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Title: High sensitivity leak detection method and apparatus

Abstract

An improved leak detection method is provided that utilizes the cyclic adsorption and desorption of accumulated helium on a non-porous metallic surface. The method provides reliable leak detection at superfluid helium temperatures. The zero drift that is associated with residual gas analyzers in common leak detectors is virtually eliminated by utilizing a time integration technique. The sensitivity of the apparatus of this disclosure is capable of detecting leaks as small as 1 [times] 10[sup [minus]18] atm cc sec[sup [minus]1]. 2 figs.

Inventors:
Issue Date:
OSTI Identifier:
6978732
Patent Number(s):
5343740
Application Number:
PPN: US 8-113718
Assignee:
Southeastern Universities Research Association, Newport News, VA (United States)
DOE Contract Number:  
AC05-84ER40150
Resource Type:
Patent
Resource Relation:
Patent File Date: 27 Aug 1993
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; LEAK DETECTORS; DESIGN; HELIUM; SENSITIVITY; SUPERFLUIDITY; ELEMENTS; FLUIDS; GASES; NONMETALS; RARE GASES; 440800* - Miscellaneous Instrumentation- (1990-)

Citation Formats

Myneni, G R. High sensitivity leak detection method and apparatus. United States: N. p., 1994. Web.
Myneni, G R. High sensitivity leak detection method and apparatus. United States.
Myneni, G R. Tue . "High sensitivity leak detection method and apparatus". United States.
@article{osti_6978732,
title = {High sensitivity leak detection method and apparatus},
author = {Myneni, G R},
abstractNote = {An improved leak detection method is provided that utilizes the cyclic adsorption and desorption of accumulated helium on a non-porous metallic surface. The method provides reliable leak detection at superfluid helium temperatures. The zero drift that is associated with residual gas analyzers in common leak detectors is virtually eliminated by utilizing a time integration technique. The sensitivity of the apparatus of this disclosure is capable of detecting leaks as small as 1 [times] 10[sup [minus]18] atm cc sec[sup [minus]1]. 2 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Sep 06 00:00:00 EDT 1994},
month = {Tue Sep 06 00:00:00 EDT 1994}
}

Patent:
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