| Bibliographic Citation | |
| Full Text |  1 Mb |
|---|---|
| Title | Atom trap trace analysis |
| Creator/Author | Lu, Z.-T. ; Bailey, K. ; Chen, C.-Y. ; Du, X. ; Li, Y.-M. ; O'Connor, T. P. ; Young, L. |
| Publication Date | 2000 May 25 |
| OSTI Identifier | OSTI ID: 755891 |
| Report Number(s) | ANL/PHY/CP-101981 |
| DOE Contract Number | W-31109-ENG-38 |
| Other Number(s) | TRN: AH200021%%382 |
| Resource Type | Conference |
| Resource Relation | Conference: 17th International Conference on Atomic Physics, Florence (IT), 06/04/2000--06/10/2000; Other Information: PBD: 25 May 2000 |
| Research Org | Argonne National Lab., IL (US) |
| Sponsoring Org | US Department of Energy (US) |
| Subject | 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; TRACE AMOUNTS; QUANTITATIVE CHEMICAL ANALYSIS; ISOTOPE RATIO; TRAPPING; LASER RADIATION; KRYPTON 85; KRYPTON 81 |
| Description/Abstract | A new method of ultrasensitive trace-isotope analysis has been developed based upon the technique of laser manipulation of neutral atoms. It has been used to count individual {sup 85}Kr and {sup 81}Kr atoms present in a natural krypton sample with isotopic abundances in the range of 10{sup {minus}11} and 10{sup {minus}13}, respectively. The atom counts are free of contamination from other isotopes, elements,or molecules. The method is applicable to other trace-isotopes that can be efficiently captured with a magneto-optical trap, and has a broad range of potential applications. |
| Country of Publication | United States |
| Language | English |
| Format | Medium: P; Size: 18 pages |
| Availability | INIS; OSTI as DE00755891 To purchase this media from NTIS, click here |
| System Entry Date | 2008 Feb 05 |
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Last Updated: 11/20/2009