Uncooled infrared photon detector and multicolor infrared detection using microoptomechanical sensors

Datskos, Panagiotis G; Rajic, Solobodan; Datskou, Irene C

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Title: Uncooled infrared photon detector and multicolor infrared detection using microoptomechanical sensors

Abstract

Systems and methods for infrared detection are described. An optomechanical photon detector includes a semiconductor material and is based on measurement of a photoinduced lattice strain. A multicolor infrared sensor includes a stack of frequency specific optomechanical detectors. The stack can include one, or more, of the optomechanical photon detectors that function based on the measurement of photoinduced lattice strain. The systems and methods provide advantages in that rapid, sensitive multicolor infrared imaging can be performed without the need for a cooling subsystem.

Inventors:

Datskos, Panagiotis G ^[1]; Rajic, Solobodan ^[1]; Datskou, Irene C ^[1]

Knoxville, TN

Issue Date:: Fri Jan 01 00:00:00 EST 1999

Research Org.:: Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)

OSTI Identifier:: 872632

Patent Number(s):: 5977544

Assignee:: Lockheed Martin Energy Research Corporation (Oak Ridge, TN)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS

G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT

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G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
G01B11/18 - {using photoelastic elements}

G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
G01J1/56 - using radiation pressure or radiometer effect
G01J5/46 - using radiation pressure or radiometer effect

Show less

DOE Contract Number:: AC04-76

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: uncooled; infrared; photon; detector; multicolor; detection; microoptomechanical; sensors; systems; methods; described; optomechanical; semiconductor; material; based; measurement; photoinduced; lattice; strain; sensor; stack; frequency; specific; detectors; function; provide; advantages; rapid; sensitive; imaging; performed; cooling; subsystem; semiconductor material; provide advantages; methods provide; photon detector; lattice strain; infrared detection; infrared imaging; mechanical sensors; mechanical sensor; /250/73/356/

Citation Formats


                    Datskos, Panagiotis G, Rajic, Solobodan, and Datskou, Irene C. Uncooled infrared photon detector and multicolor infrared detection using microoptomechanical sensors.  United States: N. p., 1999. 
        Web.

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                    Datskos, Panagiotis G, Rajic, Solobodan, & Datskou, Irene C. Uncooled infrared photon detector and multicolor infrared detection using microoptomechanical sensors.  United States.

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                    Datskos, Panagiotis G, Rajic, Solobodan, and Datskou, Irene C. Fri .  
        "Uncooled infrared photon detector and multicolor infrared detection using microoptomechanical sensors".  United States.  https://www.osti.gov/servlets/purl/872632.

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@article{osti_872632,

  title        = {Uncooled infrared photon detector and multicolor infrared detection using microoptomechanical sensors},

  author       = {Datskos, Panagiotis G and Rajic, Solobodan and Datskou, Irene C},

  abstractNote = {Systems and methods for infrared detection are described. An optomechanical photon detector includes a semiconductor material and is based on measurement of a photoinduced lattice strain. A multicolor infrared sensor includes a stack of frequency specific optomechanical detectors. The stack can include one, or more, of the optomechanical photon detectors that function based on the measurement of photoinduced lattice strain. The systems and methods provide advantages in that rapid, sensitive multicolor infrared imaging can be performed without the need for a cooling subsystem.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {Fri Jan 01 00:00:00 EST 1999},

  month        = {Fri Jan 01 00:00:00 EST 1999}

}

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Works referenced in this record:

Effect of electronic strain on photoacoustic generation in silicon
journal, November 1985

Stearns, R. G.; Kino, G. S.
Applied Physics Letters, Vol. 47, Issue 10
https://doi.org/10.1063/1.96374

Applicability of the classical curvature‐stress relation for thin films on plate substrates
journal, November 1989

von Preissig, F. J.
Journal of Applied Physics, Vol. 66, Issue 9
https://doi.org/10.1063/1.343968

Remote infrared radiation detection using piezoresistive microcantilevers
journal, November 1996

Datskos, P. G.; Oden, P. I.; Thundat, T.
Applied Physics Letters, Vol. 69, Issue 20
https://doi.org/10.1063/1.117752

Photostriction Effect in Germanium
journal, January 1961

Figielski, T.
physica status solidi (b), Vol. 1, Issue 4
https://doi.org/10.1002/pssb.19610010403

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Similar Records

Title: Uncooled infrared photon detector and multicolor infrared detection using microoptomechanical sensors

Abstract

Citation Formats

Effect of electronic strain on photoacoustic generation in silicon journal, November 1985

Applicability of the classical curvature‐stress relation for thin films on plate substrates journal, November 1989

Remote infrared radiation detection using piezoresistive microcantilevers journal, November 1996

Photostriction Effect in Germanium journal, January 1961

Effect of electronic strain on photoacoustic generation in silicon
journal, November 1985

Applicability of the classical curvature‐stress relation for thin films on plate substrates
journal, November 1989

Remote infrared radiation detection using piezoresistive microcantilevers
journal, November 1996

Photostriction Effect in Germanium
journal, January 1961