Model for l/f Flux Noise in SQUIDs and Qubits
Description/Abstract
We propose a model for 1/f flux noise in superconducting devices (f is frequency). The noise is generated by the magnetic moments of electrons in defect states which they occupy for a wide distribution of times before escaping. A trapped electron occupies one of the two Kramers-degenerate ground states, between which the transition rate is negligible at low temperature. As a result, the magnetic moment orientation is locked. Simulations of the noise produced by a plausible density of randomly oriented defects yield 1/f noise magnitudes in good agreement with experiments.
| DOI | 10.1103/PhysRevLett.98.267003 |
|---|---|
| Creator/Author: | Koch, Roger H. ; DiVincenzo, David P. ; Clarke, John |
| Publication Date: | 2007 Jan 19 |
| OSTI Identifier: | OSTI ID: 913162 |
| Report Number(s): | LBNL--62393 |
| DOE Contract Number: | DE-AC02-05CH11231 |
| DOI: | 10.1103/PhysRevLett.98.267003 |
| Other Number(s): | Journal ID: ISSN 0031-9007; PRLTAO; R&D Project: 504801; Other: BnR: KC0202020; TRN: US0800653 |
| Resource Type: | Journal Article |
| Resource Relation: | Journal Name: Physical Review Letters; Journal Volume: 98; Journal Issue: 26; Related Information: Journal Publication Date: 06/2007 |
| Research Org: | COLLABORATION - IBM |
| Subject: | 75; DEFECTS; DISTRIBUTION; ELECTRONS; GROUND STATES; MAGNETIC MOMENTS; ORIENTATION; QUBITS; SUPERCONDUCTING DEVICES; TRAPPED ELECTRONS |
| Country of Publication: | United States |
| Language: | English |
| Update Date: | 2009 Dec 16 |
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