Ion funnel with extended mass range and reduced conductance limit aperture
Abstract
An improved ion funnel design is disclosed that decreases the axial RF (parasite) fields at the ion funnel exit. This is achieved by addition of one or more compensation electrodes after the conductance limit electrode. Various RF voltage profiles may be applied to the various electrodes minimizing the parasite axial potential wells. The smallest RF aperture that serves as the conductance limiting electrode is further reduced over standard designs. Overall, the ion funnel improves transmission ranges of both low m/z and high m/z ions, reducing RF activation of ions and decreasing the gas load to subsequent differential pumping stages.
- Inventors:
-
- Richland, WA
- Issue Date:
- Research Org.:
- Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 936229
- Patent Number(s):
- 7351964
- Application Number:
- 11/251,528
- Assignee:
- Battelle Memorial Institute (Richland, WA)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- AC06-76RL01830
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Tolmachev, Aleksey V, and Smith, Richard D. Ion funnel with extended mass range and reduced conductance limit aperture. United States: N. p., 2008.
Web.
Tolmachev, Aleksey V, & Smith, Richard D. Ion funnel with extended mass range and reduced conductance limit aperture. United States.
Tolmachev, Aleksey V, and Smith, Richard D. Tue .
"Ion funnel with extended mass range and reduced conductance limit aperture". United States. https://www.osti.gov/servlets/purl/936229.
@article{osti_936229,
title = {Ion funnel with extended mass range and reduced conductance limit aperture},
author = {Tolmachev, Aleksey V and Smith, Richard D},
abstractNote = {An improved ion funnel design is disclosed that decreases the axial RF (parasite) fields at the ion funnel exit. This is achieved by addition of one or more compensation electrodes after the conductance limit electrode. Various RF voltage profiles may be applied to the various electrodes minimizing the parasite axial potential wells. The smallest RF aperture that serves as the conductance limiting electrode is further reduced over standard designs. Overall, the ion funnel improves transmission ranges of both low m/z and high m/z ions, reducing RF activation of ions and decreasing the gas load to subsequent differential pumping stages.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 01 00:00:00 EDT 2008},
month = {Tue Apr 01 00:00:00 EDT 2008}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
A novel ion funnel for focusing ions at elevated pressure using electrospray ionization mass spectrometry
journal, October 1997
- Schaffer, Scott A.; Tang, Keqi; Anderson, Gordon A.
- Rapid Communications in Mass Spectrometry, Vol. 11, Issue 16, p. 1813-1817
An Ion Funnel Interface for Improved Ion Focusing and Sensitivity Using Electrospray Ionization Mass Spectrometry
journal, October 1998
- Shaffer, Scott A.; Prior, David C.; Anderson, Gordon A.
- Analytical Chemistry, Vol. 70, Issue 19, p. 4111-4119
High-Sensitivity Ion Mobility Spectrometry/Mass Spectrometry Using Electrodynamic Ion Funnel Interfaces
journal, May 2005
- Tang, Keqi; Shvartsburg, Alexandre A.; Lee, Hak-No
- Analytical Chemistry, Vol. 77, Issue 10, p. 3330-3339
Characterization of an Improved Electrodynamic Ion Funnel Interface for Electrospray Ionization Mass Spectrometry
journal, August 1999
- Shaffer, Scott A.; Tolmachev, Aleksey; Prior, David C.
- Analytical Chemistry, Vol. 71, Issue 15, p. 2957-2964
Simulation-based optimization of the electrodynamic ion funnel for high sensitivity electrospray ionization mass spectrometry
journal, December 2000
- Tolmachev, Aleksey V.; Kim, Taeman; Udseth, Harold R.
- International Journal of Mass Spectrometry, Vol. 203, Issue 1-3