Cross-ontological analytics for alignment of different classification schemes
Abstract
Quantification of the similarity between nodes in multiple electronic classification schemes is provided by automatically identifying relationships and similarities between nodes within and across the electronic classification schemes. Quantifying the similarity between a first node in a first electronic classification scheme and a second node in a second electronic classification scheme involves finding a third node in the first electronic classification scheme, wherein a first product value of an inter-scheme similarity value between the second and third nodes and an intra-scheme similarity value between the first and third nodes is a maximum. A fourth node in the second electronic classification scheme can be found, wherein a second product value of an inter-scheme similarity value between the first and fourth nodes and an intra-scheme similarity value between the second and fourth nodes is a maximum. The maximum between the first and second product values represents a measure of similarity between the first and second nodes.
- Inventors:
-
- Seattle, WA
- Richland, WA
- Cleveland, OH
- Issue Date:
- Research Org.:
- Posse, Christian (Seattle, WA); Sanfilippo, Antonio P (Richland, WA); Gopalan, Banu (Cleveland, OH); Riensche, Roderick M (Richland, WA); Baddeley, Robert L (Richland, WA)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1014553
- Patent Number(s):
- 7805010
- Application Number:
- US Patent Application 11/493,503
- Assignee:
- Posse, Christian (Seattle, WA); Sanfilippo, Antonio P (Richland, WA); Gopalan, Banu (Cleveland, OH); Riensche, Roderick M (Richland, WA); Baddeley, Robert L (Richland, WA)
- Patent Classifications (CPCs):
-
G - PHYSICS G16 - INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS G16B - BIOINFORMATICS, i.e. INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR GENETIC OR PROTEIN-RELATED DATA PROCESSING IN COMPUTATIONAL MOLECULAR BIOLOGY
- DOE Contract Number:
- AC05-76RLO1830
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Posse, Christian, Sanfilippo, Antonio P, Gopalan, Banu, Riensche, Roderick M, and Baddeley, Robert L. Cross-ontological analytics for alignment of different classification schemes. United States: N. p., 2010.
Web.
Posse, Christian, Sanfilippo, Antonio P, Gopalan, Banu, Riensche, Roderick M, & Baddeley, Robert L. Cross-ontological analytics for alignment of different classification schemes. United States.
Posse, Christian, Sanfilippo, Antonio P, Gopalan, Banu, Riensche, Roderick M, and Baddeley, Robert L. Tue .
"Cross-ontological analytics for alignment of different classification schemes". United States. https://www.osti.gov/servlets/purl/1014553.
@article{osti_1014553,
title = {Cross-ontological analytics for alignment of different classification schemes},
author = {Posse, Christian and Sanfilippo, Antonio P and Gopalan, Banu and Riensche, Roderick M and Baddeley, Robert L},
abstractNote = {Quantification of the similarity between nodes in multiple electronic classification schemes is provided by automatically identifying relationships and similarities between nodes within and across the electronic classification schemes. Quantifying the similarity between a first node in a first electronic classification scheme and a second node in a second electronic classification scheme involves finding a third node in the first electronic classification scheme, wherein a first product value of an inter-scheme similarity value between the second and third nodes and an intra-scheme similarity value between the first and third nodes is a maximum. A fourth node in the second electronic classification scheme can be found, wherein a second product value of an inter-scheme similarity value between the first and fourth nodes and an intra-scheme similarity value between the second and fourth nodes is a maximum. The maximum between the first and second product values represents a measure of similarity between the first and second nodes.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Sep 28 00:00:00 EDT 2010},
month = {Tue Sep 28 00:00:00 EDT 2010}
}
Works referenced in this record:
Ontology mapping: the state of the art
journal, January 2003
- Kalfoglou, Yannis; Schorlemmer, Marco
- The Knowledge Engineering Review, Vol. 18, Issue 1
Cross-Ontological Analytics: Combining Associative and Hierarchical Relations in the Gene Ontologies to Assess Gene Product Similarity
book, January 2006
- Posse, C.; Sanfilippo, A.; Gopalan, B.
- Computational Science – ICCS 2006