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Title: Spin microscope based on optically detected magnetic resonance

Patent ·
OSTI ID:985215

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG-36
Assignee:
The United States of America as represented by the United States Department of Energy (Washington, DC)
Patent Number(s):
7,743,648
Application Number:
11/845,982
OSTI ID:
985215
Country of Publication:
United States
Language:
English

References (2)

Local fluorescent probes for the fluorescence resonance energy transfer scanning near-field optical microscopy journal April 2002
Mechanical detection of magnetic resonance journal December 1992