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Sample search results for: a-center defect complex

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1 A Linear Complexity Incremental Defect Mapping Method for Reconfigurable Computing Platforms in the Presence of Prevalent Defects
 

Summary:  A Linear Complexity Incremental Defect Mapping Method for Reconfigurable Computing Platforms... detection and diagnosis methods target sin- gle defect occurrence. This paper presents a linear complexity... for reconfigurable platforms. This paper proposes a linear complexity incremental ...

  

Source: Liu, Bao - Department of Electrical Engineering, University of Texas at San Antonio

 

Collection: Computer Technologies and Information Sciences

 
2 Paper 31.1 INTERNATIONAL TEST CONFERENCE 1 1-4244-4203-0/08/$20.00 2008 IEEE
 

Summary:  of increasing complexity: (i) strand-level defects, (ii) tile-level defects, (iii) grid-level defects, and (iv... of the oligonucleotides used in the nanostructure. Defects at this level can propagate to higher levels of complexity... -structure ...

  

Source: Chakrabarty, Krishnendu - Department of Electrical and Computer Engineering, Duke University

 

Collection: Computer Technologies and Information Sciences

 
3 Submitted to the IEEE International Test Conference, 2008 1 Fabrication Defects and Fault Models for DNA Self-Assembled
 

Summary:  of the oligonucleotides used in the nanostructure. Defects at this level can propagate to higher levels of complexity... -structure defects, which cause the strand to form more complex structures due to interactions in solution. Sequence... as to how these defects might map to faults. At ...

  

Source: Dwyer, Chris - Department of Electrical and Computer Engineering, Duke University

 

Collection: Engineering ; Materials Science

 
4 Defect and Fault Seeding In Dependability Benchmarking Barry Boehm, Daniel Port
 

Summary:  using current techniques. Also, the version changes may be complex combinations of defect fixes and F-25... Defect and Fault Seeding In Dependability Benchmarking Barry Boehm, Daniel Port University... of Southern California {boehm, dport}@sunset.usc.edu Abstract Defect and fault seeding is often considered

  

Source: Koopman, Philip - Department of Electrical and Computer Engineering, Carnegie Mellon University

 

Collection: Computer Technologies and Information Sciences

 
5 Identification of in-field defect development in digital image sensors Jozsef Dudasa
 

Summary:  complex defect types, suggesting that this method could be used to conduct a wide-ranging survey of defect... to detect small variations of complex defect behaviors, which rapidly increases the computational costs... by assigning defects to multiple neighboring ...

  

Source: Chapman, Glenn H. - School of Engineering Science, Simon Fraser University

 

Collection: Engineering

 
6 Quantitative Analysis of In-Field Defects in Image Sensor Arrays Jenny Leung, Jozsef Dudas, Glenn H. Chapman Israel Koren, Zahava Koren
 

Summary:  = otherwise Rr Rrf Upper UpperUniform 0 0 1 )( . (7) Now consider a more complex defect radial distribution... Quantitative Analysis of In-Field Defects in Image Sensor Arrays Jenny Leung, Jozsef Dudas, Glenn H... of pixel density and sensor array size increases the likelihood of developing in-field pixel ...

  

Source: Chapman, Glenn H. - School of Engineering Science, Simon Fraser University

 

Collection: Engineering

 
7 Modeling of the influence of the defect position on the reflected intensity in EUV mask
 

Summary:  , to address complex topographies we have simulated in this article (defective multi-layer structure... Modeling of the influence of the defect position on the reflected intensity in EUV mask Maxime... of a defect modifying the multi-layer stack [1][2]. This paper presents the results of simulations, performed

  

Source: Ecole Polytechnique, Centre de mathématiques

 

Collection: Mathematics

 
8 Defect Tolerance After the Roadmap Mahim Mishra
 

Summary:  process will be simplified because complex computational structures or highly accurate, defect... Defect Tolerance After the Roadmap Mahim Mishra£ and Seth C. Goldstein Computer Science Department... nm feature sizes. However, these technologies are likely to have significantly higher defect

  

Source: Goldstein, Seth Copen - School of Computer Science, Carnegie Mellon University

 

Collection: Computer Technologies and Information Sciences

 
9 A topological point defect regulates the evolution of extended defects in irradiated silicon
 

Summary:  of atomic-scale annihilation of bond defects drives the submicron-scale complex structural evolution... A topological point defect regulates the evolution of extended defects in irradiated silicon... and annihilation of atomic-scale bond defects dominate nucleation and evolution of ...

  

Source: Wilkins, John - Department of Physics, Ohio State University

 

Collection: Materials Science ; Physics

 
10 PLEASE SCROLL DOWN FOR ARTICLE This article was downloaded by: [2007-2008-2009 HanKuk University of Foreign Studies]
 

Summary:  defects to cope with the complexity and vagueness of the defects. However, it is difficult to obtain... ://www.informaworld.com/smpp/title~content=t713696255 An effective and efficient defect inspection system for TFT-LCD polarised films using adaptive... defect inspection system for ...

  

Source: Chung, Chin-Wan - Department of Computer Science, Korea Advanced Institute of Science and Technology

 

Collection: Computer Technologies and Information Sciences

 
11 Defect solitons in photonic lattices Jianke Yang1,2
 

Summary:  Defect solitons in photonic lattices Jianke Yang1,2 and Zhigang Chen3,4 1 Department of Mathematics... December 2005; published 14 February 2006 Nonlinear defect modes defect solitons and their stability in one... -dimensional photonic lattices with focus- ing saturable nonlinearity are investigated. It is shown that ...

  

Source: Chen, Zhigang - Department of Physics and Astronomy, San Francisco State University; Yang, Jianke - Department of Mathematics and Statistics, University of Vermont

 

Collection: Mathematics ; Physics

 
12 How to buy better testing Using competition to get the most security and robustness for your dollar
 

Summary:  as one of the outputs of the process. This is accomplished via a market for defect reports, in which... testers maximize profits by minimiz- ing the cost of finding defects. The power of competition... is harnessed to ensure that testers are paid a fair price for the defects they discover, thereby aligning

  

Source: Schechter, Stuart Edward - Microsoft Research

 

Collection: Computer Technologies and Information Sciences

 
13 phys. stat. sol. (b) 211, 91 (1999) Subject classification: 78.55.Et; 62.50.+p; 71.20.Nr; S8.12
 

Summary:  to similar transitions in- volving [donor±VZn] deep acceptor complexes, so called A-centers. A similar... residual donors, forming A-center complexes with time. The comparisons in Figs. 3 and 4 show the effects... with pressure for both the VZn and A-center defects. ...

  

Source: Weinstein, Benard.A. - Department of Physics, State University of New York at Buffalo

 

Collection: Materials Science

 
14 sapm329 SAM.cls May 18, 2005 17:45 Properties of Defect Modes in One-Dimensional Optically
 

Summary:  sapm329 SAM.cls May 18, 2005 17:45 Properties of Defect Modes in One-Dimensional Optically Induced... Photonic Lattices By Francesco Fedele, Jianke Yang, and Zhigang Chen In this article, localized defect... , the origin of these defect modes is investigated analytically in the weak-defect limit by ...

  

Source: Chen, Zhigang - Department of Physics and Astronomy, San Francisco State University

 

Collection: Physics

 
15 Properties of Defect Modes in One-Dimensional Optically Induced Photonic Lattices
 

Summary:  Properties of Defect Modes in One-Dimensional Optically Induced Photonic Lattices By Francesco... Fedele, Jianke Yang, and Zhigang Chen In this article, localized defect modes in one... -dimensional optically induced photonic lattices are studied comprehensively. First, the origin of these defect modes

  

Source: Yang, Jianke - Department of Mathematics and Statistics, University of Vermont

 

Collection: Mathematics

 
16 On-Line Mapping of In-Field Defects in Image Sensor Arrays Jozsef Dudas, Cory Jung, Linda Wu,
 

Summary:  in real-world digital cameras. We consider a more complex defect model with a continuous range... a tradeoff between diagnostic accuracy and algorithm complexity. For example, a group of defect types may... the Level 3 defect model with 0.10 and 0.01 bin sizes. As the model ...

  

Source: Chapman, Glenn H. - School of Engineering Science, Simon Fraser University

 

Collection: Engineering

 
17 On Effective Use of Reliability Models and Defect Data in Software Development
 

Summary:  On Effective Use of Reliability Models and Defect Data in Software Development Rattikorn Hewett... and open source development increasingly use feedback from customer testing. This makes the customer defect... and defect data to help managers make software release decisions by applying a strategy for selecting

  

Source: Stringfellow, Catherine V. - Department of Computer Science, Midwestern State University

 

Collection: Computer Technologies and Information Sciences

 
18 Modeling the rework cycle: capturing multiple defects per task Hazhir Rahmandad: hazhir@vt.edu
 

Summary:  1 Modeling the rework cycle: capturing multiple defects per task Hazhir Rahmandad: hazhir... defective or not. Yet in many projects multiple defects can occur in one task. In this study we introduce... a new rework cycle formulation that accounts for multiple defects per task and flexibly captures

  

Source: Rahmandad, Hazhir - Department of Industrial and Systems Engineering, Virginia Tech

 

Collection: Engineering

 
19 Title Slide "goto considered not particularly harmful: defect analysis
 

Summary:  . XLOC Cyclomatic complexity v. goto #12;Defect correlations Cyclo. complexity v. defects Ln(xloc). v... Title Slide "goto considered not particularly harmful: defect analysis in a major numerical library... . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ...

  

Source: Hatton, Les - School of Computing and Information Systems, Kingston University

 

Collection: Computer Technologies and Information Sciences

 
20 Detection and Correction of Design Defects in Object-Oriented Architectures
 

Summary:  Detection and Correction of Design Defects in Object-Oriented Architectures Naouel Moha GEODES... and Operations Research University of Montreal, Quebec, Canada mohanaou@iro.umontreal.ca Abstract. Design defects... their evolution and their maintenance. A good architecture without defects reduces significantly maintenance costs

  

Source: Moha, Naouel - Departement de informatique, Université du Québec à Montréal

 

Collection: Computer Technologies and Information Sciences


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21 Comparison of fast 3D simulation and actinic inspection for EUV masks with buried defects
 

Summary:  methods, can accurately predict the complex behavior of a buried EUV defect. * chris... accurately predict the complex behavior of a buried EUV defect. ACKNOWLEDGEMENTS: This research was funded... Comparison of fast 3D simulation and actinic inspection for EUV masks with buried defects ...

  

Source: Lawrence Berkeley National Laboratory, Center for X-Ray Optics, EUV Interferometry

 

Collection: Physics

 
22 Published in IET Computers & Digital Techniques Received on 19th October 2008
 

Summary:  of increasing complexity: (i) strand-level defects, (ii) tile-level defects, (iii) grid-level defects and (iv... of the oligonucleotides used in the nanostructure. Defects at this level can propagate to higher levels of complexity... - structure ...

  

Source: Chakrabarty, Krishnendu - Department of Electrical and Computer Engineering, Duke University

 

Collection: Computer Technologies and Information Sciences

 
23 Actinic imaging of native and programmed defects on a full-field mask , K. A. Goldberga
 

Summary:  ;profile) and to discriminate between amplitude, phase, and complex defects. Experimentally, we observe... of both, and can thus be characterized as complex defects, for their effect on the reflected field... Vol. 7636 76361A-5 #12;3.4 EUV aerial images and simulation of a complex ...

  

Source: Lawrence Berkeley National Laboratory, Center for X-Ray Optics, EUV Interferometry

 

Collection: Physics

 
24 Phoenix: Detecting and Recovering from Permanent Processor Design Bugs
 

Summary:  Defect Coverage Results All DefectsConcurrent Complex 69% 31% Pre Post 63% 37% Detect Recover Training... ://iacoma.cs.uiuc.edu #12;http://iacoma.cs.uiuc.edu 2 Can a Processor have a Design Defect ? No Way !!! Yes, it is a major... verification times Massive computational resources Some ...

  

Source: Torrellas, Josep - Department of Computer Science, University of Illinois at Urbana-Champaign

 

Collection: Computer Technologies and Information Sciences

 
25 Dynamic Classification of Defect Structures in Molecular Dynamics Simulation Data
 

Summary:  Dynamic Classification of Defect Structures in Molecular Dynamics Simulation Data Sameep Mehta... to clas- sify anomalous structures (defects) in data generated from Molecular Dynamics (MD) simulations... of various defects as they have a profound impact on the electrical and mechanical proper- ties of Silicon

  

Source: Wilkins, John - Department of Physics, Ohio State University

 

Collection: Materials Science ; Physics

 
26 game design lecture # V.1
 

Summary:  in complex results (example: Prisoner's Dilemma, discussed below) feedback loops: · positive feedback... the payoffs for 2-player games · an example is shown below, where each player can either cooperate or defect... : column player defect cooperate row player defect 1, 1 1, 4 cooperate 4, 1 4, 4 · each ...

  

Source: Sklar, Elizabeth - Department of Computer and Information Science, Brooklyn College, City University of New York

 

Collection: Computer Technologies and Information Sciences

 
27 Identifying Domain-Specific Defect Classes Using Inspections and Change History
 

Summary:  to larger code which may contain more complex defects. Pruning versions: When examining the code... Identifying Domain-Specific Defect Classes Using Inspections and Change History Taiga Nakamura... for analyzing defects in source code when change history is available. Our bottom-up approach can be applied

  

Source: Basili, Victor R. - Fraunhofer Center & Department of Computer Science, University of Maryland at College Park

 

Collection: Computer Technologies and Information Sciences

 
28 Scalable Defect Tolerance for Molecular Electronics Mahim Mishra and Seth C. Goldstein
 

Summary:  Scalable Defect Tolerance for Molecular Electronics Mahim Mishra and Seth C. Goldstein mahim... . However, CAEN-based circuits are expected to have huge defect densities. To solve this problem CAEN can... be used to build reconfigurable fabrics which, assuming the defects can be found, are inherently defect

  

Source: Goldstein, Seth Copen - School of Computer Science, Carnegie Mellon University

 

Collection: Computer Technologies and Information Sciences

 
29 Defect prevention in software processes
 

Summary:  Defect prevention in software processes: An action-based approach Ching-Pao Chang and Chih-Ping Chu... /202007-09-06 Contents n Introduction n Background n Action-based defect prevention n Case study n Conclusion n... to identify causes of defects in software process for defect prevention n Due to large ...

  

Source: Bae, Doo-Hwan - Department of Computer Science, Korea Advanced Institute of Science and Technology

 

Collection: Computer Technologies and Information Sciences

 
30 Preprint, submitted for publication in J. Appl. Phys. c The American Institute of Physics
 

Summary:  ;use x-ray scattering from 311 defects in Si K. Nordlund Accelerator Laboratory, P.O. Box 43, FIN-00014... University of Helsinki, Finland (September 24, 2001) 311 defects are extended, rod-like defects which play... techniques provide a non-destructive means to detect defects in solids. However, to date ...

  

Source: Nordlund, Kai - Accelerator Laboratory, University of Helsinki

 

Collection: Physics

 
31 Dynamics of localized structures in vectorial waves Emilio HernandezGarca, Miguel Hoyuelos + , Pere Colet and Maxi San Miguel
 

Summary:  of topological defects in a twodimensional complex vector field are considered. These objects naturally arise... in the study of polarized transverse light waves. Dynamics is modeled by a Vector Complex Ginzburg... processes, and selforganization of defects in lattice structures, are described. We find ...

  

Source: Colet, Pere - Mediterranean Institute for Advanced Studies (IMEDEA)

 

Collection: Physics

 
32 ON THE EXISTENCE OF SPECIAL TYPES OF p-BLOCKS IN p-SOLVABLE GROUPS
 

Summary:  containing two complex characters each of degree 8, and a block B of defect 0 containing an irreducible... + Z(FG) be the sum of the elements in K. We say that K is a defect class for B if (K+ ) = 0 and K... of conjugacy class sums. If K is a defect class for B and D is a Sylow p-subgroup of the centralizer ...

  

Source: Gow, Rod - Department of Mathematics, University College Dublin

 

Collection: Mathematics

 
33 Title Slide "High-Integrity Software, Computation and
 

Summary:  Hatton, 2011-. Copying freely permitted with acknowledgement ... defect Relationship to static complexity... High-Integrity Software and ... The scientific method Defect Programming languages Process FAQs... ) computation. #12;Copyright Les Hatton, 2011-. Copying freely permitted with acknowledgement ... ...

  

Source: Hatton, Les - School of Computing and Information Systems, Kingston University

 

Collection: Computer Technologies and Information Sciences

 
34 The Hypergeometric distribution
 

Summary:  to deal with situations arising when we sample from batches with a known number of defective items. You... will find that, in essence, the number of defective items in a batch is not a random variable... a batch of items containing a variable number of defectives. We are essentially assuming that we know

  

Source: Vickers, James - School of Mathematics, University of Southampton

 

Collection: Mathematics

 
35 Chirality-biased point defects dynamics on a disclination line in a nematic liquid crystal
 

Summary:  more complex than described in the simulations. For example the mobility of defects (defined... Chirality-biased point defects dynamics on a disclination line in a nematic liquid crystal Andrzej... 3247 Abstract Chiral additives in the nematic liquid crystal can alter the dynamics of point defects

  

Source: Ecole Polytechnique, Centre de mathématiques

 

Collection: Mathematics

 
36 Rigorous simulation of line-defects in EUV masks Patrick Schiavone, Renaud Payerne
 

Summary:  by Fourier Expansion can be extended to handle the complex geometry of EUV defective masks. In the first part... Rigorous simulation of line-defects in EUV masks Patrick Schiavone, Renaud Payerne Laboratoire des... defects in EUV masks. Using the Modal Method by Fourier Expansion, the geometry of the ...

  

Source: Ecole Polytechnique, Centre de mathématiques

 

Collection: Mathematics

 
37 Robust detection of defects in imaging arrays Jozsef Dudasa
 

Summary:  the convergence rate was slower when applied to more complex defect models. This paper outlines a second... diagnosis. Our method rapidly converges on correct results, even when applied to more complex defect models... will include are partitioned into two groups based on their ...

  

Source: Chapman, Glenn H. - School of Engineering Science, Simon Fraser University

 

Collection: Engineering

 
38 Appendix 3-3-The complete model formulation for detailed multiple release software product simulation model
 

Summary:  "Dynamics of Platform-based Product Development". The model, however, was too complex to be discussed... - 1. The model includes design, development, testing, defects in the field, bug fixing, underlying... rate and design quality; architecture complexity on productivity; bug fixing on scope; re

  

Source: Rahmandad, Hazhir - Department of Industrial and Systems Engineering, Virginia Tech

 

Collection: Engineering

 
39 Detection and Correction of Design Defects in Object-Oriented Designs
 

Summary:  complexity of the design of a program [13]. #12;The solution advocated for correcting design defects... Detection and Correction of Design Defects in Object-Oriented Designs Naouel Moha Ptidej Team... ­ GEODES Group, DIRO University of Montreal, QC, Canada mohanaou@iro.umontreal.ca Abstract Design defects

  

Source: Moha, Naouel - Departement de informatique, Université du Québec à Montréal

 

Collection: Computer Technologies and Information Sciences

 
40 M. Ali Babar, M. Vierimaa, and M. Oivo (Eds.): PROFES 2010, LNCS 6156, pp. 1731, 2010. Springer-Verlag Berlin Heidelberg 2010
 

Summary:  -Verlag Berlin Heidelberg 2010 Investigating the Temporal Behavior of Defect Detection in Software Inspection... , is detecting defects in software artifacts to increase prod- uct quality and decrease rework effort and cost... . Inspection aims at identifying defects early and traditional testing focuses on test case generation

  

Source: Technische Universität Wien, Institute for Software Technology and Interactive Systems, Interactive Media Systems Group

 

Collection: Computer Technologies and Information Sciences


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41 Actinic inspection of extreme ultraviolet programed multilayer defects and cross-comparison measurements
 

Summary:  The interaction of reflected EUV light with defects on or below a mask surface is a complex process that is highly... Actinic inspection of extreme ultraviolet programed multilayer defects and cross... The production of defect-free mask blanks remains a key challenge for extreme ultraviolet EUV lithography

  

Source: Lawrence Berkeley National Laboratory, Center for X-Ray Optics, EUV Interferometry

 

Collection: Physics

 
42 Oil & Gas Science and Technology Rev. IFP, Vol. 56 (2001), No. 1, pp. 23-31 Copyright 2001, ditions Technip
 

Summary:  of defects is smaller than the capillary length, the contact line shape is more complex and we analyze its... longueur capillaire, la forme de la ligne de contact est plus complexe et nous analysons sa morphologie en... defects are present, or when the average distance between defects is ...

  

Source: Cubaud, Thomas - Department of Mechanical Engineering, Stony Brook University

 

Collection: Engineering

 
43 1 Copyright 2003 by ASME Proceedings of DETC 2003
 

Summary:  with the occurrences of defects. This paper develops a design-based complexity factor derived from the "Design... the metrics. The quantitative correlation between the design-based complexity factor and defect rates... for Assembly, Design for Quality, Assembly Defect, Quality Control, ...

  

Source: Ishii, Kos - Department of Mechanical Engineering, Stanford University

 

Collection: Engineering

 
44 Using Bayesian Networks to Predict Software Defects and Reliability Norman Fenton
 

Summary:  the fewer the defects and the less complex the problem the fewer defects. Finally, how many defects you find... defects in testing and high complexity observed So far we have made no observation about operational usage... Using Bayesian Networks to Predict Software ...

  

Source: Fenton, Norman - Department of Computer Science, Queen Mary, University of London

 

Collection: Computer Technologies and Information Sciences

 
45 Defect evolution in ultrathin films of polystyrene-block-polymethylmethacrylate diblock
 

Summary:  Defect evolution in ultrathin films of polystyrene-block-polymethylmethacrylate diblock copolymers... August 1998; accepted 7 October 1998 We track individual defects in the microdomain patterns of cylinder... , clustering, and annihilation of defects. Such processes form the basis for predicting structural change

  

Source: Sibener, Steven - Department of Chemistry, University of Chicago

 

Collection: Chemistry

 
46 PHYSICAL REVIEW A 83, 033836 (2011) Nonlinear beam deflection in photonic lattices with negative defects
 

Summary:  in uniform lattices and in lattices with positive defects at moderate incident angles are much more complex... lattices and positive defects at small and moderate tilting angles exhibit much more complex evolution... defects Jiandong Wang,1 Zhuoyi Ye,2 Alexandra Miller,3 Yi Hu,2,3 Cibo ...

  

Source: Chen, Zhigang - Department of Physics and Astronomy, San Francisco State University; Yang, Jianke - Department of Mathematics and Statistics, University of Vermont

 

Collection: Mathematics ; Physics

 
47 Comment on ``Paired Gap States in a Semiconducting Carbon Nanotube: Deep and Shallow Levels''
 

Summary:  defects, such as Stone-Wales (SW) and vacancy-adatom (VA) complexes. Here we point out... that such an interpretation of the experi- ments is hardly consistent with the abundance and stability of such defects. We... and can explain all features reported in Ref. [1] in terms of a single type of defects. The ...

  

Source: Krasheninnikov, Arkady V. - Accelerator Laboratory, University of Helsinki

 

Collection: Materials Science

 
48 Architectures built using bottom-up self-assembly of nanoelectronic devices will need to tolerate defect rates that
 

Summary:  of the requirements for our scheme. Any system that uses more complex nodes would work equally well with our defect... , i.e, it cannot per- form any processing or communication. We do not examine more complex defect... broadcast with a node defect model that allows partially ...

  

Source: Sorin, Daniel J. - Departments of Electrical and Computer Engineering & Computer Science, Duke University

 

Collection: Computer Technologies and Information Sciences

 
49 Architectures built using bottom-up self-assembly of nanoelectronic devices will need to tolerate defect rates that
 

Summary:  of the requirements for our scheme. Any system that uses more complex nodes would work equally well with our defect... , i.e, it cannot per- form any processing or communication. We do not examine more complex defect... broadcast with a node defect model that allows partially ...

  

Source: Duke University, Department of Computer Science, Computer Architecture Group; Dwyer, Chris - Department of Electrical and Computer Engineering, Duke University

 

Collection: Computer Technologies and Information Sciences ; Engineering ; Materials Science

 
50 Defect Prediction using Combined Product and Project Metrics A Case Study from the Open Source "Apache" MyFaces Project Family
 

Summary:  Defect Prediction using Combined Product and Project Metrics A Case Study from the Open Source... source software (OSS) products, e.g., defect estimation and prediction approaches of individual releases... on the accuracy of defect pre- diction and software maintenance focus on product metrics as predictors

  

Source: Technische Universität Wien, Institute for Software Technology and Interactive Systems, Interactive Media Systems Group

 

Collection: Computer Technologies and Information Sciences

 
51 Comparing Bug Finding Tools with Reviews and Stefan Wagner1
 

Summary:  tools can find defects in software source code us- ing an automated static analysis. This automation may... understanding of how the defects found by bug finding tools relate to the defects found by other techniques... different defects than testing but a subset of defects found by ...

  

Source: Cengarle, María Victoria - Institut für Informatik, Technische Universität München

 

Collection: Computer Technologies and Information Sciences

 
52 Comparing Bug Finding Tools with Reviews and Stefan Wagner1
 

Summary:  Complex type conversion 5 7 "Variable initialised but not used" in contrast to one defect revealed... tools can find defects in software source code us- ing an automated static analysis. This automation may... understanding of how the defects found by bug finding tools relate to the ...

  

Source: Cengarle, María Victoria - Institut für Informatik, Technische Universität München

 

Collection: Computer Technologies and Information Sciences

 
53 Defect Tolerance at the End of the Roadmap Mahim Mishra and Seth C. Goldstein
 

Summary:  Defect Tolerance at the End of the Roadmap Mahim Mishra and Seth C. Goldstein Computer Science... ,seth}@cs.cmu.edu Abstract Defect tolerance will become more important as feature sizes shrink closer to single digit... ). In this paper, we propose a defect toler- ance methodology centered around reconfigurable devices, a scalable

  

Source: Goldstein, Seth Copen - School of Computer Science, Carnegie Mellon University

 

Collection: Computer Technologies and Information Sciences

 
54 834 OPTICS LETTERS / Vol. 28, No. 10 / May 15, 2003 Interactions of discrete solitons with structural defects
 

Summary:  with structural defects R. Morandotti,* H. S. Eisenberg, D. Mandelik, and Y. Silberberg Department of Physics... of Complex Systems, Weizmann Institute of Science, Rehovot 76100, Israel D. Modotto, M. Sorel, and C. R... with defect states fabricated in arrays of coupled wave- guides. We achieved attractive and repulsive ...

  

Source: Silberberg, Yaron - Department of Physics of Complex Systems, Weizmann Institute of Science

 

Collection: Physics

 
55 Non-parametric texture defect detection using Weibull Fabian Timma,b and Erhardt Bartha
 

Summary:  Non-parametric texture defect detection using Weibull features Fabian Timma,b and Erhardt Bartha a... - parametric approach for defect detection in textures that only employs two features. We compute the two... becomes independent of the particular texture type and also independent of a certain defect type

  

Source: 

 

Collection: Computer Technologies and Information Sciences

 
56 Phase defect detection with spatial heterodyne interferometry Philip R. Bingham*a
 

Summary:  Phase defect detection with spatial heterodyne interferometry Philip R. Bingham*a , Kenneth W... by a difference in material thickness. Surface topology measurements can be used to identify phase defects... -speed non-contact phase defect detection. SHI is an imaging technique developed at Oak Ridge National

  

Source: Oak Ridge National Laboratory, Engineering Science and Technology Division, Image Science and Machine Vision Group

 

Collection: Engineering

 
57 Defect-Aware Synthesis of Droplet-Based Microfluidic Biochips* , Krishnendu Chakrabarty
 

Summary:  " droplet-based microfluidic platforms, system integration, design complexity, and the need for defect... -oblivious and defect-aware methods for the PCR example. Due to the relative lower complexity of the PCR assay... Defect-Aware Synthesis of Droplet-Based Microfluidic Biochips* Tao Xu , ...

  

Source: Chakrabarty, Krishnendu - Department of Electrical and Computer Engineering, Duke University

 

Collection: Computer Technologies and Information Sciences

 
58 VOLUME 77, NUMBER 13 P H Y S I C A L R E V I E W L E T T E R S 23 SEPTEMBER 1996 Phase Defects as a Measure of Disorder in Traveling-Wave Convection
 

Summary:  in the pattern. The first step in identifying defects in a TW convection pattern is to calculate the complex... VOLUME 77, NUMBER 13 P H Y S I C A L R E V I E W L E T T E R S 23 SEPTEMBER 1996 Phase Defects... is studied in traveling-wave convection in an ethanol-water mixture. A technique for calculating the ...

  

Source: La Porta, Arthur - Institute for Physical Science and Technology & Department of Physics, University of Maryland at College Park

 

Collection: Physics

 
59 E~~rophys.Lett., 12 (2), pp. 135-141 (1990) Defects in Degenerate Hybrid Aligned Nematic
 

Summary:  . 139 The complex character of the defect structure can explain the above-mentioned textural paradox... E~~rophys.Lett., 12 (2), pp. 135-141 (1990) Defects in Degenerate Hybrid Aligned Nematic Liquid... 6 March 1990) PACS. 61.30 - Liquid crystals. Abstract. - High-strength and zero-strength defects

  

Source: Selinger, Robin L. Blumberg - Liquid Crystal Institute and Chemical Physics Program, Kent State University

 

Collection: Materials Science

 
60 On the Use of Bloom Filters for Defect Maps in Nanocomputing
 

Summary:  On the Use of Bloom Filters for Defect Maps in Nanocomputing Gang Wang Wenrui Gong Ryan Kastner... in defect rates. Therefore, it is of paramount importance to construct new architectures and design... methodolo- gies that can tolerate large numbers of defects. Defect maps are a necessity in the future design

  

Source: 

 

Collection: Engineering ; Computer Technologies and Information Sciences


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61 Combining Circuit Level and System Level Techniques for Defect-Tolerant Nanoscale Architectures
 

Summary:  Combining Circuit Level and System Level Techniques for Defect-Tolerant Nanoscale Architectures... to develop and evaluate high- density, defect-tolerant architectures on such fabrics. Our designs are based... - in defect-tolerance techniques in conjunction with system- level CMOS voting and evaluate

  

Source: Moritz, Csaba Andras - Department of Electrical and Computer Engineering, University of Massachusetts at Amherst

 

Collection: Computer Technologies and Information Sciences

 
62 Autom Software Eng (2006) 13:373394 DOI 10.1007/s10851-006-8531-5
 

Summary:  of software artifacts can find defects early in the development process and gather information on the quality... for inspections. We have thus developed a set of groupware tools for both individual defect detection... of tool support regarding defect detection and inspection meetings. The main results of our family

  

Source: Technische Universität Wien, Institute for Software Technology and Interactive Systems, Interactive Media Systems Group

 

Collection: Computer Technologies and Information Sciences

 
63 Field representations for optical defect microcavities in 1D grating structures using quasi-normal modes
 

Summary:  Field representations for optical defect microcavities in 1D grating structures using quasi... transmission resonances in 1D optical defect cavities and the related field approximations. Using a mirror... show a resonant response in the time or frequency domain, which can be tailored by inclusion of defects

  

Source: Hammer, Manfred - Department of Applied Mathematics, Universiteit Twente

 

Collection: Mathematics

 
64 1 Copyright 2001 by ASME Proceedings of DETC 2001
 

Summary:  . The authors also verify the correlation between complexity factor of the modules and their defect rates... of assembly operations, the author defined a complexity factor that enables prediction of assembly defects. GE... on the assumption that defect rates increase as ...

  

Source: Ishii, Kos - Department of Mechanical Engineering, Stanford University

 

Collection: Engineering

 
65 To appear in IEEE Trans. on Visualization and Computer Graphics (Proc. Visualization/Information Visualization 2006), 12(5), 2006 Detection and Visualization of Defects in 3D Unstructured Models
 

Summary:  ) for the same dataset. The right image shows detected defects for a complex simulated biomolecule. Fig. 2... /Information Visualization 2006), 12(5), 2006 Detection and Visualization of Defects in 3D Unstructured Models of Nematic... -automatic detection and visualization of defects in models of nematic liquid ...

  

Source: Jankun-Kelly, T. J. - Department of Computer Science, Mississippi State University

 

Collection: Computer Technologies and Information Sciences

 
66 AgEng Leuven 2004 Engineering the Future (International Conference of Agricultural Engineering)
 

Summary:  sorting system and reached high recognition rates, but misclassified stem-ends and calyxes as defected... to grade apples, where defects are segmented by subtraction of a reference image from original, stem... total defect area (Li et al., 2002). Segmentation of skin defects of apple fruits is one of the ...

  

Source: Dupont, Stéphane - Multitel; Ünay, Devrim - Department of Electrical and Electronics Engineering, Bahcesehir University

 

Collection: Computer Technologies and Information Sciences ; Engineering

 
67 JOURNAL DE PHYSIQUE Colloque C5, suppl6ment au nO1O,Tome 44, octobre 1983 page C5-281
 

Summary:  complex (E center) o r V - 0 (A center) and vacancy complexes anneal out i n the range o f 150 - 500" C. I... complex defects ( ~ 5 ) ,a t a temperature around 600" C so t h a t a post laser treatment performed... t o the presence o f point ...

  

Source: Ecole Polytechnique, Centre de mathématiques

 

Collection: Mathematics

 
68 A Practical Use of ROC Analysis to Assess the Performances of Defects Detection Algorithms
 

Summary:  such algorithms, but it has some limitations when facing complex situations (various sizes/shapes/types of defects... A Practical Use of ROC Analysis to Assess the Performances of Defects Detection Algorithms Yann Le... .chanussot@lis.inpg.fr Abstract. Defects detection on images is a current task in quality ...

  

Source: Ecole Polytechnique, Centre de mathématiques

 

Collection: Mathematics

 
69 A Controlled Experiment to Assess the Effectiveness of Inspection Meetings Alessandro Bianchi, Filippo Lanubile, and Giuseppe Visaggio
 

Summary:  for detecting and removing defects early in the software development process. In a software inspection, review... with respect to the number of true discovered defects. While group synergy allows inspectors to find some new... defects, these meeting gains are offset by meeting losses, that is defects found ...

  

Source: Lanubile, Filippo - Dipartimento di Informatica, Università degli Studi di Bari

 

Collection: Computer Technologies and Information Sciences

 
70 JOURNAL DE PHYSIQUE N Colloque C6,supplkment au Journal de PhysiqueHI,VoI. 1,d&embre 1991
 

Summary:  complex defects. For example, Fig.2 shows the EBIC images of two twins and a Te precipitate formed near... ) and for different regions of the Te precipitate (b,c,d). stability in different regions of these complex defects... parameters and temperature. The results obtained are discussed taking into account ...

  

Source: Ecole Polytechnique, Centre de mathématiques

 

Collection: Mathematics

 
71 Hyperfine Interactions 130: 151179, 2000. 2000 Kluwer Academic Publishers. Printed in the Netherlands.
 

Summary:  of these defect-probe complexes have analog states that have been observed in NiAl and other NiAl-type B2 phases... concentrations from the measured site fractions of PAC probes in complexes with defects [29]. In the alu- minides... and milled PdIn. Identification of defect ...

  

Source: Collins, Gary S. - Department of Physics and Astronomy, Washington State University

 

Collection: Physics

 
72 Software Defect Data and Predictability for Testing Schedules Rattikorn Hewett & Aniruddha Kulkarni
 

Summary:  of resources. As software gets more complex, testing and fixing defects become difficult to schedule... % of a project life cycle. As software projects get larger and more complex, testing and fixing defects become... , requirements change, etc. Defects can have varying degrees of ...

  

Source: Stringfellow, Catherine V. - Department of Computer Science, Midwestern State University

 

Collection: Computer Technologies and Information Sciences

 
73 Computer simulation of topological defects around a colloidal particle or droplet dispersed in a nematic host
 

Summary:  that the disclination ring defect has a complex structure. This mini- mum is probably due to the density modulation near... . To emphasise the complex structure of the defect core we plot the biaxiality profiles Fig. 6 . From the order... , especially if one bears in mind the complex ...

  

Source: Bielefeld, Universität, Fakultät für Physik, Condensed Matter Theory Group

 

Collection: Physics ; Materials Science

 
74 Extreme ultraviolet holographic microscopy and its application to extreme ultraviolet mask-blank defect characterization
 

Summary:  . The hologram captures a record of the complex-valued diffraction pattern created by the defect and can be used... -blank defect characterization Sang Hun Leea) and Jeffrey Bokor Department of Electrical Engineering... , the concept of holographic microscopy is extended to the characterizations of defects on ...

  

Source: Lawrence Berkeley National Laboratory, Center for X-Ray Optics, EUV Interferometry

 

Collection: Physics

 
75 IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, VOL. 25, NO. 3, MAY/JUNE 1999 1 J:\PRODUCTION\TSE\2-INPROD\105579\105579-1.DOC regularpaper98.dot SL 19,968 04/14/99 2:14 PM 1 / 15
 

Summary:  of the wide range of prediction models use size and complexity metrics to predict defects. Others are based... engineering. Index Terms--Software faults and failures, defects, complexity metrics, fault-density, Bayesian... and testing processes have been advanced as ways of reducing ...

  

Source: Fenton, Norman - Department of Computer Science, Queen Mary, University of London

 

Collection: Computer Technologies and Information Sciences

 
76 A Domain Anal sis to Specif DesignA Domain Analysis to Specify Design Defects and Generate Detection Algorithms
 

Summary:  A Domain Anal sis to Specif DesignA Domain Analysis to Specify Design Defects and Generate... ;Context Moha © A Domain Analysis to Specify Design Defects and Generate Detection Algorithms 2 #12;Context... Moha © A Domain Analysis to Specify Design Defects and Generate Detection Algorithms 3 #12;What Kind

  

Source: Moha, Naouel - Departement de informatique, Université du Québec à Montréal

 

Collection: Computer Technologies and Information Sciences

 
77 Experiences Using Defect Checklists in Software Engineering Education Kendra Cooper1
 

Summary:  total number of defects found in undergraduate teams. The assumption is that the increased complexity... Experiences Using Defect Checklists in Software Engineering Education Kendra Cooper1 , Sheila... and social topics. Within software engineering, software quality assurance (SQA) is a complex area to teach

  

Source: Dascalu, Sergiu - Department of Computer Science and Engineering, University of Nevada, Reno

 

Collection: Computer Technologies and Information Sciences

 
78 Understanding the Sources of Variations in Software Inspections
 

Summary:  and removing defects from software artifacts Three-step procedure Preparation ­ Collection - Repair Fagan... of multi- inspection Structural changes Effectiveness of defect detection Effectiveness of defect detection... of multi- inspection Structural changes Effectiveness of defect detection Effectiveness ...

  

Source: Bae, Doo-Hwan - Department of Computer Science, Korea Advanced Institute of Science and Technology

 

Collection: Computer Technologies and Information Sciences

 
79 PHYSICAL REVIEW B 83, 235208 (2011) First-principles study of defect properties of zinc blende MgTe
 

Summary:  energy levels of intrinsic defects and extrinsic impurities and some defect complexes in zinc blende Mg... levels of intrinsic defects and extrinsic impurities. Some defect complexes were also studied. Our... cases. To see if the defect ...

  

Source: Gong, Xingao - Department of Physics, Fudan University

 

Collection: Materials Science ; Physics

 
80 Detection and Visualization of Anomalous Structures in Molecular Dynamics Simulation Data
 

Summary:  The Ohio State University (a) (b) (c) Figure 1: Si System with an interstitial defect (dataset I1) (a... ) Lattice with bulk and defect (b) Salient Iso-surface with ability to distinguish between bulk and defect... (c) An arbitrary slice of electron density data showing the shape of defect ABSTRACT In this ...

  

Source: Wilkins, John - Department of Physics, Ohio State University

 

Collection: Materials Science ; Physics


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81 Economics of Software Verification Gerard J. Holzmann
 

Summary:  for buggyness one often uses the elusive standard of `residual defect density.' The residual defect density... is meant to measure the number of defects that remain in a software artifact after delivery to the end... a residual defect density of less than one defect per one thousand ...

  

Source: Holzmann, Gerard J. - Laboratory for Reliable Software,Jet Propulsion Laboratory

 

Collection: Computer Technologies and Information Sciences

 
82 Hole-defect chaos in the one-dimensional complex Ginzburg-Landau equation Martin Howard1
 

Summary:  Hole-defect chaos in the one-dimensional complex Ginzburg-Landau equation Martin Howard1 and Martin... study the spatiotemporally chaotic dynamics of holes and defects in the one-dimensional 1D complex... chaos large c1 , c3). Isolated defects occur when A goes through zero, where the ...

  

Source: Howard, Martin - Department of Systems Biology, John Innes Centre; van Hecke, M. - Leiden Institute of Physics, Universiteit Leiden

 

Collection: Mathematics ; Physics

 
83 Self--interstitial aggregation in diamond J. P. Goss, B. J. Coomer, and R. Jones
 

Summary:  by the aggregation of nitrogen: single substitutional nitrogen defects combine into dimers (A­centers), which... for complexes of three self--interstitials. A. The O3 defect The O3, S=1 center, has C 2 symmetry appears... defects, I #001# 1 , I NN 2 and I 3 and compare with the ...

  

Source: Jones, Robert - School of Physics, University of Exeter

 

Collection: Materials Science

 
84 Selfinterstitial aggregation in diamond J. P. Goss, B. J. Coomer, and R. Jones
 

Summary:  by the aggregation of nitrogen: single substitutional nitrogen defects combine into dimers (A-centers), which... centers are eliminated in the construction of this I2NN 3 complex, leading to a defect containing a single... defects, I 001 1 , INN 2 and I3 and compare with the experimental ...

  

Source: Jones, Robert - School of Physics, University of Exeter

 

Collection: Materials Science

 
85 INSTITUTE OF PHYSICS PUBLISHING JOURNAL OF PHYSICS D: APPLIED PHYSICS J. Phys. D: Appl. Phys. 36 (2003) 24272431 PII: S0022-3727(03)64090-8
 

Summary:  by the calibration defects. In this paper, we address a more useful and complex inverse method, aimed at eliminating... cylindrical defect was adapted to more complex and realistic defect geometries, specifically, to interacting... the length of a surface-breaking ...

  

Source: Clapham, Lynann - Department of Physics, Queen's University (Kingston)

 

Collection: Materials Science

 
86 Experimental Rock Deformation E.Rybacki
 

Summary:  in rocks are not infinitely sharp but reveal distributed damage! 39 #12;Complex Defects: Sliding/Wing CrackComplex... Ic c K - = - + - + 40 #12;Complex Defects: Hertzian Contacts Crushing and PoreComplex... Defects: Sliding/Wing Crack ...

  

Source: Cesare, Bernardo - Dipartimento di Geoscienze, Università degli Studi di Padova

 

Collection: Geosciences

 
87 Evaluation of Defects in the Seal Region of Food Packages Using the Ultrasonic Contrast
 

Summary:  equipment and complexity than the laboratory studies have required. After the mini- mum defect size... Evaluation of Defects in the Seal Region of Food Packages Using the Ultrasonic Contrast Descriptor... and evaluate major defects (channels and product inclusions, which compromise the seal integrity and must

  

Source: Illinois at Urbana-Champaign, University of - Bioacoustics Research Laboratory

 

Collection: Engineering ; Biology and Medicine

 
88 J. PHYS. IV FRANCE 7 (1997) Colloque C5, Supplkment au Journal de Physique I11 de novembre 1997
 

Summary:  Defect Structuresin CuZr Martensite, Studiesby CTEM and HRTEM J.W. Seo and D. Schryvers University of... Antwerp, RUCA, EMAT, Groenenborgerlaan 171, 2020 Antwerp, Belgium Abstract. Defect structures in CuZr martensite... of planar defects are observed. It is concluded that both defect types can be inherited ...

  

Source: Ecole Polytechnique, Centre de mathématiques

 

Collection: Mathematics

 
89 ARC Centre of Excellence for AntimatterMatter Studies
 

Summary:  fragmentation surfaces defects voids attachment bio-molecules modelling radiopharmaceuticals fundamental... scattering ionisation excitation binding applied fragmentation surfaces defects voids attachment bio... -molecules modelling radiop sation excitation binding applied fragmentation surfaces defects voids attachment bio

  

Source: Centre for Antimatter-Matter Studies (CAMS)

 

Collection: Physics

 
90 Automatic Generation of Detection Algorithms for Design Defects Naouel Moha and Yann-Gael Gueheneuc and Pierre Leduc
 

Summary:  defect is a complex class that offers a high number of services to address many different needs. Utility... Automatic Generation of Detection Algorithms for Design Defects Naouel Moha and Yann-Ga¨el Gu... published design defects for- malising "bad" solutions to recurring design problems (e.g., anti

  

Source: Moha, Naouel - Departement de informatique, Université du Québec à Montréal

 

Collection: Computer Technologies and Information Sciences

 
91 Automating defects simulation and fault modeling Stefano Di Carlo, Paolo Prinetto, Alberto Scionti
 

Summary:  Automating defects simulation and fault modeling for SRAMs Stefano Di Carlo, Paolo Prinetto... pro- cess density for Very Deep Sub Micron technologies constantly leads to new classes of defects... in memory devices. Exploring the effect of fabrication defects in future technologies, and identifying new

  

Source: Langendoen, Koen - Elektrotechniek, Wiskunde en Informatica, Technische Universiteit Delft

 

Collection: Engineering ; Computer Technologies and Information Sciences

 
92 Optimal Resource Allocation for the Quality Control Process Pankaj Jalote
 

Summary:  for different types of defects, but then the formulation and solution will get that much more complex. #12... defects. The final quality of the delivered software depends on the effort spent on all the QC stages... . As the cost of removing defects increases with latency [3], in an at- tempt to detect and ...

  

Source: Jalote, Pankaj - Department of Computer Science and Engineering, Indian Institute of Technology Kanpur

 

Collection: Computer Technologies and Information Sciences

 
93 Analysis of Resistive-Bridging Defects in SRAM Core-Cells: a Comparative Study from 90nm
 

Summary:  core-cells makes them extremely vulnerable to physical defects. Due to the complex nature of the SRAM... 132 Analysis of Resistive-Bridging Defects in SRAM Core-Cells: a Comparative Study from 90nm down... a comparative study on the effects of resistive-bridging defects in the SRAM core-cells, considering ...

  

Source: Ecole Polytechnique, Centre de mathématiques

 

Collection: Mathematics

 
94 JOURNAL DE PHYSIQUE Co//oque C9, supp/6nren/ au no 11-12, Ton?c>34, Nouenrbre-Dkcen~bl-e1973, page 0 -7 9 INVESTIGATION OF THE THERMAL DEFECT-ORDER
 

Summary:  by blocking electrodes, as defects and impurity-defect complexes accuni~~latein rlieir vicinity. A theoretical... analysis of the defect flux in d crystal subjected to an ITC-experiment sho\\s, thilt besidcs complex... -reorientation peaks : I ) individual peaks should occur for every ...

  

Source: Ecole Polytechnique, Centre de mathématiques

 

Collection: Mathematics

 
95 Evaluation of Critical Components of Non-Ceramic Insulators In-Service
 

Summary:  Evaluation of Critical Components of Non-Ceramic Insulators In-Service: Role of Defective... Center Evaluation of Critical Components of Non-Ceramic Insulators (NCI) In-Service: Role of Defective... Components of Non-Ceramic Insulators (NCI) In-Service: Role of Defective Interfaces." #12;Executive Summary

  

Source: Arizona State University, Power Systems Engineering Research Center

 

Collection: Power Transmission, Distribution and Plants

 
96 Abstract. --Lattice distortions due to defects in crystals can be studied most directly by elastic X-ray or neutron scattering experiments. The size of the defects can be determined from the shift of
 

Summary:  to study impurity defect complexes by EXAFS. W. KANZIG.-IS your theory too modified if you start out whith... Abstract. -- Lattice distortions due to defects in crystals can be studied most directly by elastic... X-ray or neutron scattering experiments. The size of the defects can be determined from the shift

  

Source: Ecole Polytechnique, Centre de mathématiques

 

Collection: Mathematics

 
97 Defect Tolerance for Yield Enhancement of FPGA Interconnect Using Fine-grain and Coarse-grain Redundancy
 

Summary:  Defect Tolerance for Yield Enhancement of FPGA Interconnect Using Fine-grain and Coarse... this far ahead is manufacturing defects appearing in immature technologies. The aggressive scaling... unlikely. Utilization of defect-tolerant techniques is one method of alleviating this growing problem

  

Source: Lemieux, Guy - Department of Electrical and Computer Engineering, University of British Columbia

 

Collection: Engineering

 
98 1024 IEEE TRANSACTIONS ON MAGNETICS, VOL. 46, NO. 4, APRIL 2010 Sizing of 3-D Arbitrary Defects Using Magnetic Flux
 

Summary:  simulate three defects with complex geometries, shown in Fig. 5(a)­(c). The thickness of the slab is 5.6 mm... 1024 IEEE TRANSACTIONS ON MAGNETICS, VOL. 46, NO. 4, APRIL 2010 Sizing of 3-D Arbitrary Defects... of an arbitrary three-dimensional (3-D) defect from magnetic flux leakage (MFL) measurements. We ...

  

Source: Reilly, James P. - Department of Electrical and Computer Engineering, McMaster University

 

Collection: Engineering

 
99 Defectfreezing and Defectunbinding in the Vector Complex GinzburgLandau Equation.
 

Summary:  Defect­freezing and Defect­unbinding in the Vector Complex Ginzburg­Landau Equation. Miguel... singularities or defects. In our case there are two complex fields, A+ and A \Gamma , which can vanish... describe the dynamical behavior found in numerical solutions of the Vector ...

  

Source: Colet, Pere - Mediterranean Institute for Advanced Studies (IMEDEA)

 

Collection: Physics

 
100 2 IEEE TRANSACTIONS ON COMPONENTS, PACKAGING, AND MANUFACTURING TECHNOLOGY--PART B, VOL. 20, NO. 1, FEBRUARY 1997 A Novel Test Technique for MCM Substrates
 

Summary:  -- This paper describes a novel and low-cost test technique that is capable of detecting process related defects... , have low throughput or provide poor defect coverage. The proposed test method applies a stimulus... to guarantee a defect free substrate. This is a screening process to ensure that the interconnections do

  

Source: Swaminathan, Madhavan - School of Electrical and Computer Engineering, Georgia Institute of Technology

 

Collection: Engineering


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