Improved graphite furnace atomizer
Abstract
A graphite furnace atomizer for use in graphite furnace atomic absorption spectroscopy is described wherein the heating elements are affixed near the optical path and away from the point of sample deposition, so that when the sample is volatilized the spectroscopic temperature at the optical path is at least that of the volatilization temperature, whereby analyteconcomitant complex formation is advantageously reduced. The atomizer may be elongated along its axis to increase the distance between the optical path and the sample deposition point. Also, the atomizer may be elongated along the axis of the optical path, whereby its analytical sensitivity is greatly increased.
- Inventors:
- Issue Date:
- OSTI Identifier:
- 6923247
- Application Number:
- ON: DE84011091
- Assignee:
- Dept. of Energy
- DOE Contract Number:
- AC07-79ID01675
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ABSORPTION SPECTROSCOPY; ATOMIZATION; FURNACES; GRAPHITE; CARBON; ELEMENTAL MINERALS; ELEMENTS; MINERALS; NONMETALS; SPECTROSCOPY; 400104* - Spectral Procedures- (-1987)
Citation Formats
Siemer, D D. Improved graphite furnace atomizer. United States: N. p., 1983.
Web.
Siemer, D D. Improved graphite furnace atomizer. United States.
Siemer, D D. Wed .
"Improved graphite furnace atomizer". United States.
@article{osti_6923247,
title = {Improved graphite furnace atomizer},
author = {Siemer, D D},
abstractNote = {A graphite furnace atomizer for use in graphite furnace atomic absorption spectroscopy is described wherein the heating elements are affixed near the optical path and away from the point of sample deposition, so that when the sample is volatilized the spectroscopic temperature at the optical path is at least that of the volatilization temperature, whereby analyteconcomitant complex formation is advantageously reduced. The atomizer may be elongated along its axis to increase the distance between the optical path and the sample deposition point. Also, the atomizer may be elongated along the axis of the optical path, whereby its analytical sensitivity is greatly increased.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed May 18 00:00:00 EDT 1983},
month = {Wed May 18 00:00:00 EDT 1983}
}
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