Ultrafast scanning probe microscopy
Abstract
An ultrafast scanning probe microscopy method for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample.
- Inventors:
-
- El Cerrito, CA
- Kensington, CA
- San Francisco, CA
- Issue Date:
- Research Org.:
- Univ. of California (United States)
- OSTI Identifier:
- 869883
- Patent Number(s):
- 5416327
- Assignee:
- Regents of University of California (Oakland, CA)
- Patent Classifications (CPCs):
-
B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
- DOE Contract Number:
- AC03-76SF00098
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- ultrafast; scanning; probe; microscopy; method; achieving; subpicosecond-temporal; resolution; submicron-spatial; observation; sample; embodiment; claimed; single; optical; pulse; generated; split; pulses; delayed; variable; time; delay; means; directed; located; proximate; microscope; produces; probe-sample; signals; indicative; response; characteristics; modulate; varied; signal; recorded; various; delays; created; plotted; function; produce; cross-correlation; provides; simultaneous; response signal; signals indicative; time delays; optical pulse; sample signal; time delay; spatial resolution; scanning probe; microscopy method; located proximate; probe microscope; probe microscopy; sample located; provides simultaneous; ultrafast scanning; temporal resolution; various time; probe sample; /250/
Citation Formats
Weiss, Shimon, Chemla, Daniel S, Ogletree, D Frank, and Botkin, David. Ultrafast scanning probe microscopy. United States: N. p., 1995.
Web.
Weiss, Shimon, Chemla, Daniel S, Ogletree, D Frank, & Botkin, David. Ultrafast scanning probe microscopy. United States.
Weiss, Shimon, Chemla, Daniel S, Ogletree, D Frank, and Botkin, David. Sun .
"Ultrafast scanning probe microscopy". United States. https://www.osti.gov/servlets/purl/869883.
@article{osti_869883,
title = {Ultrafast scanning probe microscopy},
author = {Weiss, Shimon and Chemla, Daniel S and Ogletree, D Frank and Botkin, David},
abstractNote = {An ultrafast scanning probe microscopy method for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 1995},
month = {Sun Jan 01 00:00:00 EST 1995}
}