Title: Dual-etalon cavity ring-down frequency-comb spectroscopy with broad band light source

Abstract

In an embodiment, a dual-etalon cavity-ring-down frequency-comb spectrometer system is described. A broad band light source is split into two beams. One beam travels through a first etalon and a sample under test, while the other beam travels through a second etalon, and the two beams are recombined onto a single detector. If the free spectral ranges ("FSR") of the two etalons are not identical, the interference pattern at the detector will consist of a series of beat frequencies. By monitoring these beat frequencies, optical frequencies where light is absorbed may be determined.

Inventors:

Chandler, David W; Strecker, Kevin E

Issue Date:

Tue Apr 01 00:00:00 EDT 2014

Research Org.:

Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Sponsoring Org.:

USDOE

OSTI Identifier:

1129162

Patent Number(s):

8693004

Application Number:

13/050,430

Assignee:

Sandia Corporation (Albuquerque, NM)

Patent Classifications (CPCs):

G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT

G01J3/26 - using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
G01J3/42 - Absorption spectrometry
G01J3/457 - Correlation spectrometry, e.g. of the intensity

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry {
G01N21/3504 - for analysing gases, e.g. multi-gas analysis
G01N21/45 - using interferometric methods

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DOE Contract Number:  

AC04-94AL85000

Resource Type:

Patent

Resource Relation:

Patent File Date: 2011 Mar 17

Country of Publication:

United States

Language:

English

Subject:

47 OTHER INSTRUMENTATION