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Title: Method of multi-dimensional moment analysis for the characterization of signal peaks

Abstract

A method of multi-dimensional moment analysis for the characterization of signal peaks can be used to optimize the operation of an analytical system. With a two-dimensional Peclet analysis, the quality and signal fidelity of peaks in a two-dimensional experimental space can be analyzed and scored. This method is particularly useful in determining optimum operational parameters for an analytical system which requires the automated analysis of large numbers of analyte data peaks. For example, the method can be used to optimize analytical systems including an ion mobility spectrometer that uses a temperature stepped desorption technique for the detection of explosive mixtures.

Inventors:
; ; ;
Issue Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1079236
Patent Number(s):
8296078
Application Number:
12/491,733
Assignee:
Sandia Corporation (Albuquerque, NM)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Pfeifer, Kent B, Yelton, William G, Kerr, Dayle R, and Bouchier, Francis A. Method of multi-dimensional moment analysis for the characterization of signal peaks. United States: N. p., 2012. Web.
Pfeifer, Kent B, Yelton, William G, Kerr, Dayle R, & Bouchier, Francis A. Method of multi-dimensional moment analysis for the characterization of signal peaks. United States.
Pfeifer, Kent B, Yelton, William G, Kerr, Dayle R, and Bouchier, Francis A. Tue . "Method of multi-dimensional moment analysis for the characterization of signal peaks". United States. https://www.osti.gov/servlets/purl/1079236.
@article{osti_1079236,
title = {Method of multi-dimensional moment analysis for the characterization of signal peaks},
author = {Pfeifer, Kent B and Yelton, William G and Kerr, Dayle R and Bouchier, Francis A},
abstractNote = {A method of multi-dimensional moment analysis for the characterization of signal peaks can be used to optimize the operation of an analytical system. With a two-dimensional Peclet analysis, the quality and signal fidelity of peaks in a two-dimensional experimental space can be analyzed and scored. This method is particularly useful in determining optimum operational parameters for an analytical system which requires the automated analysis of large numbers of analyte data peaks. For example, the method can be used to optimize analytical systems including an ion mobility spectrometer that uses a temperature stepped desorption technique for the detection of explosive mixtures.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Oct 23 00:00:00 EDT 2012},
month = {Tue Oct 23 00:00:00 EDT 2012}
}