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Title: Electrical network method for the thermal or structural characterization of a conducting material sample or structure

Abstract

A method for modeling a conducting material sample or structure system, as an electrical network of resistances in which each resistance of the network is representative of a specific physical region of the system. The method encompasses measuring a resistance between two external leads and using this measurement in a series of equations describing the network to solve for the network resistances for a specified region and temperature. A calibration system is then developed using the calculated resistances at specified temperatures. This allows for the translation of the calculated resistances to a region temperature. The method can also be used to detect and quantify structural defects in the system.

Inventors:
Issue Date:
OSTI Identifier:
6254724
Patent Number(s):
5217304
Application Number:
PPN: US 7-882225
Assignee:
Dept. of Energy, Washington, DC (United States)
DOE Contract Number:  
AC07-76ID01570
Resource Type:
Patent
Resource Relation:
Patent File Date: 13 May 1992
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; ELECTRIC CONDUCTORS; DEFECTS; CALIBRATION; DETECTION; ELECTRIC CONDUCTIVITY; MATERIALS; MATHEMATICAL MODELS; TEMPERATURE MEASUREMENT; ELECTRICAL PROPERTIES; PHYSICAL PROPERTIES; 420500* - Engineering- Materials Testing

Citation Formats

Ortiz, M G. Electrical network method for the thermal or structural characterization of a conducting material sample or structure. United States: N. p., 1993. Web.
Ortiz, M G. Electrical network method for the thermal or structural characterization of a conducting material sample or structure. United States.
Ortiz, M G. Tue . "Electrical network method for the thermal or structural characterization of a conducting material sample or structure". United States.
@article{osti_6254724,
title = {Electrical network method for the thermal or structural characterization of a conducting material sample or structure},
author = {Ortiz, M G},
abstractNote = {A method for modeling a conducting material sample or structure system, as an electrical network of resistances in which each resistance of the network is representative of a specific physical region of the system. The method encompasses measuring a resistance between two external leads and using this measurement in a series of equations describing the network to solve for the network resistances for a specified region and temperature. A calibration system is then developed using the calculated resistances at specified temperatures. This allows for the translation of the calculated resistances to a region temperature. The method can also be used to detect and quantify structural defects in the system.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jun 08 00:00:00 EDT 1993},
month = {Tue Jun 08 00:00:00 EDT 1993}
}

Patent:
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