Quantitative method for measuring heat flux emitted from a cryogenic object
Abstract
The present invention is a quantitative method for measuring the total heat flux, and of deriving the total power dissipation, of a heat-fluxing object which includes the steps of placing an electrical noise-emitting heat-fluxing object in a liquid helium bath and measuring the superfluid transition temperature of the bath. The temperature of the liquid helium bath is thereafter reduced until some measurable parameter, such as the electrical noise, exhibited by the heat-fluxing object or a temperature-dependent resistive thin film in intimate contact with the heat-fluxing object, becomes greatly reduced. The temperature of the liquid helum bath is measured at this point. The difference between the superfluid transition temperature of the liquid helium bath surrounding the heat-fluxing object, and the temperature of the liquid helium bath when the electrical noise emitted by the heat-fluxing object becomes greatly reduced, is determined. The total heat flux from the heat-fluxing object is determined as a function of this difference between these temperatures. In certain applications, the technique can be used to optimize thermal design parameters of cryogenic electronics, for example, Josephson junction and infra-red sensing devices.
- Inventors:
-
- Tijeras, NM
- Issue Date:
- Research Org.:
- AT&T
- OSTI Identifier:
- 868695
- Patent Number(s):
- 5193909
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01K - MEASURING TEMPERATURE
- DOE Contract Number:
- AC04-76DP00789
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- quantitative; method; measuring; heat; flux; emitted; cryogenic; total; deriving; power; dissipation; heat-fluxing; steps; placing; electrical; noise-emitting; liquid; helium; bath; superfluid; transition; temperature; thereafter; reduced; measurable; parameter; noise; exhibited; temperature-dependent; resistive; film; intimate; contact; greatly; helum; measured; difference; surrounding; determined; function; temperatures; applications; technique; optimize; thermal; design; parameters; electronics; example; josephson; junction; infra-red; sensing; devices; power dissipation; josephson junction; measuring heat; heat flux; intimate contact; sensing device; transition temperature; greatly reduced; liquid helium; quantitative method; sensing devices; total heat; electrical noise; total power; greatly reduce; design parameters; /374/
Citation Formats
Duncan, Robert V. Quantitative method for measuring heat flux emitted from a cryogenic object. United States: N. p., 1993.
Web.
Duncan, Robert V. Quantitative method for measuring heat flux emitted from a cryogenic object. United States.
Duncan, Robert V. Fri .
"Quantitative method for measuring heat flux emitted from a cryogenic object". United States. https://www.osti.gov/servlets/purl/868695.
@article{osti_868695,
title = {Quantitative method for measuring heat flux emitted from a cryogenic object},
author = {Duncan, Robert V},
abstractNote = {The present invention is a quantitative method for measuring the total heat flux, and of deriving the total power dissipation, of a heat-fluxing object which includes the steps of placing an electrical noise-emitting heat-fluxing object in a liquid helium bath and measuring the superfluid transition temperature of the bath. The temperature of the liquid helium bath is thereafter reduced until some measurable parameter, such as the electrical noise, exhibited by the heat-fluxing object or a temperature-dependent resistive thin film in intimate contact with the heat-fluxing object, becomes greatly reduced. The temperature of the liquid helum bath is measured at this point. The difference between the superfluid transition temperature of the liquid helium bath surrounding the heat-fluxing object, and the temperature of the liquid helium bath when the electrical noise emitted by the heat-fluxing object becomes greatly reduced, is determined. The total heat flux from the heat-fluxing object is determined as a function of this difference between these temperatures. In certain applications, the technique can be used to optimize thermal design parameters of cryogenic electronics, for example, Josephson junction and infra-red sensing devices.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Jan 01 00:00:00 EST 1993},
month = {Fri Jan 01 00:00:00 EST 1993}
}
Works referenced in this record:
Thermal effects on the Josephson series-array voltage standard
journal, August 1990
- Duncan, Robert V.
- Physica B: Condensed Matter, Vol. 165-166
Instabilities in superconducting tunnel junctions in different thermal environments
journal, May 1983
- Adler, J. G.; Will, T. A.
- Applied Physics Letters, Vol. 42, Issue 10