Bibliographic Citation
| Document |  4 Mb |
|---|---|
| Title | In situ TEM study of ion-beam-induced amorphization of complex silicate structures |
| Creator/Author | Wang, L.M. ; Eby, R.K. ; Janeczek, J. ; Ewing, R.C. |
| Publication Date | 1990 Dec 31 |
| OSTI Identifier | OSTI ID: 442204; Legacy ID: DE97002504 |
| Report Number(s) | CONF-900936--29 |
| DOE Contract Number | FG04-84ER45099 |
| Other Number(s) | Other: ON: DE97002504 |
| Resource Type | Conference |
| Resource Relation | Conference: 7. international conference on ion beam modification of materials (IBMM-7) and exposition, Knoxville, TN (United States), 9-14 Sep 1990; Other Information: PBD: [1990] |
| Research Org | New Mexico Univ., Albuquerque, NM (United States). Dept. of Geology |
| Sponsoring Org | USDOE Office of Energy Research, Washington, DC (United States) |
| Subject | 36 MATERIALS SCIENCE; SILICATE MINERALS; PHYSICAL RADIATION EFFECTS; AMORPHOUS STATE; ION BEAMS; KRYPTON IONS |
| Description/Abstract | In-situ TEM with ion irradiation was used to study the radiation- induced amorphization (metamictization) of naturally occurring silicates: neptunite [Na2KLi(Fe,Mn)2Ti2(SiO3)8], titanite (CaTiSiO5), gadolinite (REE2FeBe2Si2O10), zircon (ZrSiO4), and olivine [(Mg, Fe)2SiO4]. They were irradiated with 1.5 MeV Kr{sup +} ions the Argonne HVEM-Tandem Facility at room temperature with electron diffraction pattern monitored in situ. Critical doses required for amorphization of the electron transparent thickness of neptunite, titanite, gadolinite, zircon, and olivine are 1.7, 2.0, 2.3, 4.8, and 6.0x10{sup 14} ions/cm{sup 2}, respectively. Results show a correlation between amorphization dose and the chemical/structural complexity of these 5 minerals. The most complex, neptunite, becomes amorphous at the lowest critical dose. The critical amorphization dose also increases with the melting point. |
| Country of Publication | United States |
| Language | English |
| Format | Medium: ED; Size: 12 p. |
| Availability | OSTI as DE97002504 |
| System Entry Date | 2009 Nov 10 |
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Last Updated: 11/19/2009