Energy Citations Database
Bookmark and Share

Bibliographic Citation

 
Document
For copies of Journal Articles, please contact the Publisher or your local public or university library and refer to the information in the Resource Relation field.
For copies of other documents, please see the Availability, Publisher, Research Organization, Resource Relation and/or Author (affiliation information) fields and/or Document Availability.
Title Diode laser excited optogalvanic spectroscopy of glow discharges
Creator/Author Barshick, C.M. ; Shaw, R.W. ; Jennings, L.W. ; Post-Zwicker, A. ; Young, J.P. ; Ramsey, J.M. [Chemical Analytical Sciences Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tenessee 37831-6142 (United States)]
Publication Date1997 Jan 01
OSTI IdentifierOSTI ID: 542090
Report Number(s)CONF-960686--
DOE Contract NumberAC05-96OR22464
Other Number(s)Journal ID: APCPCS; ISSN 0094-243X; TRN: TRN: 9717M0046
Resource TypeJournal Article
Resource RelationJournal Name: AIP Conference Proceedings; Journal Volume: 388; Journal Issue: 1; Conference: 8. international symposium on resonance ionization spectroscopy and its applications (RIS-96), State College, PA (United States), 30 Jun - 5 Jul 1996; Other Information: PBD: Jan 1997
Research OrgOak Ridge National Laboratory
Subject36 MATERIALS SCIENCE; URANIUM; PHOTOIONIZATION; ISOTOPE RATIO; GLOW DISCHARGES; OPTICAL PROPERTIES; LASER RADIATION; EXCITATION
Description/AbstractThe development of diode-laser-excited isotopically-selective optogalvanic spectroscopy (OGS) of uranium metal, oxide and fluoride in a glow discharge (GD) is presented. The technique is useful for determining {sup 235}U/({sup 235}U+{sup 238}U) isotope ratios in these samples. The precision and accuracy of this determination is evaluated, and a study of experimental parameters pertaining to optimization of the measurement is discussed. Application of GD-OGS to other f-transition elements is also described. {copyright} {ital 1997 American Institute of Physics.}
Country of PublicationUnited States
LanguageEnglish
FormatMedium: X; Size: pp. 127-132
System Entry Date2008 Sep 11

Top