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Title Atom trap trace analysis
Creator/Author Lu, Z.-T. ; Bailey, K. ; Chen, C.-Y. ; Du, X. ; Li, Y.-M. ; O'Connor, T. P. ; Young, L.
Publication Date2000 May 25
OSTI IdentifierOSTI ID: 755891
Report Number(s)ANL/PHY/CP-101981
DOE Contract NumberW-31109-ENG-38
Other Number(s)TRN: AH200021%%382
Resource TypeConference
Resource RelationConference: 17th International Conference on Atomic Physics, Florence (IT), 06/04/2000--06/10/2000; Other Information: PBD: 25 May 2000
Research OrgArgonne National Lab., IL (US)
Sponsoring OrgUS Department of Energy (US)
Subject37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; TRACE AMOUNTS; QUANTITATIVE CHEMICAL ANALYSIS; ISOTOPE RATIO; TRAPPING; LASER RADIATION; KRYPTON 85; KRYPTON 81
Description/AbstractA new method of ultrasensitive trace-isotope analysis has been developed based upon the technique of laser manipulation of neutral atoms. It has been used to count individual {sup 85}Kr and {sup 81}Kr atoms present in a natural krypton sample with isotopic abundances in the range of 10{sup {minus}11} and 10{sup {minus}13}, respectively. The atom counts are free of contamination from other isotopes, elements,or molecules. The method is applicable to other trace-isotopes that can be efficiently captured with a magneto-optical trap, and has a broad range of potential applications.
Country of PublicationUnited States
LanguageEnglish
FormatMedium: P; Size: 18 pages
Availability INIS; OSTI as DE00755891
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System Entry Date2008 Feb 05
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