High-temperature-measuring device
Abstract
A temperature measuring device for very high design temperatures (to 2000/sup 0/C) is described. The device comprises a homogenous base structure preferably in the form of a sphere or cylinder. The base structure contains a large number of individual walled cells. The base structure has a decreasing coefficient of elasticity within the temperature range being monitored. A predetermined quantity of inert gas is confined within each cell. The cells are dimensonally stable at the normal working temperature of the device. Increases in gaseous pressure within the cells will permanently deform the cell walls at temperatures within the high temperature range to be measured. Such deformation can be correlated to temperature by calibrating similarly constructed devices under known time and temperature conditions.
- Issue Date:
- OSTI Identifier:
- 5708608
- Application Number:
- ON: DE82004464
- Assignee:
- Dept. of Energy
- DOE Contract Number:
- AC06-76RL01830
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; THERMOMETERS; CHEMICAL COMPOSITION; DEFORMATION; QUANTITY RATIO; THERMAL EXPANSION; EXPANSION; MEASURING INSTRUMENTS; 440300* - Miscellaneous Instruments- (-1989)
Citation Formats
. High-temperature-measuring device. United States: N. p., 1981.
Web.
. High-temperature-measuring device. United States.
. Tue .
"High-temperature-measuring device". United States.
@article{osti_5708608,
title = {High-temperature-measuring device},
author = {},
abstractNote = {A temperature measuring device for very high design temperatures (to 2000/sup 0/C) is described. The device comprises a homogenous base structure preferably in the form of a sphere or cylinder. The base structure contains a large number of individual walled cells. The base structure has a decreasing coefficient of elasticity within the temperature range being monitored. A predetermined quantity of inert gas is confined within each cell. The cells are dimensonally stable at the normal working temperature of the device. Increases in gaseous pressure within the cells will permanently deform the cell walls at temperatures within the high temperature range to be measured. Such deformation can be correlated to temperature by calibrating similarly constructed devices under known time and temperature conditions.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 27 00:00:00 EST 1981},
month = {Tue Jan 27 00:00:00 EST 1981}
}