Image intensifier gain uniformity improvements in sealed tubes by selective scrubbing

Thomas, Stanley W

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Title: Image intensifier gain uniformity improvements in sealed tubes by selective scrubbing

Abstract

The gain uniformity of sealed microchannel plate image intensifiers (MCPIs) is improved by selectively scrubbing the high gain sections with a controlled bright light source. Using the premise that ions returning to the cathode from the microchannel plate (MCP) damage the cathode and reduce its sensitivity, a HeNe laser beam light source is raster scanned across the cathode of a microchannel plate image intensifier (MCPI) tube. Cathode current is monitored and when it exceeds a preset threshold, the sweep rate is decreased 1000 times, giving 1000 times the exposure to cathode areas with sensitivity greater than the threshold. The threshold is set at the cathode current corresponding to the lowest sensitivity in the active cathode area so that sensitivity of the entire cathode is reduced to this level. This process reduces tube gain by between 10% and 30% in the high gain areas while gain reduction in low gain areas is negligible.

Inventors:

Thomas, Stanley W ^[1]

Livermore, CA

Issue Date:: Sun Jan 01 00:00:00 EST 1995

Research Org.:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

OSTI Identifier:: 869841

Patent Number(s):: 5408087

Assignee:: Regents of University of California (Oakland, CA)

Patent Classifications (CPCs):: H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

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H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J31/507 - {using a large number of channels, e.g. microchannel plates}
H01J43/246 - {Microchannel plates [MCP]

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DOE Contract Number:: W-7405-ENG-48

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: image; intensifier; uniformity; improvements; sealed; tubes; selective; scrubbing; microchannel; plate; intensifiers; mcpis; improved; selectively; sections; controlled; bright; light; source; premise; returning; cathode; mcp; damage; reduce; sensitivity; hene; laser; beam; raster; scanned; mcpi; tube; current; monitored; exceeds; preset; threshold; sweep; rate; decreased; 1000; times; giving; exposure; set; corresponding; lowest; active; entire; reduced; level; process; reduces; 10; 30; reduction; negligible; channel plate; image intensifier; light source; laser beam; microchannel plate; cathode current; beam light; active cathode; plate image; raster scan; raster scanned; image intensifiers; set threshold; bright light; /250/

Citation Formats


                    Thomas, Stanley W. Image intensifier gain uniformity improvements in sealed tubes by selective scrubbing.  United States: N. p., 1995. 
        Web.

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                    Thomas, Stanley W. Image intensifier gain uniformity improvements in sealed tubes by selective scrubbing.  United States.

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                    Thomas, Stanley W. Sun .  
        "Image intensifier gain uniformity improvements in sealed tubes by selective scrubbing".  United States.  https://www.osti.gov/servlets/purl/869841.

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@article{osti_869841,

  title        = {Image intensifier gain uniformity improvements in sealed tubes by selective scrubbing},

  author       = {Thomas, Stanley W},

  abstractNote = {The gain uniformity of sealed microchannel plate image intensifiers (MCPIs) is improved by selectively scrubbing the high gain sections with a controlled bright light source. Using the premise that ions returning to the cathode from the microchannel plate (MCP) damage the cathode and reduce its sensitivity, a HeNe laser beam light source is raster scanned across the cathode of a microchannel plate image intensifier (MCPI) tube. Cathode current is monitored and when it exceeds a preset threshold, the sweep rate is decreased 1000 times, giving 1000 times the exposure to cathode areas with sensitivity greater than the threshold. The threshold is set at the cathode current corresponding to the lowest sensitivity in the active cathode area so that sensitivity of the entire cathode is reduced to this level. This process reduces tube gain by between 10% and 30% in the high gain areas while gain reduction in low gain areas is negligible.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {Sun Jan 01 00:00:00 EST 1995},

  month        = {Sun Jan 01 00:00:00 EST 1995}

}

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Works referenced in this record:

Microchannel plate intensifier gain uniformity improvement in sealed tubes by selective scrubbing
conference, January 1993

Thomas, Stan W.; Behnke, Anindita
20th International Congress on High Speed Photography and Photonics, SPIE Proceedings
https://doi.org/10.1117/12.145841

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Image intensifier gain uniformity improvements in sealed tubes by selective scrubbing

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The gain uniformity of sealed microchannel plate image intensifiers (MCPIs) is improved by selectively scrubbing the high gain sections with a controlled bright light source. Using the premise that ions returning to the cathode from the microchannel plate (MCP) damage the cathode and reduce its sensitivity, a HeNe laser beam light source is raster scanned across the cathode of a microchannel plate image intensifier (MCPI) tube. Cathode current is monitored and when it exceeds a preset threshold, the sweep rate is decreased 1000 times, giving 1000 times the exposure to cathode areas with sensitivity greater than the threshold. The thresholdmore » « less
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Title: Image intensifier gain uniformity improvements in sealed tubes by selective scrubbing

Abstract

Citation Formats

Microchannel plate intensifier gain uniformity improvement in sealed tubes by selective scrubbing conference, January 1993

Microchannel plate intensifier gain uniformity improvement in sealed tubes by selective scrubbing
conference, January 1993