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Title: Changes to the ion temperature profile during IBW heating in PBX-M

Conference · · AIP Conference Proceedings (American Institute of Physics); (United States)
OSTI ID:7263117
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  1. Oak Ridge National Laboratory, Tennessee (United States)
  2. Princeton University Plasma Physics Laboratory New Jersey (United States)
  3. Jaeri (Japan)
  4. ENEA, Frascati (Italy)

The introduction of Ion Bernstein Wave Heating (IBWH) experiments in PBX-M have demonstrated significant bulk ion heating and ion temperature (T[sub i]) profile modification. T[sub i] profiles were obtained using a multi-channel, charge-exchange recombination spectroscopy system (the CHERS diagnostic). With IBWH, there are density increases; so to produce comparative discharges when no IBWH is present, additional gas must be injected. For [bar n][sub e], of [similar to]3[times]10[sup 13] cm[sup [minus]3], the central ion temperature, T[sub i0], was observed to increase by 350 eV when 0.6 MW of IBWH was applied for [similar to]300 msec. The product [bar n][sub e] T[sub i0], a measure of the ion stored energy, increases linearly with IBWH power. The T[sub i] profile broadened with IBWH and the ion temperature gradient steepened near the predicted power deposition layer, providing evidence of localized heating. Examination of [Delta]T[sub i] profile evolution indicated that the IBWH power was, in fact, deposited in a localized, off-axis region.

DOE Contract Number:
AC02-76CH03073
OSTI ID:
7263117
Report Number(s):
CONF-9304112-; CODEN: APCPCS
Journal Information:
AIP Conference Proceedings (American Institute of Physics); (United States), Vol. 289:1; Conference: 10. topical conference on radio frequency power in plasmas, Boston, MA (United States), 1-3 Apr 1993; ISSN 0094-243X
Country of Publication:
United States
Language:
English