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The Dimensional Measuring Interface Standard (DMIS) is the first data interoperability protocol standard created specifically for dimensional metrology. DMIS applications are multi-facetted. The standard can behave as a coordinate metrology language to execute measurement part programs, or it can be used as a neutral data exchange mechanism for part programs and measurement results. DMIS is full featured and has many successful implementations. It also has a strong reputation as a progressive standard, one that has been responsive to user needs and technology advances. It is maintained and improved upon by a volunteer committee, the DMIS Standards Committee (DSC), under the auspices of the Dimensional Metrology Standards Consortium (DMSC Inc.). DMIS has progressed as its eighth version and its sixth as a national and/or international standard. Some notable advances of DMIS have included:
• support for thin-walled (i.e., sheet-metal) measurements
• alignment with American and International tolerancing standards
• complete suite of measure features
• harmonization with complementary standards and specifications
• extension of additional sensors and scanning processes
• introduction of measurement uncertainty computations
• tighter CAD associativity
• enhancements for multi-axis scanning
• provisioning for functional subsets (application profiles)
• progression of conformance class validations
• designation of key characteristics with criticality designators
• removal of ambiguities and syntactic limitations
• clarification through additional diagrams and code fragments
• resolution to over 600 standard improvement requests
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