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Title: Particle detector spatial resolution

Abstract

Method and apparatus for producing separated columns of scintillation layer material, for use in detection of X-rays and high energy charged particles with improved spatial resolution is disclosed. A pattern of ridges or projections is formed on one surface of a substrate layer or in a thin polyimide layer, and the scintillation layer is grown at controlled temperature and growth rate on the ridge-containing material. The scintillation material preferentially forms cylinders or columns, separated by gaps conforming to the pattern of ridges, and these columns direct most of the light produced in the scintillation layer along individual columns for subsequent detection in a photodiode layer. The gaps may be filled with a light-absorbing material to further enhance the spatial resolution of the particle detector. 12 figs.

Inventors:
Issue Date:
OSTI Identifier:
7117761
Patent Number(s):
5171996
Application Number:
PPN: US 7-738529
Assignee:
Univ. of California, Oakland, CA (United States)
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Patent
Resource Relation:
Patent File Date: 31 Jul 1991
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CHARGED PARTICLE DETECTION; SCINTILLATION COUNTERS; DESIGN; X-RAY DETECTION; FABRICATION; PHOTODIODES; DETECTION; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; 440101* - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments; 440104 - Radiation Instrumentation- High Energy Physics Instrumentation

Citation Formats

Perez-Mendez, V. Particle detector spatial resolution. United States: N. p., 1992. Web.
Perez-Mendez, V. Particle detector spatial resolution. United States.
Perez-Mendez, V. Tue . "Particle detector spatial resolution". United States.
@article{osti_7117761,
title = {Particle detector spatial resolution},
author = {Perez-Mendez, V},
abstractNote = {Method and apparatus for producing separated columns of scintillation layer material, for use in detection of X-rays and high energy charged particles with improved spatial resolution is disclosed. A pattern of ridges or projections is formed on one surface of a substrate layer or in a thin polyimide layer, and the scintillation layer is grown at controlled temperature and growth rate on the ridge-containing material. The scintillation material preferentially forms cylinders or columns, separated by gaps conforming to the pattern of ridges, and these columns direct most of the light produced in the scintillation layer along individual columns for subsequent detection in a photodiode layer. The gaps may be filled with a light-absorbing material to further enhance the spatial resolution of the particle detector. 12 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Dec 15 00:00:00 EST 1992},
month = {Tue Dec 15 00:00:00 EST 1992}
}

Patent:
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