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Title: Particle detector spatial resolution

Abstract

Method and apparatus for producing separated columns of scintillation layer material, for use in detection of X-rays and high energy charged particles with improved spatial resolution. A pattern of ridges or projections is formed on one surface of a substrate layer or in a thin polyimide layer, and the scintillation layer is grown at controlled temperature and growth rate on the ridge-containing material. The scintillation material preferentially forms cylinders or columns, separated by gaps conforming to the pattern of ridges, and these columns direct most of the light produced in the scintillation layer along individual columns for subsequent detection in a photodiode layer. The gaps may be filled with a light-absorbing material to further enhance the spatial resolution of the particle detector.

Inventors:
 [1]
  1. Berkeley, CA
Issue Date:
Research Org.:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
OSTI Identifier:
868596
Patent Number(s):
5171996
Assignee:
Regents of University of California (Oakland, CA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
G - PHYSICS G21 - NUCLEAR PHYSICS G21K - TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
particle; detector; spatial; resolution; method; apparatus; producing; separated; columns; scintillation; layer; material; detection; x-rays; energy; charged; particles; improved; pattern; ridges; projections; formed; surface; substrate; polyimide; grown; controlled; temperature; growth; rate; ridge-containing; preferentially; forms; cylinders; gaps; conforming; direct; light; produced; individual; subsequent; photodiode; filled; light-absorbing; enhance; substrate layer; light produced; scintillation material; growth rate; controlled temperature; absorbing material; charged particles; charged particle; spatial resolution; particle detector; subsequent detection; containing material; layer material; improved spatial; energy charged; sorbing material; /250/216/427/

Citation Formats

Perez-Mendez, Victor. Particle detector spatial resolution. United States: N. p., 1992. Web.
Perez-Mendez, Victor. Particle detector spatial resolution. United States.
Perez-Mendez, Victor. Wed . "Particle detector spatial resolution". United States. https://www.osti.gov/servlets/purl/868596.
@article{osti_868596,
title = {Particle detector spatial resolution},
author = {Perez-Mendez, Victor},
abstractNote = {Method and apparatus for producing separated columns of scintillation layer material, for use in detection of X-rays and high energy charged particles with improved spatial resolution. A pattern of ridges or projections is formed on one surface of a substrate layer or in a thin polyimide layer, and the scintillation layer is grown at controlled temperature and growth rate on the ridge-containing material. The scintillation material preferentially forms cylinders or columns, separated by gaps conforming to the pattern of ridges, and these columns direct most of the light produced in the scintillation layer along individual columns for subsequent detection in a photodiode layer. The gaps may be filled with a light-absorbing material to further enhance the spatial resolution of the particle detector.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Jan 01 00:00:00 EST 1992},
month = {Wed Jan 01 00:00:00 EST 1992}
}

Works referenced in this record:

High Resolution Phosphor Screen for X-ray Image Intensifier
book, January 1980