Manufacture of silicon-based devices having disordered sulfur-doped surface layers
Abstract
The present invention provides methods of fabricating a radiation-absorbing semiconductor wafer by irradiating at least one surface location of a silicon substrate, e.g., an n-doped crystalline silicon, by a plurality of temporally short laser pulses, e.g., femtosecond pulses, while exposing that location to a substance, e.g., SF.sub.6, having an electron-donating constituent so as to generate a substantially disordered surface layer (i.e., a microstructured layer) that incorporates a concentration of that electron-donating constituent, e.g., sulfur. The substrate is also annealed at an elevated temperature and for a duration selected to enhance the charge carrier density in the surface layer. For example, the substrate can be annealed at a temperature in a range of about 700 K to about 900 K.
- Inventors:
-
- (Newton, MA)
- Concord, MA
- Issue Date:
- Research Org.:
- President and Fellows of Harvard College (Cambridge, MA)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1014531
- Patent Number(s):
- 7354792
- Application Number:
- 10/950,248
- Assignee:
- President and Fellows of Harvard College (Cambridge, MA)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE Y02E - REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- DOE Contract Number:
- FC36-01GO11051
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Carey, III, James Edward, and Mazur, Eric. Manufacture of silicon-based devices having disordered sulfur-doped surface layers. United States: N. p., 2008.
Web.
Carey, III, James Edward, & Mazur, Eric. Manufacture of silicon-based devices having disordered sulfur-doped surface layers. United States.
Carey, III, James Edward, and Mazur, Eric. Tue .
"Manufacture of silicon-based devices having disordered sulfur-doped surface layers". United States. https://www.osti.gov/servlets/purl/1014531.
@article{osti_1014531,
title = {Manufacture of silicon-based devices having disordered sulfur-doped surface layers},
author = {Carey, III, James Edward and Mazur, Eric},
abstractNote = {The present invention provides methods of fabricating a radiation-absorbing semiconductor wafer by irradiating at least one surface location of a silicon substrate, e.g., an n-doped crystalline silicon, by a plurality of temporally short laser pulses, e.g., femtosecond pulses, while exposing that location to a substance, e.g., SF.sub.6, having an electron-donating constituent so as to generate a substantially disordered surface layer (i.e., a microstructured layer) that incorporates a concentration of that electron-donating constituent, e.g., sulfur. The substrate is also annealed at an elevated temperature and for a duration selected to enhance the charge carrier density in the surface layer. For example, the substrate can be annealed at a temperature in a range of about 700 K to about 900 K.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 08 00:00:00 EDT 2008},
month = {Tue Apr 08 00:00:00 EDT 2008}
}
Works referenced in this record:
Infrared absorption by sulfur-doped silicon formed by femtosecond laser irradiation
journal, November 2004
- Crouch, C. H.; Carey, J. E.; Shen, M.
- Applied Physics A, Vol. 79, Issue 7
Near-unity below-band-gap absorption by microstructured silicon
journal, March 2001
- Wu, C.; Crouch, C. H.; Zhao, L.
- Applied Physics Letters, Vol. 78, Issue 13, p. 1850-1852
Comparison of structure and properties of femtosecond and nanosecond laser-structured silicon
journal, March 2004
- Crouch, C. H.; Carey, J. E.; Warrender, J. M.
- Applied Physics Letters, Vol. 84, Issue 11, p. 1850-1852
Femtosecond laser-induced formation of spikes on silicon
journal, April 2000
- Her, T. -H.; Finlay, R. J.; Wu, C.
- Applied Physics A: Materials Science & Processing, Vol. 70, Issue 4
Visible luminescence from silicon surfaces microstructured in air
journal, September 2002
- Wu, C.; Crouch, C. H.; Zhao, L.
- Applied Physics Letters, Vol. 81, Issue 11, p. 1999-2001
Dynamics of the hydrodynamical growth of columns on silicon exposed to ArF excimer-laser irradiation
journal, January 1998
- Sánchez, F.; Morenza, J. L.; Aguiar, R.
- Applied Physics A: Materials Science & Processing, Vol. 66, Issue 1
Novel conical microstructures created in silicon with femtosecond laser pulses
conference, January 1998
- Tsing-Hua Her, ; Finlay, R. J.; Wu, C.
- Technical Digest Summaries of papers presented at the Conference on Lasers and Electro-Optics Conference Edition. 1998 Technical Digest Series, Vol.6, Technical Digest. Summaries of Papers Presented at the Conference on Lasers and Electro-Optics. Conference Edition. 1998 Technical Digest Series, Vol.6 (IEEE Cat. No.98CH36178)
Surface microstructuring and long-range ordering of silicon nanoparticles
journal, May 2002
- Fowlkes, J. D.; Pedraza, A. J.; Blom, D. A.
- Applied Physics Letters, Vol. 80, Issue 20, p. 3799-3801
Silicon microcolumn arrays grown by nanosecond pulsed-excimer laser irradiation
journal, April 1999
- Pedraza, A. J.; Fowlkes, J. D.; Lowndes, D. H.
- Applied Physics Letters, Vol. 74, Issue 16, p. 2322-2324
Formation of regular arrays of silicon microspikes by femtosecond laser irradiation through a mask
journal, March 2003
- Shen, M. Y.; Crouch, C. H.; Carey, J. E.
- Applied Physics Letters, Vol. 82, Issue 11, p. 1715-1717
Surface nanostructuring of silicon
journal, July 2003
- Pedraza, A. J.; Fowlkes, J. D.; Guan, Y. -F.
- Applied Physics A, Vol. 77, Issue 2
Field emission from silicon microstructures formed by femtosecond laser assisted etching
conference, January 2001
- Carey, J. E.; Zhao, L.; Wu, C.
- CLEO 2001. Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Technical Digest, Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Technical Digest (IEEE Cat. No.01CH37170)
Formation of conical microstructures upon laser evaporation of solids
journal, August 2001
- Dolgaev, S. I.; Lavrishev, S. V.; Lyalin, A. A.
- Applied Physics A Materials Science & Processing, Vol. 73, Issue 2
Infrared absorption by conical silicon microstructures made in a variety of background gases using femtosecond-laser pulses
journal, March 2003
- Younkin, R.; Carey, J. E.; Mazur, E.
- Journal of Applied Physics, Vol. 93, Issue 5, p. 2626-2629
Microstructuring of silicon with femtosecond laser pulses
journal, September 1998
- Her, Tsing-Hua; Finlay, Richard J.; Wu, Claudia
- Applied Physics Letters, Vol. 73, Issue 12, p. 1673-1675
Infrared absorption by conical silicon microstructures made in a variety of background gases using femtosecond-laser pulses
conference, January 2001
- Younkin, R.; Mazur, E.; Carey, J. E.
- CLEO 2001. Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Technical Digest, Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Technical Digest (IEEE Cat. No.01CH37170)
Femtosecond-Laser-Assisted Microstructuring of Silicon Surfaces
journal, January 2003
- Carey, James E.; Crouch, Catherine H.; Mazur, Eric
- Optics and Photonics News, Vol. 14, Issue 2
Femtosecond laser-assisted microstructuring of silicon for novel detector, sensing and display technologies
conference, January 2003
- Carey, J. E.; Mazur, E.
- 2003 IEEE LEOS Annual Meeting Conference Proceedings, The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003.
Whiskerlike structure growth on silicon exposed to ArF excimer laser irradiation
journal, July 1996
- Sánchez, F.; Morenza, J. L.; Aguiar, R.
- Applied Physics Letters, Vol. 69, Issue 5, p. 620-622