Photoconductive circuit element reflectometer
Abstract
A photoconductive reflectometer for characterizing semiconductor devices at millimeter wavelength frequencies where a first photoconductive circuit element (PCE) is biased by a direct current voltage source and produces short electrical pulses when excited into conductance by short first laser light pulses. The electrical pulses are electronically conditioned to improve the frequency related amplitude characteristics of the pulses which thereafter propagate along a transmission line to a device under test. Second PCEs are connected along the transmission line to sample the signals on the transmission line when excited into conductance by short second laser light pulses, spaced apart in time a determinable period from the first laser light pulses. Electronic filters connected to each of the second PCEs act as low-pass filters and remove parasitic interference from the sampled signals and output the sampled signals in the form of slowed-motion images of the signals on the transmission line. 4 figs.
- Inventors:
- Issue Date:
- Research Org.:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- OSTI Identifier:
- 6330069
- Patent Number(s):
- 7129210
- Application Number:
- ON: DE89010960
- Assignee:
- Dept. of Energy
- Patent Classifications (CPCs):
-
A - HUMAN NECESSITIES A61 - MEDICAL OR VETERINARY SCIENCE A61L - METHODS OR APPARATUS FOR STERILISING MATERIALS OR OBJECTS IN GENERAL
- DOE Contract Number:
- W-7405-ENG-36
- Resource Type:
- Patent
- Resource Relation:
- Other Information: Portions of this document are illegible in microfiche products
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE; PHOTOCONDUCTORS; TESTING; DESIGN; ELECTRONIC CIRCUITS; INVENTIONS; MEASURING INSTRUMENTS; REFLECTION; REFLECTIVITY; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SURFACE PROPERTIES; 440300* - Miscellaneous Instruments- (-1989); 360603 - Materials- Properties
Citation Formats
Rauscher, C. Photoconductive circuit element reflectometer. United States: N. p., 1987.
Web.
Rauscher, C. Photoconductive circuit element reflectometer. United States.
Rauscher, C. Mon .
"Photoconductive circuit element reflectometer". United States. https://www.osti.gov/servlets/purl/6330069.
@article{osti_6330069,
title = {Photoconductive circuit element reflectometer},
author = {Rauscher, C.},
abstractNote = {A photoconductive reflectometer for characterizing semiconductor devices at millimeter wavelength frequencies where a first photoconductive circuit element (PCE) is biased by a direct current voltage source and produces short electrical pulses when excited into conductance by short first laser light pulses. The electrical pulses are electronically conditioned to improve the frequency related amplitude characteristics of the pulses which thereafter propagate along a transmission line to a device under test. Second PCEs are connected along the transmission line to sample the signals on the transmission line when excited into conductance by short second laser light pulses, spaced apart in time a determinable period from the first laser light pulses. Electronic filters connected to each of the second PCEs act as low-pass filters and remove parasitic interference from the sampled signals and output the sampled signals in the form of slowed-motion images of the signals on the transmission line. 4 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Dec 07 00:00:00 EST 1987},
month = {Mon Dec 07 00:00:00 EST 1987}
}