory Jung, Linda Wu, | ||
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Summary: in real-world digital cameras. We consider a more complex defect model with a continuous range... a tradeoff between diagnostic accuracy and algorithm complexity. For example, a group of defect types may... the Level 3 defect model with 0.10 and 0.01 bin sizes. As the model ... |
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Source: Chapman, Glenn H. - School of Engineering Science, Simon Fraser University |
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Collection: Engineering |
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| 17 | On Effective Use of Reliability Models and Defect Data in Software Development | ||
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Summary: On Effective Use of Reliability Models and Defect Data in Software Development Rattikorn Hewett... and open source development increasingly use feedback from customer testing. This makes the customer defect... and defect data to help managers make software release decisions by applying a strategy for selecting |
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Source: Stringfellow, Catherine V. - Department of Computer Science, Midwestern State University |
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Collection: Computer Technologies and Information Sciences |
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| 18 | Modeling the rework cycle: capturing multiple defects per task Hazhir Rahmandad: hazhir@vt.edu | ||
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Summary: 1 Modeling the rework cycle: capturing multiple defects per task Hazhir Rahmandad: hazhir... defective or not. Yet in many projects multiple defects can occur in one task. In this study we introduce... a new rework cycle formulation that accounts for multiple defects per task and flexibly captures |
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Source: Rahmandad, Hazhir - Department of Industrial and Systems Engineering, Virginia Tech |
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Collection: Engineering |
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| 19 | Title Slide "goto considered not particularly harmful: defect analysis | ||
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Summary: . XLOC Cyclomatic complexity v. goto #12;Defect correlations Cyclo. complexity v. defects Ln(xloc). v... Title Slide "goto considered not particularly harmful: defect analysis in a major numerical library... . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ... |
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Source: Hatton, Les - School of Computing and Information Systems, Kingston University |
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Collection: Computer Technologies and Information Sciences |
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| 20 | Detection and Correction of Design Defects in Object-Oriented Architectures | ||
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Summary: Detection and Correction of Design Defects in Object-Oriented Architectures Naouel Moha GEODES... and Operations Research University of Montreal, Quebec, Canada mohanaou@iro.umontreal.ca Abstract. Design defects... their evolution and their maintenance. A good architecture without defects reduces significantly maintenance costs |
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Source: Moha, Naouel - Departement de informatique, Université du Québec à Montréal |
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Collection: Computer Technologies and Information Sciences |
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| 21 | Comparison of fast 3D simulation and actinic inspection for EUV masks with buried defects | ||
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Summary: methods, can accurately predict the complex behavior of a buried EUV defect. * chris... accurately predict the complex behavior of a buried EUV defect. ACKNOWLEDGEMENTS: This research was funded... Comparison of fast 3D simulation and actinic inspection for EUV masks with buried defects ... |
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Source: Lawrence Berkeley National Laboratory, Center for X-Ray Optics, EUV Interferometry |
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Collection: Physics |
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| 22 | Published in IET Computers & Digital Techniques Received on 19th October 2008 | ||
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Summary: of increasing complexity: (i) strand-level defects, (ii) tile-level defects, (iii) grid-level defects and (iv... of the oligonucleotides used in the nanostructure. Defects at this level can propagate to higher levels of complexity... - structure ... |
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Source: Chakrabarty, Krishnendu - Department of Electrical and Computer Engineering, Duke University |
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Collection: Computer Technologies and Information Sciences |
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| 23 | Actinic imaging of native and programmed defects on a full-field mask , K. A. Goldberga | ||
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Summary: ;profile) and to discriminate between amplitude, phase, and complex defects. Experimentally, we observe... of both, and can thus be characterized as complex defects, for their effect on the reflected field... Vol. 7636 76361A-5 #12;3.4 EUV aerial images and simulation of a complex ... |
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Source: Lawrence Berkeley National Laboratory, Center for X-Ray Optics, EUV Interferometry |
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Collection: Physics |
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| 24 | Phoenix: Detecting and Recovering from Permanent Processor Design Bugs | ||
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Summary: Defect Coverage Results All DefectsConcurrent Complex 69% 31% Pre Post 63% 37% Detect Recover Training... ://iacoma.cs.uiuc.edu #12;http://iacoma.cs.uiuc.edu 2 Can a Processor have a Design Defect ? No Way !!! Yes, it is a major... verification times Massive computational resources Some ... |
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Source: Torrellas, Josep - Department of Computer Science, University of Illinois at Urbana-Champaign |
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Collection: Computer Technologies and Information Sciences |
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| 25 | Dynamic Classification of Defect Structures in Molecular Dynamics Simulation Data | ||
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Summary: Dynamic Classification of Defect Structures in Molecular Dynamics Simulation Data Sameep Mehta... to clas- sify anomalous structures (defects) in data generated from Molecular Dynamics (MD) simulations... of various defects as they have a profound impact on the electrical and mechanical proper- ties of Silicon |
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Source: Wilkins, John - Department of Physics, Ohio State University |
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Collection: Materials Science ; Physics |
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| 26 | game design lecture # V.1 | ||
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Summary: in complex results (example: Prisoner's Dilemma, discussed below) feedback loops: · positive feedback... the payoffs for 2-player games · an example is shown below, where each player can either cooperate or defect... : column player defect cooperate row player defect 1, 1 1, 4 cooperate 4, 1 4, 4 · each ... |
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Source: Sklar, Elizabeth - Department of Computer and Information Science, Brooklyn College, City University of New York |
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Collection: Computer Technologies and Information Sciences |
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| 27 | Identifying Domain-Specific Defect Classes Using Inspections and Change History | ||
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Summary: to larger code which may contain more complex defects. Pruning versions: When examining the code... Identifying Domain-Specific Defect Classes Using Inspections and Change History Taiga Nakamura... for analyzing defects in source code when change history is available. Our bottom-up approach can be applied |
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Source: Basili, Victor R. - Fraunhofer Center & Department of Computer Science, University of Maryland at College Park |
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Collection: Computer Technologies and Information Sciences |
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| 28 | Scalable Defect Tolerance for Molecular Electronics Mahim Mishra and Seth C. Goldstein | ||
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Summary: Scalable Defect Tolerance for Molecular Electronics Mahim Mishra and Seth C. Goldstein mahim... . However, CAEN-based circuits are expected to have huge defect densities. To solve this problem CAEN can... be used to build reconfigurable fabrics which, assuming the defects can be found, are inherently defect |
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Source: Goldstein, Seth Copen - School of Computer Science, Carnegie Mellon University |
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Collection: Computer Technologies and Information Sciences |
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| 29 | Defect prevention in software processes | ||
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Summary: Defect prevention in software processes: An action-based approach Ching-Pao Chang and Chih-Ping Chu... /202007-09-06 Contents n Introduction n Background n Action-based defect prevention n Case study n Conclusion n... to identify causes of defects in software process for defect prevention n Due to large ... |
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Source: Bae, Doo-Hwan - Department of Computer Science, Korea Advanced Institute of Science and Technology |
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Collection: Computer Technologies and Information Sciences |
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| 30 | Preprint, submitted for publication in J. Appl. Phys. c The American Institute of Physics | ||
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Summary: ;use x-ray scattering from 311 defects in Si K. Nordlund Accelerator Laboratory, P.O. Box 43, FIN-00014... University of Helsinki, Finland (September 24, 2001) 311 defects are extended, rod-like defects which play... techniques provide a non-destructive means to detect defects in solids. However, to date ... |
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Source: Nordlund, Kai - Accelerator Laboratory, University of Helsinki |
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Collection: Physics |
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| 31 | Dynamics of localized structures in vectorial waves Emilio HernandezGarca, Miguel Hoyuelos + , Pere Colet and Maxi San Miguel | ||
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Summary: of topological defects in a twodimensional complex vector field are considered. These objects naturally arise... in the study of polarized transverse light waves. Dynamics is modeled by a Vector Complex Ginzburg... processes, and selforganization of defects in lattice structures, are described. We find ... |
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Source: Colet, Pere - Mediterranean Institute for Advanced Studies (IMEDEA) |
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Collection: Physics |
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| 32 | ON THE EXISTENCE OF SPECIAL TYPES OF p-BLOCKS IN p-SOLVABLE GROUPS | ||
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Summary: containing two complex characters each of degree 8, and a block B of defect 0 containing an irreducible... + Z(FG) be the sum of the elements in K. We say that K is a defect class for B if (K+ ) = 0 and K... of conjugacy class sums. If K is a defect class for B and D is a Sylow p-subgroup of the centralizer ... |
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Source: Gow, Rod - Department of Mathematics, University College Dublin |
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Collection: Mathematics |
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| 33 | Title Slide "High-Integrity Software, Computation and | ||
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Summary: Hatton, 2011-. Copying freely permitted with acknowledgement ... defect Relationship to static complexity... High-Integrity Software and ... The scientific method Defect Programming languages Process FAQs... ) computation. #12;Copyright Les Hatton, 2011-. Copying freely permitted with acknowledgement ... ... |
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Source: Hatton, Les - School of Computing and Information Systems, Kingston University |
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Collection: Computer Technologies and Information Sciences |
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| 34 | The Hypergeometric distribution | ||
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Summary: to deal with situations arising when we sample from batches with a known number of defective items. You... will find that, in essence, the number of defective items in a batch is not a random variable... a batch of items containing a variable number of defectives. We are essentially assuming that we know |
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Source: Vickers, James - School of Mathematics, University of Southampton |
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Collection: Mathematics |
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| 35 | Chirality-biased point defects dynamics on a disclination line in a nematic liquid crystal | ||
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Summary: more complex than described in the simulations. For example the mobility of defects (defined... Chirality-biased point defects dynamics on a disclination line in a nematic liquid crystal Andrzej... 3247 Abstract Chiral additives in the nematic liquid crystal can alter the dynamics of point defects |
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Source: Ecole Polytechnique, Centre de mathématiques |
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Collection: Mathematics |
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| 36 | Rigorous simulation of line-defects in EUV masks Patrick Schiavone, Renaud Payerne | ||
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Summary: by Fourier Expansion can be extended to handle the complex geometry of EUV defective masks. In the first part... Rigorous simulation of line-defects in EUV masks Patrick Schiavone, Renaud Payerne Laboratoire des... defects in EUV masks. Using the Modal Method by Fourier Expansion, the geometry of the ... |
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Source: Ecole Polytechnique, Centre de mathématiques |
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Collection: Mathematics |
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| 37 | Robust detection of defects in imaging arrays Jozsef Dudasa | ||
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Summary: the convergence rate was slower when applied to more complex defect models. This paper outlines a second... diagnosis. Our method rapidly converges on correct results, even when applied to more complex defect models... will include are partitioned into two groups based on their ... |
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Source: Chapman, Glenn H. - School of Engineering Science, Simon Fraser University |
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Collection: Engineering |
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| 38 | Appendix 3-3-The complete model formulation for detailed multiple release software product simulation model | ||
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Summary: "Dynamics of Platform-based Product Development". The model, however, was too complex to be discussed... - 1. The model includes design, development, testing, defects in the field, bug fixing, underlying... rate and design quality; architecture complexity on productivity; bug fixing on scope; re |
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Source: Rahmandad, Hazhir - Department of Industrial and Systems Engineering, Virginia Tech |
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Collection: Engineering |
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| 39 | Detection and Correction of Design Defects in Object-Oriented Designs | ||
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Summary: complexity of the design of a program [13]. #12;The solution advocated for correcting design defects... Detection and Correction of Design Defects in Object-Oriented Designs Naouel Moha Ptidej Team... GEODES Group, DIRO University of Montreal, QC, Canada mohanaou@iro.umontreal.ca Abstract Design defects |
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Source: Moha, Naouel - Departement de informatique, Université du Québec à Montréal |
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Collection: Computer Technologies and Information Sciences |
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| 40 | M. Ali Babar, M. Vierimaa, and M. Oivo (Eds.): PROFES 2010, LNCS 6156, pp. 1731, 2010. Springer-Verlag Berlin Heidelberg 2010 | ||
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Summary: -Verlag Berlin Heidelberg 2010 Investigating the Temporal Behavior of Defect Detection in Software Inspection... , is detecting defects in software artifacts to increase prod- uct quality and decrease rework effort and cost... . Inspection aims at identifying defects early and traditional testing focuses on test case generation |
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Source: Technische Universität Wien, Institute for Software Technology and Interactive Systems, Interactive Media Systems Group |
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Collection: Computer Technologies and Information Sciences |
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| 41 | Actinic inspection of extreme ultraviolet programed multilayer defects and cross-comparison measurements | ||
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Summary: The interaction of reflected EUV light with defects on or below a mask surface is a complex process that is highly... Actinic inspection of extreme ultraviolet programed multilayer defects and cross... The production of defect-free mask blanks remains a key challenge for extreme ultraviolet EUV lithography |
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Source: Lawrence Berkeley National Laboratory, Center for X-Ray Optics, EUV Interferometry |
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Collection: Physics |
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| 42 | Oil & Gas Science and Technology Rev. IFP, Vol. 56 (2001), No. 1, pp. 23-31 Copyright 2001, ditions Technip | ||
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Summary: of defects is smaller than the capillary length, the contact line shape is more complex and we analyze its... longueur capillaire, la forme de la ligne de contact est plus complexe et nous analysons sa morphologie en... defects are present, or when the average distance between defects is ... |
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Source: Cubaud, Thomas - Department of Mechanical Engineering, Stony Brook University |
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Collection: Engineering |
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| 43 | 1 Copyright 2003 by ASME Proceedings of DETC 2003 | ||
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Summary: with the occurrences of defects. This paper develops a design-based complexity factor derived from the "Design... the metrics. The quantitative correlation between the design-based complexity factor and defect rates... for Assembly, Design for Quality, Assembly Defect, Quality Control, ... |
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Source: Ishii, Kos - Department of Mechanical Engineering, Stanford University |
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Collection: Engineering |
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| 44 | Using Bayesian Networks to Predict Software Defects and Reliability Norman Fenton | ||
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Summary: the fewer the defects and the less complex the problem the fewer defects. Finally, how many defects you find... defects in testing and high complexity observed So far we have made no observation about operational usage... Using Bayesian Networks to Predict Software ... |
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Source: Fenton, Norman - Department of Computer Science, Queen Mary, University of London |
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Collection: Computer Technologies and Information Sciences |
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| 45 | Defect evolution in ultrathin films of polystyrene-block-polymethylmethacrylate diblock | ||
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Summary: Defect evolution in ultrathin films of polystyrene-block-polymethylmethacrylate diblock copolymers... August 1998; accepted 7 October 1998 We track individual defects in the microdomain patterns of cylinder... , clustering, and annihilation of defects. Such processes form the basis for predicting structural change |
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Source: Sibener, Steven - Department of Chemistry, University of Chicago |
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Collection: Chemistry |
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| 46 | PHYSICAL REVIEW A 83, 033836 (2011) Nonlinear beam deflection in photonic lattices with negative defects | ||
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Summary: in uniform lattices and in lattices with positive defects at moderate incident angles are much more complex... lattices and positive defects at small and moderate tilting angles exhibit much more complex evolution... defects Jiandong Wang,1 Zhuoyi Ye,2 Alexandra Miller,3 Yi Hu,2,3 Cibo ... |
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Source: Chen, Zhigang - Department of Physics and Astronomy, San Francisco State University; Yang, Jianke - Department of Mathematics and Statistics, University of Vermont |
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Collection: Mathematics ; Physics |
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| 47 | Comment on ``Paired Gap States in a Semiconducting Carbon Nanotube: Deep and Shallow Levels'' | ||
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Summary: defects, such as Stone-Wales (SW) and vacancy-adatom (VA) complexes. Here we point out... that such an interpretation of the experi- ments is hardly consistent with the abundance and stability of such defects. We... and can explain all features reported in Ref. [1] in terms of a single type of defects. The ... |
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Source: Krasheninnikov, Arkady V. - Accelerator Laboratory, University of Helsinki |
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Collection: Materials Science |
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| 48 | Architectures built using bottom-up self-assembly of nanoelectronic devices will need to tolerate defect rates that | ||
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Summary: of the requirements for our scheme. Any system that uses more complex nodes would work equally well with our defect... , i.e, it cannot per- form any processing or communication. We do not examine more complex defect... broadcast with a node defect model that allows partially ... |
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Source: Sorin, Daniel J. - Departments of Electrical and Computer Engineering & Computer Science, Duke University |
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Collection: Computer Technologies and Information Sciences |
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| 49 | Architectures built using bottom-up self-assembly of nanoelectronic devices will need to tolerate defect rates that | ||
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Summary: of the requirements for our scheme. Any system that uses more complex nodes would work equally well with our defect... , i.e, it cannot per- form any processing or communication. We do not examine more complex defect... broadcast with a node defect model that allows partially ... |
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Source: Duke University, Department of Computer Science, Computer Architecture Group; Dwyer, Chris - Department of Electrical and Computer Engineering, Duke University |
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Collection: Computer Technologies and Information Sciences ; Engineering ; Materials Science |
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| 50 | Defect Prediction using Combined Product and Project Metrics A Case Study from the Open Source "Apache" MyFaces Project Family | ||
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Summary: Defect Prediction using Combined Product and Project Metrics A Case Study from the Open Source... source software (OSS) products, e.g., defect estimation and prediction approaches of individual releases... on the accuracy of defect pre- diction and software maintenance focus on product metrics as predictors |
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Source: Technische Universität Wien, Institute for Software Technology and Interactive Systems, Interactive Media Systems Group |
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Collection: Computer Technologies and Information Sciences |
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| 51 | Comparing Bug Finding Tools with Reviews and Stefan Wagner1 | ||
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Summary: tools can find defects in software source code us- ing an automated static analysis. This automation may... understanding of how the defects found by bug finding tools relate to the defects found by other techniques... different defects than testing but a subset of defects found by ... |
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Source: Cengarle, María Victoria - Institut für Informatik, Technische Universität München |
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Collection: Computer Technologies and Information Sciences |
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| 52 | Comparing Bug Finding Tools with Reviews and Stefan Wagner1 | ||
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Summary: Complex type conversion 5 7 "Variable initialised but not used" in contrast to one defect revealed... tools can find defects in software source code us- ing an automated static analysis. This automation may... understanding of how the defects found by bug finding tools relate to the ... |
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Source: Cengarle, María Victoria - Institut für Informatik, Technische Universität München |
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Collection: Computer Technologies and Information Sciences |
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| 53 | Defect Tolerance at the End of the Roadmap Mahim Mishra and Seth C. Goldstein | ||
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Summary: Defect Tolerance at the End of the Roadmap Mahim Mishra and Seth C. Goldstein Computer Science... ,seth}@cs.cmu.edu Abstract Defect tolerance will become more important as feature sizes shrink closer to single digit... ). In this paper, we propose a defect toler- ance methodology centered around reconfigurable devices, a scalable |
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Source: Goldstein, Seth Copen - School of Computer Science, Carnegie Mellon University |
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Collection: Computer Technologies and Information Sciences |
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| 54 | 834 OPTICS LETTERS / Vol. 28, No. 10 / May 15, 2003 Interactions of discrete solitons with structural defects | ||
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Summary: with structural defects R. Morandotti,* H. S. Eisenberg, D. Mandelik, and Y. Silberberg Department of Physics... of Complex Systems, Weizmann Institute of Science, Rehovot 76100, Israel D. Modotto, M. Sorel, and C. R... with defect states fabricated in arrays of coupled wave- guides. We achieved attractive and repulsive ... |
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Source: Silberberg, Yaron - Department of Physics of Complex Systems, Weizmann Institute of Science |
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Collection: Physics |
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| 55 | Non-parametric texture defect detection using Weibull Fabian Timma,b and Erhardt Bartha | ||
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Summary: Non-parametric texture defect detection using Weibull features Fabian Timma,b and Erhardt Bartha a... - parametric approach for defect detection in textures that only employs two features. We compute the two... becomes independent of the particular texture type and also independent of a certain defect type |
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Source: |
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Collection: Computer Technologies and Information Sciences |
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| 56 | Phase defect detection with spatial heterodyne interferometry Philip R. Bingham*a | ||
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Summary: Phase defect detection with spatial heterodyne interferometry Philip R. Bingham*a , Kenneth W... by a difference in material thickness. Surface topology measurements can be used to identify phase defects... -speed non-contact phase defect detection. SHI is an imaging technique developed at Oak Ridge National |
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Source: Oak Ridge National Laboratory, Engineering Science and Technology Division, Image Science and Machine Vision Group |
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Collection: Engineering |
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| 57 | Defect-Aware Synthesis of Droplet-Based Microfluidic Biochips* , Krishnendu Chakrabarty | ||
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Summary: " droplet-based microfluidic platforms, system integration, design complexity, and the need for defect... -oblivious and defect-aware methods for the PCR example. Due to the relative lower complexity of the PCR assay... Defect-Aware Synthesis of Droplet-Based Microfluidic Biochips* Tao Xu , ... |
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Source: Chakrabarty, Krishnendu - Department of Electrical and Computer Engineering, Duke University |
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Collection: Computer Technologies and Information Sciences |
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| 58 | VOLUME 77, NUMBER 13 P H Y S I C A L R E V I E W L E T T E R S 23 SEPTEMBER 1996 Phase Defects as a Measure of Disorder in Traveling-Wave Convection | ||
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Summary: in the pattern. The first step in identifying defects in a TW convection pattern is to calculate the complex... VOLUME 77, NUMBER 13 P H Y S I C A L R E V I E W L E T T E R S 23 SEPTEMBER 1996 Phase Defects... is studied in traveling-wave convection in an ethanol-water mixture. A technique for calculating the ... |
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Source: La Porta, Arthur - Institute for Physical Science and Technology & Department of Physics, University of Maryland at College Park |
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Collection: Physics |
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| 59 | E~~rophys.Lett., 12 (2), pp. 135-141 (1990) Defects in Degenerate Hybrid Aligned Nematic | ||
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Summary: . 139 The complex character of the defect structure can explain the above-mentioned textural paradox... E~~rophys.Lett., 12 (2), pp. 135-141 (1990) Defects in Degenerate Hybrid Aligned Nematic Liquid... 6 March 1990) PACS. 61.30 - Liquid crystals. Abstract. - High-strength and zero-strength defects |
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Source: Selinger, Robin L. Blumberg - Liquid Crystal Institute and Chemical Physics Program, Kent State University |
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Collection: Materials Science |
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| 60 | On the Use of Bloom Filters for Defect Maps in Nanocomputing | ||
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Summary: On the Use of Bloom Filters for Defect Maps in Nanocomputing Gang Wang Wenrui Gong Ryan Kastner... in defect rates. Therefore, it is of paramount importance to construct new architectures and design... methodolo- gies that can tolerate large numbers of defects. Defect maps are a necessity in the future design |
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Source: |
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Collection: Engineering ; Computer Technologies and Information Sciences |
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| 61 | Combining Circuit Level and System Level Techniques for Defect-Tolerant Nanoscale Architectures | ||
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Summary: Combining Circuit Level and System Level Techniques for Defect-Tolerant Nanoscale Architectures... to develop and evaluate high- density, defect-tolerant architectures on such fabrics. Our designs are based... - in defect-tolerance techniques in conjunction with system- level CMOS voting and evaluate |
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Source: Moritz, Csaba Andras - Department of Electrical and Computer Engineering, University of Massachusetts at Amherst |
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Collection: Computer Technologies and Information Sciences |
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| 62 | Autom Software Eng (2006) 13:373394 DOI 10.1007/s10851-006-8531-5 | ||
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Summary: of software artifacts can find defects early in the development process and gather information on the quality... for inspections. We have thus developed a set of groupware tools for both individual defect detection... of tool support regarding defect detection and inspection meetings. The main results of our family |
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Source: Technische Universität Wien, Institute for Software Technology and Interactive Systems, Interactive Media Systems Group |
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Collection: Computer Technologies and Information Sciences |
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| 63 | Field representations for optical defect microcavities in 1D grating structures using quasi-normal modes | ||
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Summary: Field representations for optical defect microcavities in 1D grating structures using quasi... transmission resonances in 1D optical defect cavities and the related field approximations. Using a mirror... show a resonant response in the time or frequency domain, which can be tailored by inclusion of defects |
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Source: Hammer, Manfred - Department of Applied Mathematics, Universiteit Twente |
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Collection: Mathematics |
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| 64 | 1 Copyright 2001 by ASME Proceedings of DETC 2001 | ||
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Summary: . The authors also verify the correlation between complexity factor of the modules and their defect rates... of assembly operations, the author defined a complexity factor that enables prediction of assembly defects. GE... on the assumption that defect rates increase as ... |
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Source: Ishii, Kos - Department of Mechanical Engineering, Stanford University |
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Collection: Engineering |
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| 65 | To appear in IEEE Trans. on Visualization and Computer Graphics (Proc. Visualization/Information Visualization 2006), 12(5), 2006 Detection and Visualization of Defects in 3D Unstructured Models | ||
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Summary: ) for the same dataset. The right image shows detected defects for a complex simulated biomolecule. Fig. 2... /Information Visualization 2006), 12(5), 2006 Detection and Visualization of Defects in 3D Unstructured Models of Nematic... -automatic detection and visualization of defects in models of nematic liquid ... |
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Source: Jankun-Kelly, T. J. - Department of Computer Science, Mississippi State University |
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Collection: Computer Technologies and Information Sciences |
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| 66 | AgEng Leuven 2004 Engineering the Future (International Conference of Agricultural Engineering) | ||
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Summary: sorting system and reached high recognition rates, but misclassified stem-ends and calyxes as defected... to grade apples, where defects are segmented by subtraction of a reference image from original, stem... total defect area (Li et al., 2002). Segmentation of skin defects of apple fruits is one of the ... |
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Source: Dupont, Stéphane - Multitel; Ünay, Devrim - Department of Electrical and Electronics Engineering, Bahcesehir University |
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Collection: Computer Technologies and Information Sciences ; Engineering |
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| 67 | JOURNAL DE PHYSIQUE Colloque C5, suppl6ment au nO1O,Tome 44, octobre 1983 page C5-281 | ||
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Summary: complex (E center) o r V - 0 (A center) and vacancy complexes anneal out i n the range o f 150 - 500" C. I... complex defects ( ~ 5 ) ,a t a temperature around 600" C so t h a t a post laser treatment performed... t o the presence o f point ... |
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Source: Ecole Polytechnique, Centre de mathématiques |
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Collection: Mathematics |
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| 68 | A Practical Use of ROC Analysis to Assess the Performances of Defects Detection Algorithms | ||
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Summary: such algorithms, but it has some limitations when facing complex situations (various sizes/shapes/types of defects... A Practical Use of ROC Analysis to Assess the Performances of Defects Detection Algorithms Yann Le... .chanussot@lis.inpg.fr Abstract. Defects detection on images is a current task in quality ... |
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Source: Ecole Polytechnique, Centre de mathématiques |
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Collection: Mathematics |
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| 69 | A Controlled Experiment to Assess the Effectiveness of Inspection Meetings Alessandro Bianchi, Filippo Lanubile, and Giuseppe Visaggio | ||
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Summary: for detecting and removing defects early in the software development process. In a software inspection, review... with respect to the number of true discovered defects. While group synergy allows inspectors to find some new... defects, these meeting gains are offset by meeting losses, that is defects found ... |
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Source: Lanubile, Filippo - Dipartimento di Informatica, Università degli Studi di Bari |
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Collection: Computer Technologies and Information Sciences |
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| 70 | JOURNAL DE PHYSIQUE N Colloque C6,supplkment au Journal de PhysiqueHI,VoI. 1,d&embre 1991 | ||
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Summary: complex defects. For example, Fig.2 shows the EBIC images of two twins and a Te precipitate formed near... ) and for different regions of the Te precipitate (b,c,d). stability in different regions of these complex defects... parameters and temperature. The results obtained are discussed taking into account ... |
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Source: Ecole Polytechnique, Centre de mathématiques |
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Collection: Mathematics |
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| 71 | Hyperfine Interactions 130: 151179, 2000. 2000 Kluwer Academic Publishers. Printed in the Netherlands. | ||
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Summary: of these defect-probe complexes have analog states that have been observed in NiAl and other NiAl-type B2 phases... concentrations from the measured site fractions of PAC probes in complexes with defects [29]. In the alu- minides... and milled PdIn. Identification of defect ... |
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Source: Collins, Gary S. - Department of Physics and Astronomy, Washington State University |
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Collection: Physics |
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| 72 | Software Defect Data and Predictability for Testing Schedules Rattikorn Hewett & Aniruddha Kulkarni | ||
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Summary: of resources. As software gets more complex, testing and fixing defects become difficult to schedule... % of a project life cycle. As software projects get larger and more complex, testing and fixing defects become... , requirements change, etc. Defects can have varying degrees of ... |
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Source: Stringfellow, Catherine V. - Department of Computer Science, Midwestern State University |
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Collection: Computer Technologies and Information Sciences |
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| 73 | Computer simulation of topological defects around a colloidal particle or droplet dispersed in a nematic host | ||
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Summary: that the disclination ring defect has a complex structure. This mini- mum is probably due to the density modulation near... . To emphasise the complex structure of the defect core we plot the biaxiality profiles Fig. 6 . From the order... , especially if one bears in mind the complex ... |
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Source: Bielefeld, Universität, Fakultät für Physik, Condensed Matter Theory Group |
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Collection: Physics ; Materials Science |
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| 74 | Extreme ultraviolet holographic microscopy and its application to extreme ultraviolet mask-blank defect characterization | ||
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Summary: . The hologram captures a record of the complex-valued diffraction pattern created by the defect and can be used... -blank defect characterization Sang Hun Leea) and Jeffrey Bokor Department of Electrical Engineering... , the concept of holographic microscopy is extended to the characterizations of defects on ... |
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Source: Lawrence Berkeley National Laboratory, Center for X-Ray Optics, EUV Interferometry |
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Collection: Physics |
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| 75 | IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, VOL. 25, NO. 3, MAY/JUNE 1999 1 J:\PRODUCTION\TSE\2-INPROD\105579\105579-1.DOC regularpaper98.dot SL 19,968 04/14/99 2:14 PM 1 / 15 | ||
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Summary: of the wide range of prediction models use size and complexity metrics to predict defects. Others are based... engineering. Index Terms--Software faults and failures, defects, complexity metrics, fault-density, Bayesian... and testing processes have been advanced as ways of reducing ... |
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Source: Fenton, Norman - Department of Computer Science, Queen Mary, University of London |
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Collection: Computer Technologies and Information Sciences |
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| 76 | A Domain Anal sis to Specif DesignA Domain Analysis to Specify Design Defects and Generate Detection Algorithms | ||
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Summary: A Domain Anal sis to Specif DesignA Domain Analysis to Specify Design Defects and Generate... ;Context Moha © A Domain Analysis to Specify Design Defects and Generate Detection Algorithms 2 #12;Context... Moha © A Domain Analysis to Specify Design Defects and Generate Detection Algorithms 3 #12;What Kind |
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Source: Moha, Naouel - Departement de informatique, Université du Québec à Montréal |
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Collection: Computer Technologies and Information Sciences |
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| 77 | Experiences Using Defect Checklists in Software Engineering Education Kendra Cooper1 | ||
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Summary: total number of defects found in undergraduate teams. The assumption is that the increased complexity... Experiences Using Defect Checklists in Software Engineering Education Kendra Cooper1 , Sheila... and social topics. Within software engineering, software quality assurance (SQA) is a complex area to teach |
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Source: Dascalu, Sergiu - Department of Computer Science and Engineering, University of Nevada, Reno |
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Collection: Computer Technologies and Information Sciences |
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| 78 | Understanding the Sources of Variations in Software Inspections | ||
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Summary: and removing defects from software artifacts Three-step procedure Preparation Collection - Repair Fagan... of multi- inspection Structural changes Effectiveness of defect detection Effectiveness of defect detection... of multi- inspection Structural changes Effectiveness of defect detection Effectiveness ... |
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Source: Bae, Doo-Hwan - Department of Computer Science, Korea Advanced Institute of Science and Technology |
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Collection: Computer Technologies and Information Sciences |
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| 79 | PHYSICAL REVIEW B 83, 235208 (2011) First-principles study of defect properties of zinc blende MgTe | ||
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Summary: energy levels of intrinsic defects and extrinsic impurities and some defect complexes in zinc blende Mg... levels of intrinsic defects and extrinsic impurities. Some defect complexes were also studied. Our... cases. To see if the defect ... |
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Source: Gong, Xingao - Department of Physics, Fudan University |
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Collection: Materials Science ; Physics |
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| 80 | Detection and Visualization of Anomalous Structures in Molecular Dynamics Simulation Data | ||
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Summary: The Ohio State University (a) (b) (c) Figure 1: Si System with an interstitial defect (dataset I1) (a... ) Lattice with bulk and defect (b) Salient Iso-surface with ability to distinguish between bulk and defect... (c) An arbitrary slice of electron density data showing the shape of defect ABSTRACT In this ... |
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Source: Wilkins, John - Department of Physics, Ohio State University |
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Collection: Materials Science ; Physics |
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| 81 | Economics of Software Verification Gerard J. Holzmann | ||
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Summary: for buggyness one often uses the elusive standard of `residual defect density.' The residual defect density... is meant to measure the number of defects that remain in a software artifact after delivery to the end... a residual defect density of less than one defect per one thousand ... |
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Source: Holzmann, Gerard J. - Laboratory for Reliable Software,Jet Propulsion Laboratory |
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Collection: Computer Technologies and Information Sciences |
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| 82 | Hole-defect chaos in the one-dimensional complex Ginzburg-Landau equation Martin Howard1 | ||
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Summary: Hole-defect chaos in the one-dimensional complex Ginzburg-Landau equation Martin Howard1 and Martin... study the spatiotemporally chaotic dynamics of holes and defects in the one-dimensional 1D complex... chaos large c1 , c3). Isolated defects occur when A goes through zero, where the ... |
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Source: Howard, Martin - Department of Systems Biology, John Innes Centre; van Hecke, M. - Leiden Institute of Physics, Universiteit Leiden |
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Collection: Mathematics ; Physics |
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| 83 | Self--interstitial aggregation in diamond J. P. Goss, B. J. Coomer, and R. Jones | ||
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Summary: by the aggregation of nitrogen: single substitutional nitrogen defects combine into dimers (Acenters), which... for complexes of three self--interstitials. A. The O3 defect The O3, S=1 center, has C 2 symmetry appears... defects, I #001# 1 , I NN 2 and I 3 and compare with the ... |
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Source: Jones, Robert - School of Physics, University of Exeter |
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Collection: Materials Science |
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| 84 | Selfinterstitial aggregation in diamond J. P. Goss, B. J. Coomer, and R. Jones | ||
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Summary: by the aggregation of nitrogen: single substitutional nitrogen defects combine into dimers (A-centers), which... centers are eliminated in the construction of this I2NN 3 complex, leading to a defect containing a single... defects, I 001 1 , INN 2 and I3 and compare with the experimental ... |
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Source: Jones, Robert - School of Physics, University of Exeter |
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Collection: Materials Science |
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| 85 | INSTITUTE OF PHYSICS PUBLISHING JOURNAL OF PHYSICS D: APPLIED PHYSICS J. Phys. D: Appl. Phys. 36 (2003) 24272431 PII: S0022-3727(03)64090-8 | ||
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Summary: by the calibration defects. In this paper, we address a more useful and complex inverse method, aimed at eliminating... cylindrical defect was adapted to more complex and realistic defect geometries, specifically, to interacting... the length of a surface-breaking ... |
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Source: Clapham, Lynann - Department of Physics, Queen's University (Kingston) |
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Collection: Materials Science |
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| 86 | Experimental Rock Deformation E.Rybacki | ||
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Summary: in rocks are not infinitely sharp but reveal distributed damage! 39 #12;Complex Defects: Sliding/Wing CrackComplex... Ic c K - = - + - + 40 #12;Complex Defects: Hertzian Contacts Crushing and PoreComplex... Defects: Sliding/Wing Crack ... |
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Source: Cesare, Bernardo - Dipartimento di Geoscienze, Università degli Studi di Padova |
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Collection: Geosciences |
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| 87 | Evaluation of Defects in the Seal Region of Food Packages Using the Ultrasonic Contrast | ||
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Summary: equipment and complexity than the laboratory studies have required. After the mini- mum defect size... Evaluation of Defects in the Seal Region of Food Packages Using the Ultrasonic Contrast Descriptor... and evaluate major defects (channels and product inclusions, which compromise the seal integrity and must |
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Source: Illinois at Urbana-Champaign, University of - Bioacoustics Research Laboratory |
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Collection: Engineering ; Biology and Medicine |
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| 88 | J. PHYS. IV FRANCE 7 (1997) Colloque C5, Supplkment au Journal de Physique I11 de novembre 1997 | ||
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Summary: Defect Structuresin CuZr Martensite, Studiesby CTEM and HRTEM J.W. Seo and D. Schryvers University of... Antwerp, RUCA, EMAT, Groenenborgerlaan 171, 2020 Antwerp, Belgium Abstract. Defect structures in CuZr martensite... of planar defects are observed. It is concluded that both defect types can be inherited ... |
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Source: Ecole Polytechnique, Centre de mathématiques |
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Collection: Mathematics |
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| 89 | ARC Centre of Excellence for AntimatterMatter Studies | ||
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Summary: fragmentation surfaces defects voids attachment bio-molecules modelling radiopharmaceuticals fundamental... scattering ionisation excitation binding applied fragmentation surfaces defects voids attachment bio... -molecules modelling radiop sation excitation binding applied fragmentation surfaces defects voids attachment bio |
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Source: Centre for Antimatter-Matter Studies (CAMS) |
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Collection: Physics |
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| 90 | Automatic Generation of Detection Algorithms for Design Defects Naouel Moha and Yann-Gael Gueheneuc and Pierre Leduc | ||
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Summary: defect is a complex class that offers a high number of services to address many different needs. Utility... Automatic Generation of Detection Algorithms for Design Defects Naouel Moha and Yann-Ga¨el Gu... published design defects for- malising "bad" solutions to recurring design problems (e.g., anti |
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Source: Moha, Naouel - Departement de informatique, Université du Québec à Montréal |
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Collection: Computer Technologies and Information Sciences |
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| 91 | Automating defects simulation and fault modeling Stefano Di Carlo, Paolo Prinetto, Alberto Scionti | ||
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Summary: Automating defects simulation and fault modeling for SRAMs Stefano Di Carlo, Paolo Prinetto... pro- cess density for Very Deep Sub Micron technologies constantly leads to new classes of defects... in memory devices. Exploring the effect of fabrication defects in future technologies, and identifying new |
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Source: Langendoen, Koen - Elektrotechniek, Wiskunde en Informatica, Technische Universiteit Delft |
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Collection: Engineering ; Computer Technologies and Information Sciences |
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| 92 | Optimal Resource Allocation for the Quality Control Process Pankaj Jalote | ||
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Summary: for different types of defects, but then the formulation and solution will get that much more complex. #12... defects. The final quality of the delivered software depends on the effort spent on all the QC stages... . As the cost of removing defects increases with latency [3], in an at- tempt to detect and ... |
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Source: Jalote, Pankaj - Department of Computer Science and Engineering, Indian Institute of Technology Kanpur |
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Collection: Computer Technologies and Information Sciences |
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| 93 | Analysis of Resistive-Bridging Defects in SRAM Core-Cells: a Comparative Study from 90nm | ||
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Summary: core-cells makes them extremely vulnerable to physical defects. Due to the complex nature of the SRAM... 132 Analysis of Resistive-Bridging Defects in SRAM Core-Cells: a Comparative Study from 90nm down... a comparative study on the effects of resistive-bridging defects in the SRAM core-cells, considering ... |
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|
Source: Ecole Polytechnique, Centre de mathématiques |
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Collection: Mathematics |
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| 94 | JOURNAL DE PHYSIQUE Co//oque C9, supp/6nren/ au no 11-12, Ton?c>34, Nouenrbre-Dkcen~bl-e1973, page 0 -7 9 INVESTIGATION OF THE THERMAL DEFECT-ORDER | ||
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Summary: by blocking electrodes, as defects and impurity-defect complexes accuni~~latein rlieir vicinity. A theoretical... analysis of the defect flux in d crystal subjected to an ITC-experiment sho\\s, thilt besidcs complex... -reorientation peaks : I ) individual peaks should occur for every ... |
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Source: Ecole Polytechnique, Centre de mathématiques |
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Collection: Mathematics |
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| 95 | Evaluation of Critical Components of Non-Ceramic Insulators In-Service | ||
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Summary: Evaluation of Critical Components of Non-Ceramic Insulators In-Service: Role of Defective... Center Evaluation of Critical Components of Non-Ceramic Insulators (NCI) In-Service: Role of Defective... Components of Non-Ceramic Insulators (NCI) In-Service: Role of Defective Interfaces." #12;Executive Summary |
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Source: Arizona State University, Power Systems Engineering Research Center |
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Collection: Power Transmission, Distribution and Plants |
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| 96 | Abstract. --Lattice distortions due to defects in crystals can be studied most directly by elastic X-ray or neutron scattering experiments. The size of the defects can be determined from the shift of | ||
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Summary: to study impurity defect complexes by EXAFS. W. KANZIG.-IS your theory too modified if you start out whith... Abstract. -- Lattice distortions due to defects in crystals can be studied most directly by elastic... X-ray or neutron scattering experiments. The size of the defects can be determined from the shift |
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Source: Ecole Polytechnique, Centre de mathématiques |
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Collection: Mathematics |
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| 97 | Defect Tolerance for Yield Enhancement of FPGA Interconnect Using Fine-grain and Coarse-grain Redundancy | ||
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Summary: Defect Tolerance for Yield Enhancement of FPGA Interconnect Using Fine-grain and Coarse... this far ahead is manufacturing defects appearing in immature technologies. The aggressive scaling... unlikely. Utilization of defect-tolerant techniques is one method of alleviating this growing problem |
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Source: Lemieux, Guy - Department of Electrical and Computer Engineering, University of British Columbia |
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Collection: Engineering |
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| 98 | 1024 IEEE TRANSACTIONS ON MAGNETICS, VOL. 46, NO. 4, APRIL 2010 Sizing of 3-D Arbitrary Defects Using Magnetic Flux | ||
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Summary: simulate three defects with complex geometries, shown in Fig. 5(a)(c). The thickness of the slab is 5.6 mm... 1024 IEEE TRANSACTIONS ON MAGNETICS, VOL. 46, NO. 4, APRIL 2010 Sizing of 3-D Arbitrary Defects... of an arbitrary three-dimensional (3-D) defect from magnetic flux leakage (MFL) measurements. We ... |
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Source: Reilly, James P. - Department of Electrical and Computer Engineering, McMaster University |
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Collection: Engineering |
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| 99 | Defectfreezing and Defectunbinding in the Vector Complex GinzburgLandau Equation. | ||
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Summary: Defectfreezing and Defectunbinding in the Vector Complex GinzburgLandau Equation. Miguel... singularities or defects. In our case there are two complex fields, A+ and A \Gamma , which can vanish... describe the dynamical behavior found in numerical solutions of the Vector ... |
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Source: Colet, Pere - Mediterranean Institute for Advanced Studies (IMEDEA) |
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Collection: Physics |
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| 100 | 2 IEEE TRANSACTIONS ON COMPONENTS, PACKAGING, AND MANUFACTURING TECHNOLOGY--PART B, VOL. 20, NO. 1, FEBRUARY 1997 A Novel Test Technique for MCM Substrates | ||
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Summary: -- This paper describes a novel and low-cost test technique that is capable of detecting process related defects... , have low throughput or provide poor defect coverage. The proposed test method applies a stimulus... to guarantee a defect free substrate. This is a screening process to ensure that the interconnections do |
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Source: Swaminathan, Madhavan - School of Electrical and Computer Engineering, Georgia Institute of Technology |
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Collection: Engineering |
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