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Title: Simultaneous topographic and elemental chemical and magnetic contrast in scanning tunneling microscopy

Abstract

A method and system for performing simultaneous topographic and elemental chemical and magnetic contrast analysis in a scanning, tunneling microscope. The method and system also includes nanofabricated coaxial multilayer tips with a nanoscale conducting apex and a programmable in-situ nanomanipulator to fabricate these tips and also to rotate tips controllably.

Inventors:
; ; ; ;
Issue Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1159916
Patent Number(s):
8850611
Application Number:
13/791,157
Assignee:
UChicago Argonne, LLC (Chicago, IL)
Patent Classifications (CPCs):
B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
DOE Contract Number:  
ACO2-06CH11357
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Rose, Volker, Preissner, Curt A, Hla, Saw-Wai, Wang, Kangkang, and Rosenmann, Daniel. Simultaneous topographic and elemental chemical and magnetic contrast in scanning tunneling microscopy. United States: N. p., 2014. Web.
Rose, Volker, Preissner, Curt A, Hla, Saw-Wai, Wang, Kangkang, & Rosenmann, Daniel. Simultaneous topographic and elemental chemical and magnetic contrast in scanning tunneling microscopy. United States.
Rose, Volker, Preissner, Curt A, Hla, Saw-Wai, Wang, Kangkang, and Rosenmann, Daniel. Tue . "Simultaneous topographic and elemental chemical and magnetic contrast in scanning tunneling microscopy". United States. https://www.osti.gov/servlets/purl/1159916.
@article{osti_1159916,
title = {Simultaneous topographic and elemental chemical and magnetic contrast in scanning tunneling microscopy},
author = {Rose, Volker and Preissner, Curt A and Hla, Saw-Wai and Wang, Kangkang and Rosenmann, Daniel},
abstractNote = {A method and system for performing simultaneous topographic and elemental chemical and magnetic contrast analysis in a scanning, tunneling microscope. The method and system also includes nanofabricated coaxial multilayer tips with a nanoscale conducting apex and a programmable in-situ nanomanipulator to fabricate these tips and also to rotate tips controllably.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Sep 30 00:00:00 EDT 2014},
month = {Tue Sep 30 00:00:00 EDT 2014}
}

Works referenced in this record:

Scanning probe microscope
patent, December 1999


Element specific imaging by scanning tunneling microscopy combined with synchrotron radiation light
journal, December 2006


Collecting photoelectrons with a scanning tunneling microscope nanotip
journal, March 2008


Development of a scanning tunneling microscope for in situ experiments with a synchrotron radiation hard-X-ray microbeam
journal, February 2006