Method for error correction in scanning probe microscopy
Abstract
Disclosed here is a scanning probe microscope system and method for operating the same for producing scanning probe microscope images at fast scan rates and reducing oscillation artifacts. In some embodiments, an inverse consistent image registration method is used to align forward and backward scan traces for each line of the scanning microscope image. In some embodiments, the aligned forward and backward scan traces are combined using a weighting factor favoring the scan trace with higher smoothness. In some embodiments, the scanning probe microscope image is a potentiometry map and a method is provided to extract from the potentiometry map a conductivity map.
- Inventors:
- Issue Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1650967
- Patent Number(s):
- 10670625
- Application Number:
- 16/316,385
- Assignee:
- University of Florida Research Foundation, Inc. (Gainesville, FL)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
- DOE Contract Number:
- AC05-00OR22725
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 07/12/2017
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Zhang, Xiaoguang, Li, Xianqi, Li, An-Ping, Zhang, Hao, and Chen, Yunmei. Method for error correction in scanning probe microscopy. United States: N. p., 2020.
Web.
Zhang, Xiaoguang, Li, Xianqi, Li, An-Ping, Zhang, Hao, & Chen, Yunmei. Method for error correction in scanning probe microscopy. United States.
Zhang, Xiaoguang, Li, Xianqi, Li, An-Ping, Zhang, Hao, and Chen, Yunmei. Tue .
"Method for error correction in scanning probe microscopy". United States. https://www.osti.gov/servlets/purl/1650967.
@article{osti_1650967,
title = {Method for error correction in scanning probe microscopy},
author = {Zhang, Xiaoguang and Li, Xianqi and Li, An-Ping and Zhang, Hao and Chen, Yunmei},
abstractNote = {Disclosed here is a scanning probe microscope system and method for operating the same for producing scanning probe microscope images at fast scan rates and reducing oscillation artifacts. In some embodiments, an inverse consistent image registration method is used to align forward and backward scan traces for each line of the scanning microscope image. In some embodiments, the aligned forward and backward scan traces are combined using a weighting factor favoring the scan trace with higher smoothness. In some embodiments, the scanning probe microscope image is a potentiometry map and a method is provided to extract from the potentiometry map a conductivity map.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jun 02 00:00:00 EDT 2020},
month = {Tue Jun 02 00:00:00 EDT 2020}
}
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