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Title: Method and apparatus for measuring micro structures, anisotropy and birefringence in polymers using laser scattered light

Abstract

A method and apparatus for measuring microstructures, anistropy and birefringence in polymers using laser scattered light includes a laser which provides a beam that can be conditioned and is directed at a fiber or film which causes the beam to scatter. Backscatter light is received and processed with detectors and beam splitters to obtain data. The data is directed to a computer where it is processed to obtain information about the fiber or film, such as the birefringence and diameter. This information provides a basis for modifications to the production process to enhance the process.

Inventors:
 [1];  [2];  [3]
  1. Santa Clara, CA
  2. Livermore, CA
  3. Wilmington, DE
Issue Date:
Research Org.:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
OSTI Identifier:
873130
Patent Number(s):
6097488
Assignee:
Princeton University (Princeton, NJ)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
AC04-76
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; apparatus; measuring; micro; structures; anisotropy; birefringence; polymers; laser; scattered; light; microstructures; anistropy; provides; beam; conditioned; directed; fiber; film; causes; scatter; backscatter; received; processed; detectors; splitters; obtain; data; computer; information; diameter; basis; modifications; production; process; enhance; beam splitter; scattered light; backscatter light; obtain information; beam splitters; production process; measuring micro; laser scattered; /356/

Citation Formats

Grek, Boris, Bartolick, Joseph, and Kennedy, Alan D. Method and apparatus for measuring micro structures, anisotropy and birefringence in polymers using laser scattered light. United States: N. p., 2000. Web.
Grek, Boris, Bartolick, Joseph, & Kennedy, Alan D. Method and apparatus for measuring micro structures, anisotropy and birefringence in polymers using laser scattered light. United States.
Grek, Boris, Bartolick, Joseph, and Kennedy, Alan D. Sat . "Method and apparatus for measuring micro structures, anisotropy and birefringence in polymers using laser scattered light". United States. https://www.osti.gov/servlets/purl/873130.
@article{osti_873130,
title = {Method and apparatus for measuring micro structures, anisotropy and birefringence in polymers using laser scattered light},
author = {Grek, Boris and Bartolick, Joseph and Kennedy, Alan D},
abstractNote = {A method and apparatus for measuring microstructures, anistropy and birefringence in polymers using laser scattered light includes a laser which provides a beam that can be conditioned and is directed at a fiber or film which causes the beam to scatter. Backscatter light is received and processed with detectors and beam splitters to obtain data. The data is directed to a computer where it is processed to obtain information about the fiber or film, such as the birefringence and diameter. This information provides a basis for modifications to the production process to enhance the process.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sat Jan 01 00:00:00 EST 2000},
month = {Sat Jan 01 00:00:00 EST 2000}
}