Lens system for a photo ion spectrometer

Gruen, Dieter M; Young, Charles E; Pellin, Michael J

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Title: Lens system for a photo ion spectrometer

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Abstract

A lens system in a photo ion spectrometer for manipulating a primary ion beam and ionized atomic component. The atomic components are removed from a sample by a primary ion beam using the lens system, and the ions are extracted for analysis. The lens system further includes ionization resistant coatings for protecting the lens system.

Inventors:

Gruen, Dieter M ^[1]; Young, Charles E ^[2]; Pellin, Michael J ^[3]

Downers Grove, IL
Westmont, IL
Napersville, IL

Issue Date:: Mon Jan 01 00:00:00 EST 1990

Research Org.:: Argonne National Laboratory (ANL), Argonne, IL (United States)

OSTI Identifier:: 867618

Patent Number(s):: 4973842

Assignee:: Arch Development Corp. (Chicago, IL)

Patent Classifications (CPCs):: H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

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H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J49/061 - {Ion deflecting means, e.g. ion gates}
H01J49/142 - {using a solid target which is not previously vapourised}
H01J49/161 - {using photoionisation, e.g. by laser}
H01J49/282 - {using electrostatic analysers}
H01J49/484 - {with spherical mirrors}

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DOE Contract Number:: W-31109-ENG-38

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: lens; photo; spectrometer; manipulating; primary; beam; ionized; atomic; component; components; removed; sample; extracted; analysis; ionization; resistant; coatings; protecting; resistant coating; atomic components; resistant coatings; atomic component; ionized atomic; /250/

Citation Formats


                    Gruen, Dieter M, Young, Charles E, and Pellin, Michael J. Lens system for a photo ion spectrometer.  United States: N. p., 1990. 
        Web.

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                    Gruen, Dieter M, Young, Charles E, & Pellin, Michael J. Lens system for a photo ion spectrometer.  United States.

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                    Gruen, Dieter M, Young, Charles E, and Pellin, Michael J. Mon .  
        "Lens system for a photo ion spectrometer".  United States.  https://www.osti.gov/servlets/purl/867618.

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@article{osti_867618,

  title        = {Lens system for a photo ion spectrometer},

  author       = {Gruen, Dieter M and Young, Charles E and Pellin, Michael J},

  abstractNote = {A lens system in a photo ion spectrometer for manipulating a primary ion beam and ionized atomic component. The atomic components are removed from a sample by a primary ion beam using the lens system, and the ions are extracted for analysis. The lens system further includes ionization resistant coatings for protecting the lens system.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {Mon Jan 01 00:00:00 EST 1990},

  month        = {Mon Jan 01 00:00:00 EST 1990}

}

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A lens system in a photo ion spectrometer for manipulating a primary ion beam and ionized atomic component is disclosed. The atomic components are removed from a sample by a primary ion beam using the lens system, and the ions are extracted for analysis. The lens system further includes ionization resistant coatings for protecting the lens system. 8 figs.

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