Bibliographic Citation

 
7,542,624
Window-based method for approximating the Hausdorff in three-dimensional range imagery
View USPTO link (Link will open in a new window)
06/02/2009
US patent application 11/238,609
Koch, Mark W. (Albuquerque, NM)
Sandia National Laboratories (SNL-NM), Albuquerque, NM
United States Department of Energy
AC04-94AL85000
Sandia Corporation (Albuquerque, NM)
One approach to pattern recognition is to use a template from a database of objects and match it to a probe image containing the unknown. Accordingly, the Hausdorff distance can be used to measure the similarity of two sets of points. In particular, the Hausdorff can measure the goodness of a match in the presence of occlusion, clutter, and noise. However, existing 3D algorithms for calculating the Hausdorff are computationally intensive, making them impractical for pattern recognition that requires scanning of large databases. The present invention is directed to a new method that can efficiently, in time and memory, compute the Hausdorff for 3D range imagery. The method uses a window-based approach.

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