Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures
Abstract
Disclosed is a method for modeling a conducting material sample or structure (herein called a system) as at least two regions which comprise an electrical network of resistances, for measuring electric resistance between at least two selected pairs of external leads attached to the surface of the system, wherein at least one external lead is attached to the surface of each of the regions, and, using basic circuit theory, for translating measured resistances into temperatures or thermophysical properties in corresponding regions of the system. 16 figs.
- Inventors:
- Issue Date:
- OSTI Identifier:
- 7232736
- Patent Number(s):
- 5165794
- Application Number:
- PPN: US 7-739376
- Assignee:
- Dept. of Energy, Washington, DC (United States)
- DOE Contract Number:
- AC07-76ID01570
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2 Aug 1991
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING; ELECTRIC CONDUCTORS; NONDESTRUCTIVE TESTING; PHYSICAL PROPERTIES; DATA ANALYSIS; ELECTRIC CONDUCTIVITY; MEASURING METHODS; ELECTRICAL PROPERTIES; MATERIALS TESTING; TESTING; 420500* - Engineering- Materials Testing
Citation Formats
Ortiz, M G. Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures. United States: N. p., 1992.
Web.
Ortiz, M G. Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures. United States.
Ortiz, M G. Tue .
"Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures". United States.
@article{osti_7232736,
title = {Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures},
author = {Ortiz, M G},
abstractNote = {Disclosed is a method for modeling a conducting material sample or structure (herein called a system) as at least two regions which comprise an electrical network of resistances, for measuring electric resistance between at least two selected pairs of external leads attached to the surface of the system, wherein at least one external lead is attached to the surface of each of the regions, and, using basic circuit theory, for translating measured resistances into temperatures or thermophysical properties in corresponding regions of the system. 16 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Nov 24 00:00:00 EST 1992},
month = {Tue Nov 24 00:00:00 EST 1992}
}
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